• 한국전자파학회논문지
• /
• 제18권10호
• /
• pp.1117-1125
• /
• 2007

본 논문은 스마트카드에서 방사되는 전자파를 이용한 암호 분석용 소형 루프 프로브 설계와 프로브에 유기된 전자파 신호의 분석에 관한 연구이다. 암호 분석용 프로브는 일반적인 전자장 측정용 프로브와는 다르다. 그 이유는 제시된 프로브의 목적은 암호 장비의 비밀 키 해독에 필요한 정보를 얻기 위함이기 때문이다. 스마트카드에서 발생된 파형을 분석하여서 전자파 공격을 시도하기 때문에 프로브에 유기된 전압의 파형과 IC 칩에서 발생된 파형은 가능한 한 서로 동일해야 한다. 그 목적을 위해서 전자파를 이용한 암호 분석, 신호원의 근사 모델링, 암호 분석용 프로브의 특징, 전자파 신호 측정 그리고 프로브의 교정에 대한 검토가 필요하다. 스마트카드 칩의 소비 전력 신호와 제안된 프로브를 이용한 전자파 신호를 측정하고 두 신호를 EMA의 관점에서 비교하였다. ARIA 알고리즘을 적용하여 제안된 비접촉 암호 분석용 프로브의 적합성 여부를 실험적으로 확인하였다.

• 대한전기학회:학술대회논문집
• /
• 대한전기학회 1995년도 추계학술대회 논문집 학회본부
• /
• pp.555-557
• /
• 1995

In near field optics, optical fiber probe is smaller than the wavelength of light. This small probe makes it possible to overcome the diffraction limit due to wave property of light. In conventional optical systems, the image resolution is governed by wavelength. But in NSOM, it is determined by probe tip size and probe shape. Therefore probe tip size and shape are very important points in near field optics. In this paper, we will suggest the new fabrication methods of optical fiber probe and show that the probe tip size is sub-micrometer using SEM.

• 한국표면공학회지
• /
• 제44권1호
• /
• pp.26-31
• /
• 2011

Numerical modeling is used to investigate the perturbation of a single Langmuir probe (0.2 mm diameter shielded with 6 mm insulator) inserted along the center axis of a cylindrical inductively coupled plasma chamber filled with Ar at 10 mTorr and driven by 13 MHz. The probe was driven by a sine wave. When the probe tip is close to a substrate by 24.5 mm, the probe characteristics was unperturbed. At 10 mm above the substrate, the time averaged electric potential distribution around the tip was severly distorted making a normal probe analysis impossible.

• 대한기계학회:학술대회논문집
• /
• 대한기계학회 2003년도 춘계학술대회
• /
• pp.1395-1400
• /
• 2003

This paper introduces a novel scheme for determining the thermal diffusivity of solids using the photothermal mirage technique. The suggested scheme extends the thermal-wave coupling method, employing the solution to the heat conduction equation in close proximity to the pump beam. Therefore, determination of thermal diffusivity is possible by detecting the mirage signal with small separation between the probe and pump beams, with enhanced intensity of the mirage signal. Though the method requires information about the probe-beam height, the absolute transverse position of the probe beam need not be known as it is automatically evaluated by the iterative-computation procedure. The thermal diffusivity of Ni is measured by the proposed scheme and the result demonstrates good agreement with the literature value to within 5 %.

• 한국정밀공학회:학술대회논문집
• /
• 한국정밀공학회 2003년도 춘계학술대회 논문집
• /
• pp.1018-1021
• /
• 2003

A scratch tester was developed to evaluate the adhesive strength at interface between thin film and substrate(silicon wafer). Under force control, the scratch tester can measure the normal and the horizontal forces simultaneously as the probe tip of the equipment approaches to the interface between thin film and substrate of wafer. The capacity of each component of force sensor is 0.1 N ∼ 100 N. In addition, the tester can detect the signal of elastic wave from AE sensor(frequency range of 900 kHz) attached to the probe tip and evaluate the bonding strength of interface. Using the developed scratch tester. the feasibility test was performed to evaluate the adhesive strength of semiconductor wafer.

• 한국진공학회:학술대회논문집
• /
• 한국진공학회 2012년도 제43회 하계 정기 학술대회 초록집
• /
• pp.274-274
• /
• 2012

We have researched on controlling an electron temperature and a plasma collision frequency to study the effect of collisions on helicon plasmas. So, we have designed and constructed an electron cyclotron resonance (ECR) heating system in the helicon device as an auxiliary heating source. Since then, we have tried to optimize experimental designs such as a magnetic field configuration for ECR heating and 2.45GHz microwave launching system for its power transfer to the plasma effectively, and have characterized plasma parameters using a Langmuir probe. For improving an efficiency of the ECR heating with R-wave in the helicon plasma, we would understand an effect of R-wave propagation with ECR heating in the helicon plasma, because the efficiency of ECR heating with R-wave depends on some factors such as electron temperature, electron density, and magnetic field gradient. Firstly, we calculate the effect of R-wave propagation into the ECR zone in the plasma with those factors. We modify the magnetic field configuration and this system for the effective ECR heating in the plasma. Finally, after optimizing this system, the plasma parameters such as electron temperature and electron density are characterized by a RF compensated Langmuir probe.

