• 제목/요약/키워드: X-ray Structure

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Structure Study of Polycrystalline $Na_3YSi_3O_9$ and Its Substitutes Related to $Na_4CaSi_3O_9,\;Ca_3Al_2O_6$ Structure

  • Kim, Chy-Hyung;Banks, Ephraim
    • Bulletin of the Korean Chemical Society
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    • 제8권1호
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    • pp.6-9
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    • 1987
  • The study of the $Na_3YSi_3O_9$ structure, by x-ray diffraction and infrared spectrum, showed that $Na_3YSi_3O_9$ is similar to $Na_4CaSi_3O_9$ except for its being pseudo-cubic instead of cubic. The peaks in the x-ray diffraction pattern of $Na_3YSi_3O_9$ could therefore be indexed on the basis of the $Na_4CaSi_3O_9$ cell. Also, modified $Na_3MSi_3O_9$ (M = Lu, Yb, Tm, Er, Y, Ho, Dy, Gd, Eu, and Sm) type compounds were synthesized by introducing excess sodium, decreasing M(III) concentration, and substituting small amount of phosphorus for silicon. The unit cell parameters of the composition $Na_{3.2}M_{0.7}Si_{2.9}P_{0.1}O_{8.7}$ were estimated from x-ray powder diffraction patterns using the Cohen method.

X-선을 이용한 $Co_{1-x}Ga_x$ 합금계의 화학구조와 전자구조 (Chemical and Electronic structures of $Co_{1-x}Ga_x$ alloys by X-ray Analyses)

  • 유권국;이주열;지현배;이연승
    • 한국진공학회지
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    • 제13권2호
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    • pp.86-91
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    • 2004
  • 전이금속 갈라이드는 고온 응용성이 높은 물질로 관심을 모으고 있다. CsCl구조를 갖는 것으로 알려진 넓은 조성 범위에서 전이금속 갈라이드에 대해 물리적 특성과 전자구조의 상호관계에 대해 체계적인 연구를 하였다. $Co_{l-x}Ga$ $_{x}$ 합금($0.35\leq$x$\leq0.55$)을 arc-melting 방법으로 제작하였으며, 합금 제작 후 시료의 균질성을 높이기 위해 $1000 ^{\circ}C$에서 48시간동안 열처리하였다. 결정 구조를 알아보기 위해 x-ray diffraction을 측정한 결과, 이 조성 범위 안에서 모두 CsCl(B2)구조를 갖는 것으로 밝혀졌다. 화학적 상태와 전자 구조를 알아보기 위해서 x-선 광전자 분광, 그리고 x-선 흡수끝머리 부근 미세구조 (XANES)를 측정하였으며, 조성에 따라 서로 다른 물리적 특성을 보였다. 합금제작 과정에서 시료의 산화가 이루어졌으며 포함된 산소는 Ga과 결합하여 $Ga_2O_3$상을 이루었다. 전자 구조적으로 Co의 d 전자와 Ga의 p 전자사이의 p-d hybridization에 의해 합금이 형성되었다.

디지털 X선 영상센서 적용을 위한 진공증착 CsI 특성평가 (The X-ray Detection Characteristic of vacuum evaporated CsI for Digital X-ray Image Sensor)

  • 신정욱;박지군;최장용;석대우;김재형;남상희
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2003년도 춘계학술대회 논문집 센서 박막재료 반도체 세라믹
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    • pp.15-18
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    • 2003
  • In recent years, there has been keen interest in phosphor materials responding X-ray. Cesium iodide of the materials is a material with a high $\gamma$-ray stopping power due to its relative high density and atomic number. CsI is noted for its high resistance to thermal and mechanical shock due to the absence of a cleavage plane. To design the structure of CsI detector, we analysed the structure with SEM and XRD and measured UV meter.

