• Applied Microscopy
• /
• 제48권4호
• /
• pp.122-125
• /
• 2018

The focused ion beam (FIB) method is widely used to prepare specimens for observation by transmission electron microscopy (TEM), which offers a wide variety of imaging and analytical techniques. TEM has played a significant role in material investigation. However, the FIB method induces amorphization due to bombardment with the high-energy gallium ($Ga^+$) ion beam. To solve this problem, electron beam induced deposition (EBID) is used to form a protective layer to prevent damage to the specimen surface. In this study, we introduce an optimized TEM specimen preparation procedure by comparing the EBID of carbon and tungsten as protective layers in FIB. The selection of appropriate EBID conditions for preparing specimens for TEM analysis is described in detail.

• 대한전자공학회논문지SP
• /
• 제46권3호
• /
• pp.1-9
• /
• 2009

투과전자현미경(transmission electron microscopy)에서 특정 투사각에서 획득한 2차원으로의 투사 영상의 열을 사용하여 세포와 같은 물질의 3차원 구조를 복원한다. 이때 전처리 과정으로 2차원 투사 영상의 정확한 영상 정렬과 밝기 보정이 필요하다. 본 논문에서는 기준점(fiducial marker)을 사용한 정렬 방법을 이용하여 영상열을 정렬하고, 수십 장의 영상들의 상이한 밝기 특성을 일정하게 보정하는 방법을 제시하였다. 영상의 투과율 모델에 근거하여, 영상의 주변부의 밝기 정보를 사용하여 각 영상의 조명을 일정한 값으로 조정하고 투사각에 따라 대상의 밝기가 일정하게 변동하도록 밝기 보정을 수행하는 알고리듬을 제시하였으며, 실제 투과전자현미경으로부터 얻은 영상열을 사용하여 밝기 보정 알고리듬의 성능을 검증하였다.

• 분석과학
• /
• 제5권1호
• /
• pp.121-126
• /
• 1992

GaAs ${\Sigma}=19$, [110] tilt grain boundary의 구조를 투과전자현미경을 이용하여 연구하였다. Higher-Order Laue-Zone(HOLZ) 빔들과 {200} 빔과의 dynamical coupling 결과를 검토하여 입계 양쪽 각각의 입자(grain) 내 Ga-As의 상대적 위치(방향성)를 결정하였으며, 두 입자 사이에는 inversion symmetry가 결합되지 않은 ${\Sigma}=19$ coincidence에 해당하는 교차각이 있었다. 계면은 $\{331\}_A/\{331\}_B$, [110] 결정면을 따라서 발생하는 경향이 강함을 관측했다. 이 facet에서의 원자구조 및 격자이동 등을 고분해 투과전자현미경을 이용하여 밝혔다. 5-, 7-, 그리고 6-member ring의 조합으로 되어 있는 단위를 계면원자구조 model로 제시했다.

• 소성∙가공
• /
• 제33권2호
• /
• pp.118-122
• /
• 2024

Micro-electromechanical systems (MEMS) based in-situ heating holders have been developed to enable high resolution imaging of heat treatment analysis. However, unlike the standard 3 mm metal disk specimens used in the furnace-based heating holder and general transmission electron microscopy holder, the MEMS-based in-situ heating holder requires thin specimens that can be penetrated by electrons to be transferred onto the MEMS chip. Previously, focused ion beam milling was used to transfer metal specimens, but it has the disadvantage of being expensive and the risk of specimen damage due to gallium ions. Therefore, in this study, we devised a method of transferring metallic materials by ultrasonic treatment using a transmission electron microscopy specimen made by electro jet polishing. A 3mm electropolished metal disk was placed in an appropriate solution, ultrasonicated, and then drop casted. The transfer of the specimen was successful, but it was confirmed that dislocations were formed inside the specimen due to ultrasonic treatment. This study provides a novel method for transferring metallic materials onto MEMS chips, which is cost-effective and less gallium ion damaging to the specimen. The results of this study can be used to improve the efficiency of heat treatment analysis using MEMS-based in-situ heating holders.

• 한국분말재료학회지
• /
• 제24권4호
• /
• pp.285-291
• /
• 2017

We propose a custom analysis technique for the dark field (DF) image based on transmission electron microscopy (TEM). The custom analysis technique is developed based on the $DigitalMicrograph^{(R)}$ (DM) script language embedded in the Gatan digital microscopy software, which is used as the operational software for most TEM instruments. The developed software automatically scans an electron beam across a TEM sample and records a series of electron diffraction patterns. The recorded electron diffraction patterns provide DF and ADF images based on digital image processing. An experimental electron diffraction pattern is recorded from a IrMn polycrystal consisting of fine nanograins in order to test the proposed software. We demonstrate that the developed image processing technique well resolves nanograins of ~ 5 nm in diameter.

