• Title/Summary/Keyword: Voltage sag

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The Analysis of Trolley-Rail Short Circuit Current in a Single Track AT Feeding System (단선 AT 급전계통의 전차선-레일 단락 고장전류 분석)

  • Cho, Gyu-Jung;Ryu, Kyu-Sang;Lee, Hun-Do;Heo, Seung-Hun;Kim, Chul-Hwan;Kwon, Sung-Il;Kim, Cheol-Hwan
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.64 no.12
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    • pp.1659-1665
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    • 2015
  • In general, AT(Auto-transformer) is used to improve voltage sag and inductive interference in power lines and communication lines in AC electrical railway feeding system. Especially, Korean AT feeding system has different composition compared to other countries like Japan or France, so that it has some special characteristics. However, relays imported from other countries have been used in Korea, and settings of these relays should be modified and reflect distinct characteristics of Korean AT feeding system. Therefore, study about fault analysis based on modeled AT feeding system is important. In this paper, we modeled a single track AT feeding system by using PSCAD and analyzed fault current flow in case of trolley-rail short circuit fault. Finally, we presented current magnitude of each branch expressed by boosting current of AT.

Characterization of GaN on GaN LED by HVPE method

  • Jung, Se-Gyo;Jeon, Hunsoo;Lee, Gang Seok;Bae, Seon Min;Kim, Kyoung Hwa;Yi, Sam Nyung;Yang, Min;Ahn, Hyung Soo;Yu, Young Moon;Kim, Suck-Whan;Cheon, Seong Hak;Ha, Hong Ju;Sawaki, Nobuhiko
    • Journal of Ceramic Processing Research
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    • v.13 no.spc1
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    • pp.128-131
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    • 2012
  • The selective area growth light emitting diode on GaN substrate was grown using mixed-source HVPE method with multi-sliding boat system. The GaN substrate was grown using mixed-source HVPE system. Te-doped AlGaN/AlGaN/Mg-doped AlGaN/Mg-doped GaN multi-layers were grown on the GaN substrate. The appearance of epi-layers and the thickness of the DH was evaluated by SEM measurement. The DH metallization was performed by e-beam evaporator. n-type metal and p-type metal were evaporated Ti/Al and Ni/Au, respectively. At the I-V measurement, the turn-on voltage is 3 V and the differential resistance is 13 Ω. It was found that the SAG-LED grown on GaN substrate using mixed-source HVPE method with multi-sliding boat system could be applied for developing high quality LEDs.

The characteristic of InGaN/GaN MQW LED by different diameter in selective area growth method (선택성장영역 크기에 따른 InGaN/GaN 다중양자우물 청색 MOCVD-발광다이오드 소자의 특성)

  • Bae, Seon-Min;Jeon, Hun-Soo;Lee, Gang-Seok;Jung, Se-Gyo;Yoon, Wi-Il;Kim, Kyoung-Hwa;Yang, Min;Yi, Sam-Nyung;Ahn, Hyung-Soo;Kim, Suck-Whan;Yu, Young-Moon;Ha, Hong-Ju
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.22 no.1
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    • pp.5-10
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    • 2012
  • In general, the fabrications of the LEDs with mesa structure are performed grown by MOCVD method. In order to etch and separate each chips, the LEDs are passed the RIE and scribing processes. The RIE process using plasma dry etching occur some problems such as defects, dislocations and the formation of dangling bond in surface result in decline of device characteristic. The SAG method has attracted considerable interest for the growth of high quality GaN epi layer on the sapphire substrate. In this paper, the SAG method was introduced for simplification and fabrication of the high quality epi layer. And we report that the size of selective area do not affect the characteristics of original LED. The diameter of SAG circle patterns were choose as 2500, 1000, 350, and 200 ${\mu}m$. The SAG-LEDs were measured to obtain the device characteristics using by SEM, EL and I-V. The main emission peaks of 2500, 1000, 350, and 200 ${\mu}m$ were 485, 480, 450, and 445 nm respectively. The chips of 350, 200 ${\mu}m$ diameter were observed non-uniform surface and resistance was higher than original LED, however, the chips of 2500, 1000 ${\mu}m$ diameter had uniform surface and current-voltage characteristics were better than small sizes. Therefore, we suggest that the suitable diameter which do not affect the characteristic of original LED is more than 1000 ${\mu}m$.