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기류방출형 연X선 조사에 의한 정전기 제거 장치에 관한 연구 (A Study on the Removal of Electrostatic using Transmitted Ions Generated Soft X-ray with Compressed Air)

  • 귄승열;이동훈;최재욱;서민석
    • 한국안전학회지
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    • 제25권1호
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    • pp.27-31
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    • 2010
  • It is a well known fact that the LCD and Semiconductor Devices are a central part of IT industry which is important in the present and the future. But the biggest problem of Semiconductor and LCD manufacturing is maintaining a cleaning room environment. For this reason, the soft X-ray type Ionizer was used as the electrostatic reducer device, which protects damage of the product against electrostatic discharge in the manufacturing process. Therefore it is a essential important factor during Semiconductor and LCD production process. But the soft X-ray has a intrinsic problem with harmful to human being in case of soft X-ray exposure. That's reason we have the research to solve above problem and made an apparatus that it was covered with shielding structure to protect X-ray radiation to outside. And besides, it has a possibility to eliminate the charged electrostatic in the narrow space through the slot for Ion emissions with dual soft X-ray sources on the both side. It is also not make the particles from itself when it has been operated.

X-ray CT 이미지를 이용한 암석의 특성 평가 방안 (Evaluation Method of Rock Characteristics using X-ray CT images)

  • 김광염;윤태섭
    • 터널과지하공간
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    • 제29권6호
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    • pp.542-557
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    • 2019
  • 암석의 성인과 변성에 따른 내부구조의 마이크로 특성은 암반의 거동 특성에 영향을 미친다. 본 연구에서는 암석 내부의 구성물질의 분포 특성을 반영하는 엑스레이 단층(X-ray CT) 이미지에 기초한 새로운 암석특성의 평가방안을 고찰하였다. 암석의 불균질 특성 및 이방성 특성의 정량화, 암석의 구성광물 입자의 크기분포 및 형상특성, 공극이미지를 이용한 유동해석, 암석내부의 노출되지 않은 절리면 거칠기 평가 등 전통적인 암석의 시험법으로 측정하기 어려웠던 중요한 암석의 특성들이 X-ray CT 이미지의 분석을 통하여 평가될 수 있다.

A Monochromatic X-Ray CT Using a CdTe Array Detector with Variable Spatial Resolution

  • Tokumori, Kenji;Toyofuku, Fukai;Kanda, Shigenobu;Ohki, Masafumi;Higashida, Yoshiharu;Hyodo, Kazuyuki;Ando, Masami;Uyama, Chikao
    • 한국의학물리학회:학술대회논문집
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    • 한국의학물리학회 2002년도 Proceedings
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    • pp.411-414
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    • 2002
  • The CdTe semiconductor detector has a higher detection efficiency for x-rays and $\square$amma rays and a wider energy band gap compared with Si and Ge semiconductor detectors. Therefore, the size of the detector element can be made small, and can be operated at room temperature. The interaction between a CdTe detector and incident x-rays is mainly photoelectric absorption in the photon energy range of up to 100 keV. In this energy range, Compton effects are almost negligible. We have developed a 256 channel CdTe array detector system for monochromatic x-ray CT using synchrotron radiation. The CdTe array detector system, the element size of which is 1.98 mm (h) x 1.98 mm (w) x 0.5 mm (t), was operated in photon counting mode. In order to improve the spatial resolution, we tilted the CdTe array detector against the incident parallel monochromatic x-ray beam. The experiments were performed at the BL20B2 experimental hutch in SPring-8. The energy of incident monochromatic x-rays was set at 55 keV. Phantom measurements were performed at the detector angle of 0, 30 and 45 degrees against the incident parallel monochromatic x-rays. The linear attenuation coefficients were calculated from the reconstructed CT images. By increasing the detector angle, the spatial resolutions were improved. There was no significant difference between the linear attenuation coefficients which were corrected by the detector angle. It was found that this method was useful for improving the spatial resolution in a parallel monochromatic x-ray CT system.