• Applied Microscopy
• /
• 제46권2호
• /
• pp.100-104
• /
• 2016

Electron microscopy is currently the only available technique with a spatial resolution sufficient to identify fine neuronal processes and synaptic structures in densely packed neuropil. For large-scale volume reconstruction of neuronal connectivity, serial block-face scanning electron microscopy allows us to acquire thousands of serial images in an automated fashion and reconstruct neural circuits faster by reducing the alignment task. Here we introduce the whole reconstruction procedure of synaptic network in the rat hippocampal CA1 area and discuss technical issues to be resolved for improving image quality and segmentation. Compared to the serial section transmission electron microscopy, serial block-face scanning electron microscopy produced much reliable three-dimensional data sets and accelerated reconstruction by reducing the need of alignment and distortion adjustment. This approach will generate invaluable information on organizational features of our connectomes as well as diverse neurological disorders caused by synaptic impairments.

• Applied Microscopy
• /
• 제36권spc1호
• /
• pp.63-69
• /
• 2006

By utilizing a field emission gun and a biprism installed on a transmission electron microscope (TEM), electron holography is extensively carried out to visualize the electric and magnetic fields of nanomaterials. In the electric field analysis, the distribution of electric potential in a sharp tip made of W coated with $ZrO_2$ is visualized by applying the voltage to the tip. Denser contour lines due to the electric potential are observed with an increase in the bias voltage. In the magnetic field analysis by producing the strong magnetic field with a sharp magnetic needle made of a permanent magnet, the in situ experiment is carried out to investigate the magnetization of hard magnetic materials. The results of these experiments clearly demonstrate that electron holography is a promising advanced transmission electron microscopy technique to characterize the electric and magnetic properties of nanomaterials.

• 열처리공학회지
• /
• 제4권3호
• /
• pp.21-30
• /
• 1991

Microstructural analysis was conducted to observe the effect of aging treatments in a Cr-Mn austenitic stainless steel containing nitrogen, and the amount, size, shape and distribution of precipitates were investigated. It was found that on water quenching from $1000^{\circ}C$ after holding 3 h at that temperature, the steel contained no precipitates observable by optical microscopy. Precipitation of phases begins at places most favorable for the formation of nuclei-in the boundaries of grains and twins. Precipitates were studied in detail by means of scanning electron microscopy (SEM) and transmission electron microscopy (TEM). Chemical compositions of precipitates were examined by the use of scanning transmission electron microscopy (STEM) together with an energy dispersive X-ray (EDX) microanalysis. Also chromium depletion adjacent to grain boundary precipitates was investigated by the use of Auger electron spectroscopy (AES) for a direct examination of the fracture surface chemistry.

• 한국세라믹학회지
• /
• 제26권2호
• /
• pp.276-288
• /
• 1989

Interpretation of high-resolution transmission electron microscopy images of defects and complex structures such as found in ceramics generally requires matching of the images with compound image simulations for reliable interpretation. A transmission electron microscopy study of the aluminum oxide was carried out at high-resolution, so that the crystal structure of the aluminum oxide could be modelled on an atomic level. In conjunction with computer simulation comparisons, the images reveal directly the atomic structure of the oxide. Results show that comparison between experimental high-resolution electron microscopy images and simulated images leads to a one to one correspondence of the image to the atomic model of the aluminum oxide. The aluminum atoms are disordered in the octahedral sites and the tetrahedral sites in the spinel aluminum oxide.

• Applied Microscopy
• /
• 제52권
• /
• pp.2.1-2.6
• /
• 2022

With the lightening of the mobile devices, thinning of electrolytic copper foil, which is mainly used as an anode collection of lithium secondary batteries, is needed. As the copper foil becomes ultrathin, mechanical properties such as deterioration of elongation rate and tear phenomenon are occurring, which is closely related to microstructure. However, there is a problem that it is not easy to prepare and observe specimens in the analysis of the microstructure of ultrathin copper foil. In this study, electron backscatter diffraction (EBSD) specimens were fabricated using only mechanical polishing to analyze the microstructure of 8 ㎛ thick electrolytic copper foil in plane view. In addition, EBSD maps and transmission electron microscopy (TEM) images were compared and analyzed to find the optimal cleanup technique for properly correcting errors in EBSD maps.