• Proceedings of the KIEE Conference
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• 2003.11c
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• pp.818-822
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• 2003

We propose a software-reliability growth model incoporating the amount of uniform and Weibull testing efforts during the software testing phase in this paper. The time-dependent behavior of testing effort is described by uniform and Weibull curves. Assuming that the error detection rate to the amount of testing effort spent during the testing phase is proportional to the current error content, the model is formulated by a nonhomogeneous Poisson process. Using this model the method of data analysis for software reliability measurement is developed. The optimum release time is determined by considering how the initial reliability R(x|0) would be. The conditions are $R(x|0)>R_o$, $R_o>R(x|0)>R_o^d$ and $R(x|0)<R_o^d$ for uniform testing efforts. Ideal case is $R_o>R(x|0)>R_o^d$. Likewise, it is $R(x|0){\geq}R_o$, $R_o>R(x|0)>R_o^{\frac{1}{g}$ and $R(x\mid0)<R_o^{\frac{1}{g}}$ for Weibull testing efforts. Ideal case is $R_o>R(x|0)>R_o^{\frac{1}{g}}$.

• Journal of Information Technology Application
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• v.3 no.3
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• pp.91-106
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• 2001

We propose a software-reliability growth model incoporating the amount of uniform and Weibull testing efforts during the software testing phase in this paper. The time-dependent behavior of testing effort is described by uniform and Weibull curves. Assuming that the error detection rate to the amount of testing effort spent during the testing phase is proportional to the current error content, the model is formulated by a nonhomogeneous Poisson process. Using this model the method the data analysis for software reliability measurement is developed. The optimum release time is determined by considering how the initial reliability R($\chi$ 0) would be. The conditions are ($R\chi$ 0)＞$R_{o}$ , $P_{o}$ ＞R($\chi$ 0)＞ $R_{o}$ $^{d}$ and R($\chi$ 0)＜$R_{o}$ $^{d}$ for uniform testing efforts. deal case is $P_{o}$ ＞($R\chi$ 0)＞ $R_{o}$ $^{d}$ Likewise, it is ($R\chi$ 0)$\geq$$R_{o}$ , $R_{o}$ ＞($R\chi$ 0)＞R(eqation omitted) and ($R\chi$ 0)＜R(eqation omitted)for Weibull testing efforts. Ideal case is $R_{o}$ ＞ R($\chi$ 0)＞ R(eqation omitted).

• The KIPS Transactions:PartD
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• v.10D no.5
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• pp.837-844
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• 2003

The software reliability have to be improved as one major method to enhance the quality of developed software, and its defect is detected and modified through testing as a direct way to meet the purpose before releasing. Once its reliability grows up to the target and it is released to public. there nay be operational reliability problem. The operational software reliability trend nay be different depending on the condition whether it is universal or dedicated. And its reliability estimation is changed based on the condition if it follows uniform testing efforts or Weibull testing efforts. I study the operational reliability trend of dedicated software, applying two case testing efforts for the released item.

• Journal of Advanced Navigation Technology
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• v.12 no.6
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• pp.681-690
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• 2008

The software reliability have to be improved as one major method to enhance the quality of developed software, and its defect is detected and modified through testing as a direct way to meet the purpose before releasing. Once its reliability grows up to the target and it is released to public. there may be operational reliability problem. The operational software reliability trend may be different depending on the condition whether it is universal or dedicated. And its reliability estimation is changed based on the condition if it follows uniform testing efforts or Weibull testing efforts. I study the operational reliability trend of dedicated software, applying two case testing efforts for the released item.