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데칸술폰이 삽입된 니켈 화합물의 층상 구조의 열적 성질 (Thermal behavior of the layered structure of decanesulfonate intercalated into the hydrated nickel compound)

  • 허영덕;전태현;박용준
    • 한국결정성장학회지
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    • 제9권6호
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    • pp.580-584
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    • 1999
  • 수화된 니켈에 데칸술폰이 층간 삽입된 화합물을 합성한 후 성질을 확인하였다. 화합물의 층상구조는 고온 X-선 회절 데이터로 확인하였다. 온도가 증가하면 층간 삽입된 니켈화합물의 구조가 변하는 것과 동시에 화합물의 층 거리가 24.7 $\AA$에서 30.5 $\AA$가지 증가하였다. X-선 회절 데이터와 데칸술폰의 크기로부터 니켈 층에 결합된 데칸술폰의 공간배열을 결정하였다. 이중 층 구조를 가진 데칸술폰의 분자 축은 니켈 층에 경사진 각도로 수직하게 배열되어있다.

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미세 X선 단층촬영 기법의 개발과 적용 (Development of X-ray Micro Computed Tomography and Applications)

  • 김승곤;임재홍;김보흠;이의재;이상준
    • 한국가시화정보학회지
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    • 제8권2호
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    • pp.45-50
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    • 2010
  • The objective of this study is to elucidate the feasibility of synchrotron X-ray micro CT as a non-destructive imaging method to visualize the three-dimensional morphological structures of biological and non-biological samples. The experiments were conducted in 7B2 X-ray micro CT beamline in Pohang Accelerate Laboratory (PAL). A rotational 3-axis stage was specially designed for $0^{\circ}-180^{\circ}$ scanning of test samples. Preliminary tests were performed for opaque samples including a mosquito head, a plant seed and gas diffusion layer (GDL) of polymer electrolyte fuel cell to verify the feasibility of the X-ray micro CT. It visualized clearly the internal structure of all the test samples, supporting its usefulness.

Correlation between composition and structure of PtxNiy alloy nanodendrites

  • Lee, Young-Woo;Kwak, Da-Hee;Park, Kyung-Won
    • 한국결정성장학회지
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    • 제26권5호
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    • pp.165-170
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    • 2016
  • We have synthesized $Pt_xNi_y$ alloy nanodendrites by a thermal decomposition method. The structure and composition of the as-prepared samples were characterized by field-emission transmission electron microscopy (FE-TEM), energy dispersive X-ray (EDX) spectroscopy, and X-ray diffraction (XRD). The growth mode of the $Pt_xNi_y$ alloy samples synthesized as a function of an intended atomic fraction of Ni was likely to be strongly affected by and reduction (or oxidation) potentials and surface energy.

$KD_2PO_4$의 결정구조: 중성자와 X-선 회절에 의한 연구 (Crystal Structure of $KD_2PO_4$: Neutron and X-ray Diffraction Studies)

  • 김신애;심해섭;이창희
    • 한국결정학회지
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    • 제11권3호
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    • pp.162-166
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    • 2000
  • KD₂PO₄ single crystals were grown from D₂O with reagent KH₂PO₄ and the crystal structure was determined by X-ray and neutron diffraction methods. The crystals are tetragonal at room temperature, I42d, with lattice parameters of a=7.4633(7), c=6.9785(5) Å and Z=4. Intensity data were collected on an Enraf-nonius CAD4 diffractometer with a graphite monochromated MoK/sub α/ radiation (λ=0.7107Å) and on the neutron four circle single crystal diffractometer with Ge(331) monochromated neutron beam (λ=0.997Å). The structure was refined by full-matrix least-square to final R and wR values of 0.030 and 0.072, respectively, for 204 observed reflections with I>2σ(I) by X-ray diffraction and to final R=0.041 and wR=0.096 for 144 observed relfecdtions by neutron diffraction. The O…O distance of 2.516(4)Å obtained by X-ray diffraction is the same as that of 2.515(4)Å by neutron diffraction. On the other hand, the O-D/H distance of 0.84(4)Å by X-ray diffraction is considerably shorter than 1.029(7) Åby neutron diffraction. Hydrogen and deuterium can be readily distinguished by neutrons. In this crystal 66% of H-positions were substituted by D and the rest 34% occupied by H. The phase transition temperature of DKDP obtained with deuteration levels is f193K. This value agrees fairly well with the result of DSC measurement. The nuclear density distribution by neutron diffraction provides an observation of the disordered state of D/H in KD₂PO₄ at room temperature.

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