• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2003년도 춘계학술대회 논문집 초전도 자성체 연구회
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• pp.84-87
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• 2003

The interfacial diffusion in Fe/Cr/MgO(001) multilayers has been studied using synchrotron x-ray techniques, such as x-ray reflectivity, extended x-ray absorption fine structures (EXAFS), and anomalous x-ray scattering (AXS). The results of x-ray reflectivity indicated that the interfacial roughness of Fe/Cr multilayers with Cr-$4{\AA}$-thick was larger than that with Cr-$4{\AA}$-thick. The results of EXAFS indicated that the Fe element dominantly diffuse into the stable Cr layers at the Fe/Cr interface. The AXS was certified the existence of the interdiffused Fe element in the Cr layers. Our study revealed that the rough interface of the Fe/Cr multilayers was caused by the interfacia diffusion of Fe element into the Cr layers.

• 한국광학회:학술대회논문집
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• 한국광학회 2005년도 제16회 정기총회 및 동계학술발표회
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• pp.212-213
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• 2005

• 한국자기학회:학술대회 개요집
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• 한국자기학회 1998년도 추계연구발표회 논문개요집
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• pp.10-10
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• 1998

• Journal of information and communication convergence engineering
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• 제8권5호
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• pp.581-585
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• 2010

A grid was sandwiched between two cascaded imaging plates. Using a fan-beam X-ray tube and a single exposure scheme, the two imaging plates, respectively, recorded grid-less and grid type information of the object. Referring to the mathematical model of the Grid-less and grid technique, it was explained that the collected components whereas that of imaging plates with grid was of high together with large scattered components whereas that of imaging plate with grid was of low and suppressed scattered components. Based on this assumption and using a Gaussian convolution kernel representing the effect of scattering, the related data of the imaging plates were simulated by computer. These observed data were then employed in the developed post-processing estimation and restoration (kalman-filter) algorithms and accordingly, the quality of the resultant image was effectively improved.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 1999년도 춘계학술대회 논문집
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• pp.30-33
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• 1999

본 연구에서는 Pt/f4-SiC Schottky barrier diodes(SBDs)의 소자 성능향상과 미세구조와의 상관관계를 규명하였다. 다른 열처리 온도구간에 따른 금속/SiC 계면의 미세구조 평가는 X-ray scattering법을 사용하여 분석하였다. 소자의 역 방향 특성은 열처리 온도가 증가함에 따라 저하되었다. As-deposited와 $850^{\circ}C$ 온도에서 열처리된 소자의 최대 항복전압은 각각 1300 V와 626 V 이었다. 그러나, 소자의 순방향 특성은 열처리 온도가 증가함에 따라 향상되었다. X-ray scattering법으로 >$650^{\circ}C$ 이상의 열처리 온도에서는 Pt/SiC 계면에서 Pt-silicides가 형성되었고, 이러한 Silicides의 형성이 Pt/SiC 계면의 평활도를 증가시킨 원인이 됨을 보였다. SBDs의 순방향 특성은 열처리 과정동안 Pt/SiC 계면에서 형성된 silicides의 결정성에 강하게 의존함을 알 수 있었다.

• Nuclear Engineering and Technology
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• 제56권5호
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• pp.1553-1561
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• 2024

Nondestructive radiography using cosmic ray muons has been used for decades to monitor nuclear reactor and spent nuclear fuel storage. Because nuclear fuel assemblies are highly dense and large, typical radiation probes such as x-rays cannot penetrate these target imaging objects. Although cosmic ray muons are highly penetrative for nuclear fuels as a result of their relatively high energy, the wide application of muon tomography is limited because of naturally low cosmic ray muon flux. This work presents a new image reconstruction algorithm to maximize the utility of cosmic ray muon in tomography applications. Muon momentum information is used to improve imaging resolution, as well as muon scattering angle. In this work, a new convolution was introduced known as M-value, which is a mathematical integration of two measured quantities: scattering angle and momentum. It captures the objects' quantity and density in a way that is easy to use with image reconstruction algorithms. The results demonstrate how to reconstruct images when muon momentum measurements are included in a typical muon scattering tomography algorithm. Using M-value improves muon tomography image resolution by replacing the scattering angle value without increasing computation costs. This new algorithm is projected to be a standard nondestructive radiography technique for spent nuclear fuel and nuclear material management.

