• Journal of the Korean Wood Science and Technology
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• v.36 no.6
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• pp.13-22
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• 2008

Internal voids affecting the mechanical properties of wood composite were classified into two catagories and characteristics of voids were examined according to density variation of strandboard. The void distribution and content of strandboard according to board density were measured by X-ray computed tomography system and analized using image processing software. Prior to investigation, the densities of strandboard were measured by densitometer and the results were showed high correlation with conventional oven drying method. Based on the image analysis conducted on captured images by X-ray tomography, low resolution can be used to capture the macro-voids (between strand) but not the micro-voids (within strands). Intermediate resolution can be used to capture both the macro and the micro-voids and high resolution can be successfully used to capture the majority of the micro-voids. The content of macro-void was measured and content of micro-void was computed by corresponding related equation. The macro-void distribution can be successfully understood and void content can be correctly estimated through the results.

• Tunnel and Underground Space
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• v.29 no.6
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• pp.542-557
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• 2019

The behavior of rock mass is influenced by its microscopic feature of internal structure generating from forming and metamorphic process. This study investigated a new methodology for characterization of rock based on the X-ray CT (computed tomography) images reflecting the spatial distribution characteristics of internal constituent materials. The X-ray image based analysis is capable of quantification of heterogeneity and anisotropy of rock fabric, size distribution and shape parameter analysis of rock mineral grains, fluid flow simulation based on pore geometry image and roughness evaluation of unexposed joint surface which are hardly acquired by conventional rock testing methods.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.7 no.2
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• pp.197-206
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• 1997

A SiC epilayer on the 6H-SiC crystal substrate was grown by chemical vapor deposition (CVD). The crystal structure of the SiC epilayer was investigated by using the X-ray diffraction patterns and the Roman scattering spectroscopy. The SiC epilayer on the 6H-SiC substrate was grown to be homoepilayer by CVD. In order to distinguish a certain SiC polytype mixed in the SiC crystal grown by the modified Lely method, we have calculated the X-ray diffraction intensities and Brags angles of the typical SiC crystal powders. By comparing the measured X-ray diffraction pattern with the calculated ones, it was identified that the SiC crystal grown by the modified Lely method was the 6H-SiC crystal mixed some 15R-SiC.

• Korean Journal of Materials Research
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• v.11 no.8
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• pp.664-664
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• 2001

The mechanical alloying (MA) effect in $\sigma$-VFe intermetallic compound was studied by neutron and X-ray diffraction. The structure of MA $\sigma$-VFe powders were characterized by the X- ray diffraction with Cu- $K\alpha$ radiation and neutron diffraction with monochromatic neutrons of $1.835\AA$ using a high resolution powder diffractometer (HRPD). Mechanical alloying of $\sigma$-VFe compound gives rise to a dramatic structural change. After 60 hours of MA, the Fe-Fe distribution of the $\sigma$- phase VFe tetragonal structure with 30 atoms in a unit cell is found to change into that of the $\sigma$-(V,Fe) solid solution with bcc structure, which is a stable phase at elevated temperature above $1200^{\circ}C$. A comparison of X-ray diffraction data for the $\alpha$-phase has been also made with the corresponding neutron diffraction data. The (101) and (111) diffraction peaks of the $\sigma$-phase was clearly observed only in neutron diffraction pattern, which is believed to be a characteristic feature due to the chemical atomic ordering of $\sigma$- VFe phase.

• Proceedings of the Korean Magnestics Society Conference
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• 1997.11a
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• pp.68-69
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• 1997

• Proceedings of the Materials Research Society of Korea Conference
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• 1998.11a
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• pp.17-17
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• 1998

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.4 no.4
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• pp.388-394
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• 1994

A Hg(0.79)Cd(0.21)Te single crystal has been grown by the Traveling Heater Method(THM). Its zinc blend cubic structure is identified from the X-ray diffraction patterns and its lattice constant is determined to be $6.464 {\AA}$ using the least-square method of Cohen. From the values of the lattice constant, the composition x is determined to be 0.21. The electron density is calculated from the relative intensities of the scattered X-ray and compared with the theoretically calculated values. From the electron density distribution, it is shown that the crystal binding of Hg(1-x)Cd(x)Te(MCT) is mainly covalent and has tetrahedron bonds between adjacent atoms.