Performance Evaluations of Four MAF-Based PLL Algorithms for Grid-Synchronization of Three-Phase Grid-Connected PWM Inverters and DGs

  • Han, Yang;Luo, Mingyu;Chen, Changqing;Jiang, Aiting;Zhao, Xin;Guerrero, Josep M.
    • Journal of Power Electronics
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    • v.16 no.5
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    • pp.1904-1917
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    • 2016
  • The moving average filter (MAF) is widely utilized to improve the disturbance rejection capability of phase-locked loops (PLLs). This is of vital significance for the grid-integration and stable operation of power electronic converters to electric power systems. However, the open-loop bandwidth is drastically reduced after incorporating a MAF into the PLL structure, which makes the dynamic response sluggish. To overcome this shortcoming, some new techniques have recently been proposed to improve the transient response of MAF-based PLLs. In this paper, a comprehensive performance comparison of advanced MAF-based PLL algorithms is presented. This comparison includes HPLL, MPLC-PLL, QT1-PLL, and DMAF-PLL. Various disturbances, such as grid voltage sag, voltage flicker, harmonics distortion, phase-angle and frequency jumps, DC offsets and noise, are considered to experimentally test the dynamic performances of these PLL algorithms. Finally, an improved positive sequence extraction method for a HPLL under the frequency jumps scenario is presented to compensate for the steady-state error caused by non-frequency adaptive DSC, and a satisfactory performance has been achieved.

Variable Gain Current Controller Considering Inductance Variations after the Connection of DFIG Stator to the Grid (DFIG 고정자의 계통연계시 인덕턴스 변동을 고려한 가변이득 전류제어기)

  • Shin, Soo-Cheol;Yu, Jae-Sung;Hong, Jung-Ki;Suh, In-Young;Song, Seung-Ho
    • The Transactions of the Korean Institute of Power Electronics
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    • v.14 no.4
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    • pp.293-298
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    • 2009
  • This paper presents a variable gain current control algorithm for the stabilized grid connection between the grid and a doubly fed induction(DFIG) as a wind power generator. The performance of a RSC current controller depends highly on accurate machine parameters, and especially requires a fast and robust response regardless of the disturbances such as voltage sag. However, parameter variations of a DFIG occur at the point of grid connection, which affects the current controller gains based on DFIG parameters after a DFIG is connected to the grid. Thus, performance degrades when actual machine parameters depart from values used in the control system. In the proposed algorithm, current controller gains of the rotor side converter(RSC) are changed after a DFIG is connected to the grid. The simulation results and experimental results for a 750kW are shown to illustrate the feasibility of the proposed algorithm.

Remote field Eddy Current Technique Development for Gap Measurement of Neighboring Tubes of Nuclear Fuel Channel in Pressurized Heavy Water Reactor (중수로 핵연료채널과 인접관의 간격측정을 위한 원거리장 와전류검사 기술개발)

  • Jung, H.K.;Lee, D.H.;Lee, Y.S.;Huh, H;Cheong, Y.M.
    • Journal of the Korean Society for Nondestructive Testing
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    • v.24 no.2
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    • pp.164-170
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    • 2004
  • Liquid Injection Nozzle(LIN) tube and Calandria tube(CT) in pressurized Heavy Water Reactor (PHWR) are .ross-aligned horizontally. These neighboring tubes can contact each other due to the sag of the calandria tube resulting from the irradiation creep and thermal creep, and fuel load, etc. In order to judge the contact which might be the safety concern, the remote field eddy current (RFEC) technology is applied for the gap measurement in this paper. LIN can be detected by inserting the RFEC probe into pressure tube (PT) at the crossing point directly. To obtain the optimal conditions of the RFEC inspection, the sensitivity, penetration and noise signals are considered simultaneously. The optimal frequency and coil spacing are 1kHz and 200mm respectively. Possible noises during LIN signal acquisition are caused by lift-off, PT thickness variation, and gap variation between PT and CT. The simulated noise signals were investigated by the Volume Integral Method(VIM). Signal analysis on the voltage plane describes the amplitude and shape of LIN and possible defects at several frequencies. All the RFEC measurements in the laboratory were done in variance with the CT/LIN gap and showed the relationship between the LIN gap and the signal parameters by analyzing the voltage plane signals.