• 한국전자파학회논문지
• /
• 제21권7호
• /
• pp.831-841
• /
• 2010

일반적으로 수직형 프로브는 가늘고 긴 S-자형 구조가 중복되기 때문에 신호 전달 특성이 저하되므로 이것에 대한 개선이 필요하다. 본 논문에서 제안된 프로브는 캔틸리버형보다 적은 면적을 차지하는 수직형으로 동시에 많은 메모리를 테스트하기에 적합하며, 특히 외부 압력이 가해졌을 때 분기된 스프링에 의해 폐 루프(closed loop)가 형성되어 기존의 S-자형 수직형 프로브보다 기계적 특성뿐만 아니라 전기적 신호 전달 특성이 개선된 새로운 형태의 수직형 프로브를 제안하였다. 제안된 프로브를 제작하여 측정 및 시뮬레이션을 통해 기존의 S-자형 수직형 프로브보다 오버드라이브(overdrive)는 1.2배, 컨택 포스(contact force)는 2.5배, 신호 전달특성은 $0{\sim}10$ GHz에서 최대 1.4 dB 개선되는 것을 확인하였다. 또한 프로브 카드(probe card)의 신호 전달 특성을 예측할 수 있는 시뮬레이션 모델을 개발하였다. 이를 위하여 프로브 카드를 구성하는 각 부품의 기하학적 특성에 맞도록 2.5D 또는 3D Full-wave 시뮬레이터를 사용하였으며, 계산된 결과는 측정 결과와 매우 잘 일치 하였다.

• Journal of Astronomy and Space Sciences
• /
• 제32권3호
• /
• pp.167-180
• /
• 2015

Herein, we discuss the in situ measurement of the electron temperature in the ionosphere/plasmasphere by means of DC Langmuir probes. Major instruments which have been reported are a conventional DC Langmuir probe, whose probe voltage is swept; a pulsed probe, which uses pulsed bias voltage; a rectification probe, which uses sinusoidal signal; and a resonance cone probe, which uses radio wave propagation. The content reviews past observations made with the instruments above. We also discuss technical factors that should be taken into account for reliable measurement, such as problems related to the contamination of electrodes and the satellite surface. Finally, we discuss research topics to be studied in the near future.

• 한국진공학회:학술대회논문집
• /
• 한국진공학회 2012년도 제43회 하계 정기 학술대회 초록집
• /
• pp.148-148
• /
• 2012

A cutoff probe is the novel diagnostic method to get the absolute plasma density with simple system and less assumption. However, high density of ion flux from plasma on probe tip can make the error of plasma density measurement because the dielectric material of probe tip can be damaged by ion flux. We proposed a shielded cutoff probe using the ceramic tube for protection from ion flux. The ceramic tube on probe tip can intercept the ion flux from plasma. The transmitted spectrum using the shielded cutoff probe is good agreement with E/M wave simulation result (CST Microwave Studio) and previous circuit simulation of cutoff probe [1]. From the analysis of the measured transmitted spectrum base on the circuit modeling, the parallel resonance frequency is same as the unshielded cutoff probe case. The obtained results of electron density is presented and discussed in wide range of experimental conditions, together with comparison result with previous cutoff method.

• Journal of Electrical Engineering and Technology
• /
• 제13권1호
• /
• pp.406-412
• /
• 2018

In this paper, we propose a narrow resonant waveguide probe that can improve the measurement sensitivity in near-field scanning microwave microscopy. The probe consists of a metal waveguide incorporating the following two sections: a straight section at the tip of the probe whose cross-section is a double-ridged rectangle, and whose height is much smaller than the waveguide width; and a standard waveguide section. The advantage of the narrow waveguide is the same as that of the quarter-wave transformer section i.e., it achieves impedance-matching between the sample under test (SUT) and the standard waveguide. The design procedure used for the probe is presented in detail and the performance of the designed resonant probe is evaluated theoretically by using an equivalent circuit. The calculated results are compared with those obtained using the finite element method (Ansoft HFSS), and consistency between the results is demonstrated. Furthermore, the performance of the fabricated resonant probe is evaluated experimentally. At X-band frequencies, we have measured the one-dimensional scanning reflection coefficient of the SUT using the probe. The sensitivity of the proposed resonant probe is improved by more than two times as compared to a conventional waveguide cavity type probe.