• Journal of the Korean Magnetics Society
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• v.21 no.6
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• pp.231-236
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• 2011

X-ray Free Electron Laser (XFEL) has been known to be a dream X-ray source opening an epoch in X-ray science with the characteristics of femtosecond pulse, perfect transverse coherence, and ultra-high brightness. Here we introduce the XFEL source shortly and report the status of the worldwide XFEL facilities, and then the experimental instrumentations for XFEL are reviewed in their conceptual classification scheme. Scientific examples and applications proposed in the research area of magnetism for XFEL are briefly mentioned. Finally are summarized the facility overview and the scientific proposals for PAL-XFEL project.

• Proceedings of the Optical Society of Korea Conference
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• 1991.06a
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• pp.64-64
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• 1991

The interaction of high-intensity, focused, nanosecond laser light with matter results in the production of high-temperature plasma, which in turn emits an intense pulse of x rays. The x-ray spectrum consists of strong line components of several keV photon energy and broad continuum. Such an x-ray source provides many advantages over conventional ones for many applications. Pulse nature of the x-ray emission is well-suited for studying transient phenomena and for imaging living biological specimen. Recent experiments have also shown that the laser plasma x ray may be used for x ray lithography. These studies and other applications will be discussed in detail.

• Journal of the Optical Society of Korea
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• v.7 no.4
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• pp.230-233
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• 2003

This study describes the conceptual design of a soft x-ray microscope system based on a laserbased source for biomedical application with high resolution (${\leq}$50nm). The laboratory scale soft x-ray microscope consists of high power laser plasma x-ray source and grazing incidence mirrors with high reflectivity. The laser plasma source used for developing this system employs Q-switched Nd-YAG pulsed laser. The laser beam is focused on a tantalum (Ta) target. The Wolter type I mirror was used as condenser optics for sample illumination and as objective mirror for focusing on a detector. The fabrication of the Wolter type I mirror was direct internal cutting using ultraprecision DTM. A hydrated biological specimen was put between the two silicon wafers, the center of which was $Si_3N_4$ windows of 100㎚ thickness. The main issues in the future development work are to make a stable, reliable and reproducible x-ray microscope system.

• Journal of the Korean Society of Radiology
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• v.14 no.4
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• pp.477-486
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• 2020

The purpose of this study was to evaluate the effects of reconstruction filters, X-ray source trajectories and intervals in the quality of digital tomosynthesis (DT) images, and the results was clinically validated. The filtered back-projection was implemented by using Ramp, Shepp-Logan, Cosine, Hamming, Hann and Blackman filters, and the X-ray source trajectories were simulated with 1 × 36, 2 × 18, 3 × 12, 4 × 9 and 6 × 6 arrays. The X-ray source intervals were 5, 10, 20, 30 and 40 mm. The depth resolution, spatial resolution and noise of DT image were evaluated by measuring artifact spread function (ASF), full width at half maximum (FWHM) and signal-to-noise ratio (SNR), respectively. The results showed that the spatial resolution and noise properties of DT images were maximized by the Ramp and Blackman filters, respectively, and the depth resolution and noise properties of the DT images obtained with a 1 × 36 X-ray source trajectory were superior to the other trajectories. The depth resolution and noise properties of DT images improved with an increase of X-ray source intervals, and the high X-ray source intervals degraded the spatial resolution of DT images. Therefore, the characteristics of DT images are highly dependent on reconstruction filters, X-ray source trajectories and intervals, and it is necessary to use optimal imaging parameters in accordance with diagnostic purpose.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.02a
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• pp.639-639
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• 2013

In this research we report the significant contribution of the as-spun multi-walled carbon nanotube (MWCNT) on the x-ray images formation using a low tube voltage x-ray source. The MWCNT, which was used for the fabrication of the spun CNT, was grown using a microwave plasma-enhanced chemical vapor deposition machine. Electrical-optics simulation software was utilized to determine the electron field emission trajectory of the triode-structure-as-spun CNT-based x-ray source. It was shown that a significant amount of converging electrons hit the target anode producing a clear x-ray image. These x-ray images where produced at a small amount of anode current of 0.67 mA at a tube voltage of 5 kV with the gate voltage of 0 V. Also, comparisons of the radiographs at various exposure times of the sample where analyzed with and without an x-ray dose filter. Results showed that spatially-resolved images were formed using the as-spun CNT at a low tube voltage with a $54-{\mu}m$ Al x-ray filter. This study can be used for low-voltage medical applications.

• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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• v.28 no.9
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• pp.89-98
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• 2014

A diagnostic fluoroscopy X-ray system uses a 32kW or greater X-ray generator for obtaining real-time moving images and high-resolution images. Fluoroscopy X-ray systems have to use a high-capacity AC power source to perform long-time low-power fluoroscopy and short-time high-power spot exposure. In this paper, we propose a hybrid type X-ray generator for fluoroscopy X-ray system which can perform fluoroscopy and spot exposure with a low-capacity AC power source and an energy storage device. The characteristics of energy storage devices are compared and each energy storage device is modelled to equivalent circuit. And the characteristics of available energy are analyzed as a function of output voltage and power. A 32kW class hybrid X-ray generator with EDLC as an energy storage device for fluoroscopy X-ray system was constructed, and its validity was verified by means of simulations and experiments.

• Journal of Radiation Protection and Research
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• v.41 no.2
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• pp.93-99
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• 2016

Background: Industrial X-ray CT system is normally applied to non-destructive testing (NDT) for industrial product made from metal. Furthermore there are some special CT systems, which have an ability to inspect nuclear fuel assemblies or rocket motors, using high power and high energy (more than 6 MeV) pulsed X-ray source. In these case, pulsed X-ray are produced by the electron linear accelerator, and a huge number of photons with a wide energy spectrum are produced within a very short period. Consequently, it is difficult to measure the X-ray energy spectrum for such accelerator-based X-ray sources using simple spectrometry. Due to this difficulty, unexpected images and artifacts which lead to incorrect density information and dimensions of specimens cannot be avoided in CT images. For getting highly precise CT images, it is important to know the precise energy spectrum of emitted X-rays. Materials and Methods: In order to realize it we investigated a new approach utilizing the Bayesian estimation method combined with an attenuation curve measurement using step shaped attenuation material. This method was validated by precise measurement of energy spectrum from a 1 MeV electron accelerator. In this study, to extend the applicable X-ray energy range we tried to measure energy spectra of X-ray sources from 6 and 9 MeV linear accelerators by using the recently developed method. Results and Discussion: In this study, an attenuation curves are measured by using a step-shaped attenuation materials of aluminum and steel individually, and the each X-ray spectrum is reconstructed from the measured attenuation curve by the spectrum type Bayesian estimation method. Conclusion: The obtained result shows good agreement with simulated spectra, and the presently developed technique is adaptable for high energy X-ray source more than 6 MeV.

• Proceedings of the Korean Nuclear Society Conference
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• 1995.05a
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• pp.925-930
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• 1995

A new approach on the correction for Compton escape component in X-ray unfolding algorithm was investigated to obtain more accurate X-ray source spectrum. The X-ray detector used in this study was a planar type HPGe detector(EG&G ORTEC, GLP-32340/13-P-LP) whose energy response has been blown and ISO narrow beam series were employed as source spectrum. At lower energy Part of measured X-ray spectrum including the correction for Compton escape component more accurate unfolded spectrum was obtained by letting down the starting energy level of the collection in existing spectrum correction procedure to consider multiple scattering effects. It is, from this study, concluded that accurate correction for Compton escape component is needed in X-ray unfolding procedure since Compton scattering becomes more important as incident X-ray energies increase.

• 제어로봇시스템학회:학술대회논문집
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• 1996.10b
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• pp.117-120
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• 1996

In this paper, a new approach to acquire the cross-sentional image for automatic solder joint inspection of double-sided PCB using X-ray source is presented. We designed the apparatus with fixed X-ray source to realize the cross-sectional image by tunning object and detector synchronously. The cross-sectional images are captured at several view angle of X-ray source, the geometric image distortions caused by view angle and the shape of image intensifier are compensated. The precision variation of cross-sectional image by the change of view angle was investigated. Also we acquired the cross-sectional image to the solder joint of double-sided PCB and reconstructed the shape of solder joint.

• Proceedings of the Optical Society of Korea Conference
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• 1998.08a
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• pp.192-193
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• 1998

At Rutherford Appleton Laboratory(RAL), a high-repetition rate ps exicmer laser-plasma x-ray source has been developed for x-ray lithography with a calibrated output of up to 1 watt X-ray average power at 1nm wavelength. In a previous reports this compact x-ray source was used to print 0.18$\mu$m lines for a gate on Si-FET devices and deep three-dimensional structure with 100$\mu$m length, 25$\mu$m width, and 48 $\mu$m depth for a nanotechnology. The deep X-ray lithography is called as LIGA thchnology and getting a wide interest as a new technology for a nano-device. In this report all this works are summarized.