• 제목/요약/키워드: Time-truncated type II censoring

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Comparisons of Acceptance Sampling Plans for the Exponential Lifetime Distribution

  • Jeong, Hyun-Seok;Yum, Bong-Jin
    • Journal of the Korean Statistical Society
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    • 제23권2호
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    • pp.421-444
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    • 1994
  • Reliability acceptance sampling is concerned with whether to accept or reject a collection of items based upon the information obtained from life testing. Although various reliability acceptance sampling plans have been developed, little is known about their relatvie performances. This paper compares reliability acceptance sampling plans under Type II censoring, Hybrid censoring, and Time-Truncated Type II censoring assuming that the lifetimes of items in a lot follow an exponential distribution. The three plans are compared in terms of the power, the expected number of failures, and the expected time required to reach a decision. Computational experiments are conducted and the results are tabulated to provide guidelines for selecting an appropriate plan for a given situation.

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Optimum failure-censored step-stress partially accelerated life test for the truncated logistic life distribution

  • Srivastava, P.W.;Mittal, N.
    • International Journal of Reliability and Applications
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    • 제13권1호
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    • pp.19-35
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    • 2012
  • This paper presents an optimum design of step-stress partially accelerated life test (PALT) plan which allows the test condition to be changed from use to accelerated condition on the occurrence of fixed number of failures. Various life distribution models such as exponential, Weibull, log-logistic, Burr type-Xii, etc have been used in the literature to analyze the PALT data. The need of different life distribution models is necessitated as in the presence of a limited source of data as typically occurs with modern devices having high reliability, the use of correct life distribution model helps in preventing the choice of unnecessary and expensive planned replacements. Truncated distributions arise when sample selection is not possible in some sub-region of sample space. In this paper it is assumed that the lifetimes of the items follow Truncated Logistic distribution truncated at point zero since time to failure of an item cannot be negative. Optimum step-stress PALT plan that finds the optimal proportion of units failed at normal use condition is determined by using the D-optimality criterion. The method developed has been explained using a numerical example. Sensitivity analysis and comparative study have also been carried out.

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