• Title/Summary/Keyword: X-ray absorption

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Estimated spectrum of a 6MV X-ray (Laplace transform 방법에 의한 x-ray의 에너지 스펙트럼 추정)

  • Yoo, Myung-Jin
    • Progress in Medical Physics
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    • v.4 no.2
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    • pp.37-47
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    • 1993
  • The quality of radiation for a high energy x-ray beam can be specified by its attenuation curve in a selected material. The inverse Laplace transform of the attenuation curve can be used as an approximate indication of the energy spectrum of the beam. We have made a comparative investigation of the estimated spectrum obtained by the Laplace transform analysis of the transmitted exposure data measured in an absorption study of a 6MV x-ray beam. Two of existing transform pair models have been investicated and discussed.

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NON-DESTRUCTIVE DETECTION FOR FOREIGN MATERIALS IN FOOD AND AGRICULTURAL PRODUCTS USING X-RAY SYSTEM

  • Morita, Kazuo;Tanaka, Shun'ichirou;Ogawa, Yukiharu
    • Proceedings of the Korean Society for Agricultural Machinery Conference
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    • 1996.06c
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    • pp.334-343
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    • 1996
  • Quality evaluation for food and agricultural products have always been one of the most elusive problems associated with the handling , processing and marketing in a food plant production. In order to detect physical foreign materials in food and agricultural products, non-destructive techniques have been developed for many years. Application of X-ray system to detect physical foreign materials in food and agricultural products could be considered to be a high potential method. Especially , it is impossible to detect internal physical foreign materials by visual inspections. In this study, it was tried to be applied for two different X-ray devices. Soft X-ray system with CdTe sensor and X-ray CT scanner were evaluated for advantage of the detection of non-meltallic foreign materials in food and agricultural products . Though the soft X-ray is not a high energy radiation, it is possible to detect small different density in a material. The CdTe sensor has a high resolution for t e soft X-ray energy region. The density characteristics of foods and foreign material were expressed region. The density characteristics of foods and foreign materials were expressed as a soft X-ray energy spectrum. The energy spectrum was analyzed by a personal computer with a multi-channel analyzer. X-ray CT scanner can provide visual image and analyze by three dimensional information inside food and agricultural products. The X-ray CT scanner using as a medical equipment was used to detect a foreign material. The density characteristics of food and foreign materials in food were tried to be detected by the threshold value on the basis of the CT numbers. The soft X-ray absorption characteristics for acrylin plates and distilled water were obtained and could be found the possibility of detecting a small physical foreign materials such as a plastic wrapping film , a stone and grasshopper in food and agricultural products.

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Soft X-ray Nanoscopy for Nano- and Bio-materials at the Pohang Light Source

  • Kim, Nam-Dong
    • Proceedings of the Korean Vacuum Society Conference
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    • 2016.02a
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    • pp.86-86
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    • 2016
  • 최근 포항가속기연구소 10A 빔라인에 Scanning Transmission X-ray Microscopy (STXM)가 완성되어 운영 중이다. Soft x-ray imaging 장치로서 기술적으로 Sample scanning 기법이 활용된다. 이는 Zone plate를 통해 집속된 빔이 샘플에 조사되고 검출되는 방식이다. 이러한 Scanning 기법을 활용하고 있는 10A STXM은 기본적으로 흡수분광기법 (x-ray absorption spectroscopy)을 이용하고 있다. 특히, 10A 빔라인 STXM은 최고 20 nm까지 공간분해능이 가능하다는 장점이 있다. 따라서 수십에서 수백 나노미터 크기의 시료들 또는 나노구조에 대한 물리화학적 상태 분석이 쉽게 이루어지고 있다. 주로 시료를 투과하면서 흡수되는 X-선 세기 대비를 맵핑하는 형식의 이미지 데이터와 더불어 X-선의 에너지를 조정함으로써 각 에너지에 해당하는 이미지스택을 결과로 얻게 된다. 이러한 이미지 결과로부터 시료의 나노크기에서 오는 물리화학적 상태를 분석하고 물리에서 바이오까지 다양한 분야의 실험 활용이 가능한 상태다.

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MICROSTRUCTURAL STUDY OF $Fe_{1-x}Ti_x$ ALLOYS FORMED BY ION BEAM MIXING

  • Jeon, Y.;Lee, Y.S.;Choi, B.S.;Woo, J.J.;Whang, C.N.
    • Journal of the Korean Vacuum Society
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    • v.6 no.S1
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    • pp.127-132
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    • 1997
  • Microstructure of the Fe-Ti system by ion beam mixing of multilayers at 300 K and 77 K has been studied in a wide composition range. The ion bombardment was carried out using $Ar^+$ ions at 80 keV. Using grazing angle x-ray diffraction we find that the lattice parameters of these bcc solid solutions are very close to that of $\alpha$-Fe. Extended x-ray absorption fine-structure spectroscopy have been performed to investgate the short-range order in the ion-beam-mixed state. The structure parameters, such as the interatomic distance and the coordination number are estmated from the Fe K-edge Fourier filtered EXAFS spectra. The interatomic distance is independent of the alloy concentration and it is almost constant. The study of x-ray absorption near-edge structure gives information on the individual $\rho$components of the partial densityof states of the conduction band of the Fe and Ti We also find that a charge transfer from Ti to Fe atoms takes place.