• Transactions on Electrical and Electronic Materials
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• 제15권3호
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• pp.155-158
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• 2014

The phase transformation of Sn-Pb-Bi solder for photovoltaic ribbon during soldering was studied using real-time synchrotron x-ray scattering. At room temperature, Sn and Pb crystal phases in the solder existed separately. By heating to $92^{\circ}C$, a new PbBi alloy crystal phase was formed, which grew further up to $160^{\circ}C$. The Sn crystal phase first started to melt at $160^{\circ}C$, and was mostly melted at $165^{\circ}C$. In contrast, the Pb and PbBi crystal phases started to melt at $165^{\circ}C$, and were mostly melted at $170^{\circ}C$. The useful result was obtained, that the solder's melting temperature decreased from $183^{\circ}C$ to $170^{\circ}C$ by addition of a small amount of Bi atoms to the eutectic Sn62-Pb38 (wt%) solder. Our study first revealed the detailed in-situ phase transformation of Sn-Pb-Bi solder during heating to the eutectic temperature. Considering the results of peel strength and hardness, adding 1 wt% of Bi atoms to the Sn62-Pb38 (wt%) solder produced an appropriate composition.

• Macromolecular Research
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• 제8권3호
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• pp.103-115
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• 2000

The structural changes viewed from the molecular level have been investigated for the isothermal crystallization phenomena of polyethylene (PE) and the solvent-induced crystallization phenomenon of syndiotactic polystyrene (sPS) glassy sample. The data, which were collected by the time-resolved measurements of Fourier-transform infrared spectra, Raman spectra, synchrotron-sourced small-angle X-ray scattering, wide-angle X-ray scattering, and so on, were combined together to extract the detailed structural information in these phase transition phenomena. In the case of PE, the isothermal crystallization from the melt to the orthorhombic form was found to occur via the conformationally-disordered trans chain form, followed by the formation of the lamellar stacking structure of regular orthorhombic-type crystals. In the case of sPS, the amorphous chains in the glassy sample were found to enhance the mobility through the interaction with the injected solvent molecules, which act as a trigger to cause the conformational ordering from the random coil to the regular T$_2$G$_2$-type helical form. The thus created short helical segments were found to grow into longer helices, which gathered together to form the crystallites, as revealed by the organized coupling of the infrared, Raman and X-ray scattering data.

• 대한화학회지
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• 제35권5호
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• pp.539-544
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• 1991

X-ray Compton 산란선의 강도를 측정하여 내지문처리재(Anti-fingerprint Steel)의 표면에 Coating 되어 있는 Silicone resin film의 두께를 신속하게 측정할 수 있는 새로운 분석방법을 연구하였다. Silicone resin과 같은 유기수지들은 C, H, O, Si 등과 같은 경원소들로 구성되어 있어 compton 산란선의 강도가 높게 나타나는데 이러한 성질을 이용, X-ray tube로부터 발생된 RhK$_{\alpha}$ 선을 시료표면에 조사한 후 발생된 RhK$_{\alpha}$ compton 산란선의 강도를 측정하여 silicone resin film의 두께를 구하였다. 검량곡선 작성결과 0.2 ~ 5.0 ${mu}$m 범위에서 직선성을 나타냈으며 두께측정에 대한 정확도는 0.22 ${mu}$m 이었다.

• Current Applied Physics
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• 제18권11호
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• pp.1205-1211
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• 2018

The frustrated magnet has been regarded as a system that could be a promising host material for the quantum spin liquid (QSL). However, it is difficult to determine the spin configuration and the corresponding mechanism in this system, because of its geometrical frustration (i.e., crystal structure and symmetry). Herein, we systematically investigate one of the geometrically frustrated magnets, the $TbB_4$ compound. Using resonant soft x-ray scattering (RSXS), we explored its spin configuration, as well as Tb's quadrupole. Comprehensive evaluations of the temperature and photon energy/polarization dependences of the RSXS signals reveal the mechanism of spin reorientation upon cooling down, which is the sophisticated interplay between the Tb spin and the crystal symmetry rather than its orbit (quadrupole). Our results and their implications would further shed a light on the search for possible realization of QSL.