• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2003.05a
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• pp.61-61
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• 2003

It is important to know SIze distribution of defects In electroplated trivalent chrome layers because it significantly influences on performance of the layers. Most of the nano-scale defects are able to be introduced by hydrogen evolution during the plating. Little information is available on the nano-size defects. In this study, SANS was applied to determine the size distribution of nano-scale defects in the trivalent chrome layers prepared in a formate bath. The defect size and distribution was dependent upon plating conditions such as current density and applied voltage. SANS is one of useful techniques to determine the nano-scale defect in the electroplated layers.

• Journal of the Korean institute of surface engineering
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• v.37 no.3
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• pp.175-178
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• 2004

The size and number of nano-size defects of thin trivalent chrome layers were determined by small angle neutron scattering (SANS) without breaking the thin chrome layers. Most of defect size of the trivalent chromium prepared in this test conditions is in the range of about 40nm. The number of nano-size defects less than about 40nm of the trivalent chromium layer increases with plating voltage at constant current density From this study, SANS is proved as one of useful techniques to evaluate nano-size defects of thin film layer.

• The Transactions of the Korean Institute of Electrical Engineers A
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• v.53 no.12
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• pp.678-684
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• 2004

Automatic reclosing is a typical protection method in power distribution systems for clearing the temporary faults. However, it has a fatal weakness in regards to voltage sags because it produces successive voltage sags. In this paper, we explored successive impact of voltage sag due to the automatic reclosing of power distribution systems. The actual tests of low voltage loads were accomplished for obtaining the susceptibility of voltage sags. The final results of the test yielded power acceptability curves of voltage sag, and the curves were transformed the 3-dimensional CBEMA(Computer Business Equipment Manufacturer Association) format. For the quantitative evaluation of the impact of successive voltage sags, an assessment formulation using the voltage sag contour was proposed. The proposed formulation was tested by using the voltage sag contour data of IEEE standard and the results of the test. Through the case studies, we verified that the proposed method can be effectively used to evaluate the actual impact of successive voltage sans.

• Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
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• v.16 no.1
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• pp.76-84
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• 2002

Voltage sags caused by line faults in transmission and distribution lines have become one of the most important power quality problems facing industrial customers and utilities. Voltage sags are normally described by characteristics of both magnitude and duration, but phase angle shifts should be taken account in identifying sag phenomena and finding their solutions. In this paper, voltage sags due to line faults such as three phase-to-ground, single line-to-ground, and line-to-line faults are characterized by using symmetrical component analysis, for fault impedance variations. Voltage sags and their effect on the magnitude and phase angle are examined. Balanced sags of three phase-to-ground faults show that voltages and currents are changed with equivalent levels to all phases and the zero sequence components become zero. However, for unbalanced faults such as single line-to-ground and line-to-line faults, voltage sags give different magnitude variations and phase angle shifts for each phase. In order to verify the analyzed results, some simulations based on power circuit models are also discussed.