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In situ Synchrotron X-ray Techniques for Structural Investigation of Electrode Materials for Li-ion Battery (방사광 X-선을 이용한 리튬이온전지 소재의 실시간 구조 분석 연구)

  • Han, Daseul;Nam, Kyung-Wan
    • Ceramist
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    • v.22 no.4
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    • pp.402-416
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    • 2019
  • The development of next-generation secondary batteries, including lithium-ion batteries (LIB), requires performance enhancements such as high energy/high power density, low cost, long life, and excellent safety. The discovery of new materials with such requirements is a challenging and time-consuming process with great difficulty. To pursue this challenging endeavor, it is pivotal to understand the structure and interface of electrode materials in a multiscale level at the atomic, molecular, macro-scale during charging / discharging. In this regard, various advanced material characterization tools, including the first-principle calculation, high-resolution electron microscopy, and synchrotron-based X-ray techniques, have been actively employed to understand the charge storage- and degradation-mechanisms of various electrode materials. In this article, we introduce and review recent advances in in-situ synchrotron-based x-ray techniques to study electrode materials for LIBs during thermal degradation and charging/discharging. We show that the fundamental understanding of the structure and interface of the battery materials gained through these advanced in-situ investigations provides valuable insight into designing next-generation electrode materials with significantly improved performance in terms of high energy/high power density, low cost, long life, and excellent safety.

X-Ray Absorption Spectroscopic Study of 120 MeV $Ag^{9+}$ Ion-Irradiated N-Doped ZnO Thin Films

  • Gautam, Sanjeev;Lim, Weon Cheol;Kang, Hee Kyung;Lee, Ki Soo;Song, Jaebong;Song, Jonghan;Asokan, K.;Chae, Keun Hwa
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.02a
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    • pp.315-315
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    • 2013
  • We report the electronic structure modification in the swift heavy ion (SHI) irradiated N-doped ZnO thin films prepared by RF sputtering from ZnO target in different ratio of Ar/$N_2$ gas mixture using highly pure $N_2$ gas. The different N-ZnO thin lms were then irradiated with 120 MeV Ag ion beam with different doses ranging from $1{\times}10^{11}$ to $5{\times}10^{12}$ ions/$cm^2$ and characterized by XRD and near edge X-ray absorption ne structure (NEXAFS) at N and O K-edges. The NEXAFS measurements provide direct evidence of O 2p and Zn 3d orbital hybridization and also the bonding of N ions with Zn and O ions. The minimum value of resistivity of $790{\Omega}cm$, a Hall mobility of $22cm^2V^-1s^-1$ and the carrier concentration of $3.6{\times}10^{14}cm^{-3}$ were yielded at 75% $N_2$. X-ray diffraction (XRD) measurements revealed that N-doped ZnO films had the preferential orientation of (002) plane for all samples, while crystallinity start decreasing at 32.5% $N_2$. The average crystallite size varies from 5.7 to 8.2 nm for 75% and then decreases to 7.8 nm for 80% $Ar:N_2$ ratio.

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Irradiation-Induced Electronic Structure Modifications in ZnO Thin Films Studied by X-Ray Absorption Spectroscopy

  • Gautam, Sanjeev;Yang, Bum Jin;Lee, Yunju;Jung, Ildoo;Won, Sung Ok;Song, Jonghan;Asokan, K.;Chae, Keun Hwa
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.02a
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    • pp.456-456
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    • 2013
  • We report the modifications in the electronic structureof ZnO thin films induced by swift heavy ion (SHI) irradiated ZnO thin films by using near edge X-ray absorption fine structure (NEXAFS) spectroscopy at O K-edge was performed at BL10D XAS-KIST beamline at Pohang Accelerator Lab (PAL). ZnO films of 250 nm thickness oriented in [200] plane deposited by RF magnetron sputtering using equal $Ar:O_2$ atmosphere and air annealed at $500^{\circ}C$ for 6 hours for stability were irradiated with 120 MeV Au and 100 MeV O beams separately with different doses ranging from $1{\times}10^{11}$ to $5{\times}10^{12}$ ions/$cm^2$. High Resolution X-ray diffraction and NEXAFS analysis indicates significant changes in the electronic structure and the SHI effect is different for Ag and O-beams. The NEXAFS measurements provide direct evidence of O 2p and Zn 3d orbital hybridization. The NEXAFS results will be presented in detail.

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