Determination of Complex Dielectric Functions and Thicknesses of Titanium Dioxide Thin Films by Using Vacuum Ultraviolet Spectroscopic Ellipsometry (진공자외선 분광타원법을 이용한 이산화티타늄 박막의 복소유전율 및 두께 결정)
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- Proceedings of the Optical Society of Korea Conference
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- 2004.02a
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- pp.216-217
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- 2004