• The KIPS Transactions:PartD
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• v.8D no.6
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• pp.835-842
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• 2001

We propose a software-reliability growth model incoporating the amount of testing effort expended during the software testing phase. The time-dependent behavior of testing effort expenditures is described by a Weibull curve. Assuming that the error detection rate to the amount of testing effort spent during the testing phase is proportional to the current error content, a software-reliability growth model is formulated by a nonhomogeneous Poisson process. Using this model the method of data analysis for software reliability measurement is developed. After defining a software reliability, we discuss the relations between testing time and reliability and between duration following failure fixing and reliability are studied in this paper. The release time making the testing cost to be minimum is determined through studying the cost for each condition. Also, the release time is determined depending on the conditions of the specified reliability. The optimum release time is determined by simultaneously studying optimum release time issue that determines both the cost related time and the specified reliability related time.

• Journal of Information Technology Applications and Management
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• v.13 no.4
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• pp.1-12
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• 2006

Many software reliability growth models(SRGM) have been proposed since the software reliability issue was raised in 1972. The technology to estimate and grow the reliability of developing S/W to target value during testing phase were developed using them. Most of these propositions assumed the S/W debugging testing efforts be constant or even did not consider them. A few papers were presented as the software reliability evaluation considering the testing effort was important afterwards. The testing effort forms which have been presented by this kind of papers were exponential, Rayleigh, Weibull, or logistic functions, and one of these 4 types was used as a testing effort function depending on the S/W developing circumstances. I propose the methology to evaluate the SRGM using least square estimator and maximum likelihood estimator for those 4 functions, and then examine parameters applying actual data adopted from real field test of developing S/W.

• Proceedings of the Korea Society of Information Technology Applications Conference
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• 2004.06a
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• pp.87-87
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• 2004

• The KIPS Transactions:PartD
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• v.11D no.4
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• pp.885-892
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• 2004

Weibull distribution Iincluding Rayleigh and Exponential distribution is a typical model to estimate the effort distribution which is committed to the software testing phase. This model does not represent standpoint that many efforts are committed actually at the test beginning point. Moreover, it does not properly represent the various distribution form of actual test effort. To solve these problems, this paper proposes the Sigmoid model. The sigmoid function to be applicable in neural network transformed into the function which properly represents the test effort of software in the model. The model was verified to the six test effort data which were got from actual software projects which have various distribution form and verified the suitability. The Sigmoid model nay be selected by the alternative of Weibull model to estimate software test effort because it is superior than the Weibull model.

• Journal of Information Technology Applications and Management
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• v.11 no.2
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• pp.191-204
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• 2004

Many software reliability growth model(SRGM) have been proposed for past several decades. Most of these propositions assumed the S/W debugging testing efforts be constant or even did not consider them. A few papers were presented as the software reliability evaluation considering the testing effort was important afterwards. The testing effort forms which have been presented by this kind of papers were exponential, Rayleigh, Weibull, or Logistic functions, and one of these 4 types was used as a testing effort function depending on the S/W developing circumstances. We consider the methology to evaluate the SRGN using least square estimator(LSE) and maximum likelihood estimator(MLE) for those 4 functions, and then examine parameters applying actual data adopted from real field test of developing S/W.

• Journal of Information Technology Applications and Management
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• v.12 no.2
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• pp.1-13
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• 2005

This paper proposes a software-reliability growth model incoporating the amount of testing effort expended during the software testing phase after developing it. The time-dependent behavior of testing effort expenditures is described by a Logistic curve. Assuming that the error detection rate to the amount of testing effort spent during the testing phase is proportional to the current error content, a software-reliability growth model is formulated by a nonhomogeneous Poisson process. Using this model the method of data analysis for software reliability measurement is developed. After defining a software reliability, This paper discusses the relations between testing time and reliability and between duration following failure fixing and reliability are studied. SRGM in several literatures has used the exponential curve, Railleigh curve or Weibull curve as an amount of testing effort during software testing phase. However, it might not be appropriate to represent the consumption curve for testing effort by one of already proposed curves in some software development environments. Therefore, this paper shows that a logistic testing-effort function can be adequately expressed as a software development/testing effort curve and that it gives a good predictive capability based on real failure data.