• Title/Summary/Keyword: X-Ray Spectrometer

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Characteristics of Clay Minerals in Sihwa Area (시화지구 연약점토의 광물학적 특성)

  • 김낙경;박종식;김유신
    • Proceedings of the Korean Geotechical Society Conference
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    • 2003.03a
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    • pp.773-780
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    • 2003
  • The characteristics of soft clays is very important for the land development plan. This study is to investigate correlations between the engineering properties and the characteristics of clay minerals of the disturbed clay samples obtained from Sihwa area. This study included X-Ray Diffraction Analysis, X-Ray Fluorescence Spectrometer Analysis, Scanning Electron Microscopy Analysis and Energy Dispersive X-Ray Spectrometer Analysis. The correlations between the clay mineral properties and the laboratory and field testing results were investigated.

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The Correlations between Mineralogy and Engineering Characteristics of Soft Clay in Sihwa Area (시화지구 연약점토의 광물학적 특성과 공학적 특성의 상관관계)

  • Kim Nak-Kyung;Park Jong-Sik;Joo Yong-Sun
    • Journal of the Korean Geotechnical Society
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    • v.20 no.9
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    • pp.155-166
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    • 2004
  • The characteristics of soft clays are very important for the land development plan. This study is to investigate correlations between the engineering properties and the characteristics of clay minerals of the undisturbed clay samples obtained from Sihwa area. This study included X-Ray diffraction analysis, X-Ray fluorescence spectrometer analysis, scanning electron microscopy analysis and energy dispersive X-Ray spectrometer analysis. The correlations between the clay mineral properties and the laboratory and field testing results were investigated. The characteristics of soft clay in Sihwa area were compared with those in Yangsan and Kunsan area.

The New X-ray Induced Electron Emission Spectrometer

  • Yu.N.Yuryev;Park, Hyun-Min;Lee, Hwack-Ju;Kim, Ju-Hwnag;Cho, Yang-Ku;K.Yu.Pogrebitsky
    • Proceedings of the Korea Crystallographic Association Conference
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    • 2002.11a
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    • pp.5-6
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    • 2002
  • The new spectrometer for X-ray Induced Electron Emission Spectroscopy (XIEES) .has been recently developed in KRISS in collaboration with PTI (Russia). The spectrometer allows to perform research using the XAFS, SXAFS, XANES techniques (D.C.Koningsberger and R.Prins, 1988) as well as the number of techniques from XIEES field(L.A.Bakaleinikov et all, 1992). The experiments may be carried out with registration of transmitted through the sample x-rays (to investigate bulk samples) or/and total electron yield (TEY) from the sample surface that gives the high (down to several atomic mono-layers in soft x-ray region) near surface sensitivity. The combination of these methods together give the possibility to obtain a quantitative information on elemental composition, chemical state, atomic structure for powder samples and solids, including non-crystalline materials (the long range order is not required). The optical design of spectrometer is made according to Johannesson true focusing schematics and presented on the Fig.1. Five stepping motors are used to maintain the focusing condition during the photon energy scan (crystal angle, crystal position along rail, sample goniometer rail angle, sample goniometer position along rail and sample goniometer angle relatively of rail). All movements can be done independently and simultaneously that speeds up the setting of photon energy and allows the using of crystals with different Rowland radil. At present six curved crystals with different d-values and one flat synthetic multilayer are installed on revolver-type monochromator. This arrangement allows the wide range of x-rays from 100 eV up to 25 keV to be obtained. Another 4 stepping motors set exit slit width, sample angle, channeltron position and x-ray detector position. The differential pumping allows to unite vacuum chambers of spectrometer and x-ray generator avoiding the absorption of soft x-rays on Be foil of a window and in atmosphere. Another feature of vacuum system is separation of walls of vacuum chamber (which are deformed by the atmospheric pressure) from optical elements of spectrometer. This warrantees that the optical elements are precisely positioned. The detecting system of the spectrometer consists of two proportional counters, one scintillating detector and one channeltron detector. First proportional counter can be used as I/sub 0/-detector in transmission mode or by measuring the fluorescence from exit slit edge. The last installation can be used to measure the reference data (that is necessary in XANES measurements), in this case the reference sample is installed on slit knife edge. The second proportional counter measures the intensity of x-rays transmitted through the sample. The scintillating detector is used in the same way but on the air for the hard x-rays and for alignment purposes. Total electron yield from the sample is measured by channeltron. The spectrometer is fully controlled by special software that gives the high flexibility and reliability in carrying out of the experiments. Fig.2 and fig.3 present the typical XAFS spectra measured with spectrometer.

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Analysis of a flat-field soft x-ray spectrometer using a 2400-grooves/mm varied line-spacing concave grating (2400 grooves/mm 비등간격 오목에돌이발을 이용하는 평면결상형 연엑스선 분광기의 특성 해석)

  • 최일우;남창희
    • Korean Journal of Optics and Photonics
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    • v.13 no.3
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    • pp.189-196
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    • 2002
  • The components and alignment parameters of a flat-field soft x-ray spectrometer used in the wavelength range below 50 $\AA$ are determined, and the characteristics of the spectrometer are analyzed. It consists of a toroidal mirror, a slit, a varied line-spacing concave grating, and a soft x-ray detector. The space-resolved spectral image of a source is formed on a single plane using the tordidal mirror and the 2400-grooves/mm varied line-spacing concave grating. The former is used to compensate for the astigmatism caused by the grazing incidence of soft x-ray light on the concave grating. The spectral and spatial resolutions of the spectrometer are calculated by applying the wave front aberration theory, and the diffraction efficiency is calculated by applying the scalar diffraction theory.