• Transactions of the Korean Society of Automotive Engineers
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• v.7 no.8
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• pp.248-261
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• 1999

The fatigue life of mechanical components and structures has been influenced by mechanical, material and environmental conditions. It is important to search out the load type and size for accurate cause of fracture at the damaged surface of material. The fractographic method by x-ray diffraction can utilize residual stress $\sigma$_r and half-value breadth B and find out the types and the mechanical conditions of fracture. This study showed the relationship between fracture mechanical parameters $\Delta$K, $K_{max}$ and X-ray residual stress $\sigma$_r for normalized SS41 steel with homogeneous crystal structure and M.E.F. dual phase steel(martensite encapsulated islands of ferrite). The fatigue crack propagation tests were carried out under stress ratios 0.1 and 0.5. The x-ray diffraction technique according to crack propatation direction was applied to fatigue fractured surface. Residual stress $\sigma$_r was independent on stress ratios by arrangement of $\Delta$K. The equation of $\sigma$_r$\Delta$K was established by the experimental data. Therefore, fracture mechanical parameters can be estimated can be estimated by the measurement of X-ray parameters.

• Proceedings of the Korean Vacuum Society Conference
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• 2014.02a
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• pp.368.2-368.2
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• 2014

$SnO_2$을 이용한 반도체는 기체 센서, 트랜지스터, 태양전지와 같은 여러 분야에 적용 가능하기 때문에 많은 각광을 받고 있다. $SnO_2$을 이용한 반도체 소자는 높은 화학적 안정성과 독특한 물리 화학적 특성을 지니고 있을 뿐만 아니라 부피에 대한 높은 표면적 비율을 가지고 있다. 우수한 $SnO_2$나노구조를 얻기 위해서 전자관 박막증착, 졸겔법, 물리적 증기증착, 열증착과 같은 다양한 방법들이 사용되었다. 다양한 합성 방법들 중에서 전기화학 증착법은 높은 성장율, 대면적 공정, 낮은 가격과 같은 장점을 가지고 있어 많은 연구가 진행되었지만, $SnO_2$ 구조의 성장조건에 따른 체계적인 연구는 진행되지 않았다. 본 연구는 indium-tin-oxide (ITO)로 코팅된 유리 기판 위에 전기화학 증착법을 사용하여 다양한 성장 조건에 따라 성장된 $SnO_2$나노구조들의 물리적 특성들을 관찰하였다. ITO 유리 기판 위에 성장된 $SnO_2$나노구조는 음극의 전구체와 전류의 상호작용에 의해 생성되는 산소 분자의 환원에 의해 형성된다. $SnO_2$나노구조의 모양은 전기화학 증착의 성장 환경에 따라 달라진다. $SnO_2$나노구조를 관찰하기 위해 시간에 따른 전압-전류, X-ray광전자분광법, 주사형전자현미경, X-ray회절분석법을 사용하여 측정하였다. ITO 유리 기판 위에 성장한 $SnO_2$ 소자에 서로 다른 인가 전압을 가해 주었을 때에 따른 전류밀도를 측정하였다. 일정한 인가전압에서 $SnO_2$나노구조의 X-ray광전자분광법 측정 을 통해 화학적 결합과 X-ray회절분석법 통한 $SnO_2$ 성장 방향을 관찰하였다. 주사형전자현미경 측정을 통하여 $SnO_2$의 표면을 관찰하였다

• Journal of the Mineralogical Society of Korea
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• v.20 no.4
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• pp.351-356
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• 2007

The crystal structure of $Li(ND_4)SO_4$ was analyzed by X-ray and neutron diffraction methods. The crystal is a deuterated $Li(NH_4)SO_4$ and one of the ferroelectric materials with hydrogen atoms. The crystal is orthorhombic at room temperature, $P2_1nb$, with lattice parameters of $a=5.2773(5)\;{\AA},\;b=9.1244(23)\;{\AA},\;c=8.7719(11)\;{\AA}$ and Z=4. Neutron intensity data were collected on the Four-Circle diffractometer (FCD) at HANARO in Korea Atomic Energy Research Institute and X-ray date were given by Prof. Y. Noda of Tohoku University Japan. The structure was refined by full-matrix least-square to final R value of 0.070 for 1450 observed reflections by X-ray diffraction and to final R=0.049 for 745 observed reflections by neutron diffraction. With X-ray data we obtained only one hydrogen atomic position. However, not only all atomic positions of four hydrogen atoms at $NH_4$ but also the occupation factors of D and H were refined with neutron data. From this results we obtained the average chemical structure of this sample, $LiND_{3.05}H_{0.95}SO_4$.