• Journal of IKEEE
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• v.20 no.3
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• pp.251-259
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• 2016

This paper describes that how to enhance the robustness of semiconductor TRM(Transmitter and Receiver Module) through the bias sequencing and tuning the switching time. Previous circuit designs focused on improving the MDS(Minimum Detection Signal) performance. Because TRM has critical problem which transmission output signal leak into receiver by it's compact design. Under this condition, TRM was frequently broken down within the MTBF(Mean Time Between Failure). This study proposes the bias sequencing and tuning the switching time to improve above problem. At first, we collected major failure symptom and infer it's cause. Second, we demonstrated it's effect by derive the improvement method and apply it to our system. And finally we can convinced that the proposed method clear the frequent failure problem with its lack of isolation.