Experimental Evaluation of Scattered X-Ray Spectra due to X-Ray Therapeutic and Diagnosis Equipment for Eye Lens Dosimetry of Medical Staff

  • Kowatari, Munehiko;Nagamoto, Keisuke;Nakagami, Koich;Tanimura, Yoshihiko;Moritake, Takashi;Kunugita, Naoki
    • Journal of Radiation Protection and Research
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    • v.47 no.1
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    • pp.39-49
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    • 2022
  • Background: For proper monitoring of the eye lens dose, an appropriate calibration factor of a dosimeter and information about the mean energies of X-rays are indispensable. The scattered X-ray energy spectra should be well characterized in medical practices where eye lenses of medical staffs might be high. Materials and Methods: Scattered X-ray energy spectra were experimentally derived for three different types of X-ray diagnostic and therapeutic equipment, i.e., the computed tomography (CT) scan, the angiography and the fluoroscopy. A commercially available CdZnTe (CZT) spectrometer with a lead collimator was employed for the measurement of scattered X-rays, which was performed in the usual manner. Results and Discussion: From the obtained energy spectra, the mean energies of the scattered X-rays lied between 40 and 60 keV. This also agreed with that obtained by the conventional half value layer method. Conclusion: The scattered X-rays to which medical workers may be exposed in the region around the eyes were characterized by means of spectrometry. The obtained mean energies of the scattered X-rays were found to match the flat region of the dosimeter response.

X-Ray Triple Crystal Diffraction Spectrometer and Its Applications (X-Ray Triple Crystal Diffraction Spectrometer의 제작과 그 응용)

  • Park Young-Han;Yeom Byo-Young;Yoon Hyng-Guen;Min Suk-ki;Park Young Joo
    • Korean Journal of Crystallography
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    • v.8 no.1
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    • pp.20-25
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    • 1997
  • Two experimental methods have been developed for high resolution measurement of x-ray scattering. The methods used were (1) an x-ray double crystal diffraction (DCD) spectrometer set-up and (2) an x-ray triple crystal diffraction (TCD) spectrometer set-up. With the DCD arrangement of Si(511)-sample(hkl), rocking curves have been plotted for Si (333), Si(004) and GaAs(004). Also, with the TCD arrangement of Si(111)-Si(111)-Si(511)-sample(hkl) including monolithic monocro-collimator and $K_{\alpha1}$ selector, rocking curves have been plotted for Si(333), Si(004) and GaAs(004). The results of FWHM by DCD and TCD set-up have been compared each other and discussed. The reflection topographs (004) and (115) in an $In_{0.037}Ga_{0.0963}As/GaAs$ sample have been obtained by DCD set-up.

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Survey on microcalorimetry about EDS (에너지 분산형 미세열량측정에 관한 자료조사)

  • Kim, J.H.;Park, K.S.;Oh, C.S.
    • Journal of Energy Engineering
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    • v.23 no.1
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    • pp.1-6
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    • 2014
  • We have surveyed on microcalorimetry which we can treat with energy dispersive spectrometer(EDS) as wavelength dispersive spectrometer(WDS), to be developed in order to make higher energy resolution as to detect X-ray peak as high as wavelength dispersive spectrometer(WDS). When we take into consideration about energy resolution, Wavelength dispersive spectrometer is 2~20eV and energy dispersive spectrometer is 140~180eV.

A Study on the On-site Flame Resistant Inspection Method by X-ray Fluorescence Spectrometer (X-선 형광분석기를 이용한 현장방염검사방법에 관한 연구)

  • Kim, Hwang-Jin;Lee, Sung-Eun
    • Fire Science and Engineering
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    • v.30 no.5
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    • pp.124-129
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    • 2016
  • According to the current law, on-site flame resistant-treated interior decorations should pass the flame resistant performance test through a 45 degree combustion test from the district fire department. Although a 45 degree combustion test is the most accurate method for determining the flame resistant performance, it can be unreliable when tested on unauthorized samples. To avoid unauthorized sampling, this study suggests on-site flame resistant inspection by X-ray fluorescence spectrometer. Ten types of flame resistant paint were spread on plywoods and MDFs and the components were analyzed by X-ray fluorescence spectrometer. As a result, due to a difference amounts of substances in each paint, each flame resistant paints showed its own characteristic spectrum and the contents of each substance could be determined. On-site flame resistant inspections can be used efficiently when institutional procedures are created.

The analytical application for cement using X-Ray diffraction and X-Ray fluorescence spectrometer (X-Ray Diffraction과 X-Ray Fluorescence를 이용한 시멘트 비교 분석)

  • Jung, Ji Eun;Jang, Yu Rim;Kim, Ki-Wook;Heo, Sangcheol;Min, Ji-Sook
    • Analytical Science and Technology
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    • v.26 no.5
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    • pp.340-351
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    • 2013
  • The chemical element and structural characterization of different types of cements and its brick stones are been investigated under forensic aspects using X-ray florescence (XRF) and X-ray diffraction (XRD) spectrometer. The XRF provides rapid compositional data for controlling almost all stages of raw materials, clinker and cement. The decisive advantage of XRD methods is based on the unique character of the diffraction patterns of crystalline substances, the ability to distinguish between elements and their oxides, and the possibility to identify chemical compounds, polymeric forms, and mixed crystals by non-destructive examination. Therefore, combination of these examinations is useful and able to apply for the forensic analysis in comparison of cements and brick stones. There are more study remained to determine the viability of method for forensic analysis of brick stones and the limits of the discrimination that can be achieved.