• 조명전기설비학회논문지
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• 제29권4호
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• pp.95-101
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• 2015

This paper presents experimental results about characteristics of soil discharge as a function of moisture content when the $1.2/50{\mu}s$ lightning impulse voltage is applied. The laboratory experiments, for this study, were carried out based on factors affecting the transient behavior in soils. The electrical breakdown in soils was measured over a 0-6% range of moisture content for sands and a 0-4% range of moisture content for gravels. Needle-plane electrode systems was used As a result, the conduction current prior to ionization growth in dry soil is a little, but it in wet soil is increased with the applied voltage because the wet soil particles act as conductors. The soil impedance curves show an abrupt reduction just after breakdown. The general tendency measured in different soils is that the higher the water content, the lower the breakdown voltage and the shorter the time-lag to breakdown.

• Journal of Electrical Engineering and Technology
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• 제9권3호
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• pp.957-963
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• 2014

Converter transformers play important roles in high-voltage direct current transmission systems. This paper presents experimental and analysis results of the combined electrical and thermal aging of oil-impregnated paper at pulsating DC voltages. Breakdown voltages and time-to-breakdown of oil-paper specimens were measured by using short-time and constant-stress tests. The breakdown characteristics of combined electrical and thermal aging on insulation system were discussed. According to the relationship between failure time and aging temperature, the two-parameter Weibull model was improved. On the basis of the competing risk algorithm and the improved Weibull model, the two factors failure model was calculated. And the influence of temperature in the insulation system has been analyzed. This model performs better than the two-parameter Weibull model when both time and temperature are considered as variables in estimating the lifetime of oil-paper insulation.

• 한국재료학회지
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• 제21권9호
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• pp.477-481
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• 2011

Composites of insulating polyethylene and carbon black are widely used in switching elements, conductive paint, and other applications due to the large gap of resistance value. This research addresses the critical exponent of dielectric breakdown strength of polymer matrix composites (PMC) made with carbon black and polyethylene below the percolation threshold (Pt) for the first time. Here, Pt means the volume fraction of carbon black of which the resistance of the PMC is transferred from its sharp decrease to gradual decrease in accordance with the increase of carbon-black-filled content. First, the Pt is determined based on the critical exponents of resistivity and relative permittivity. Although huge cohesive bodies of carbon black are formed in case of being less than the Pt, a percolation path connecting the conducting phases is not formed. The dielectric breakdown strength (Dbs) of the PMC below Pt is measured by using an impulse voltage in the range from 10 kV to 40 kV to avoid the effect of joule heating. Although the observed Dbs data seems to be well fitted to a straight line with a slope of 0.9 on a double logarithm of (Pt-$V_{CB}$) and Dbs, the least squares method gives a slope of 0.97 for the PMC. It has been found that finite carbon-black clusters play an important role in dielectric breakdown.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 1992년도 추계학술대회 논문집
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• pp.11-13
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• 1992

The dielectric reliability of the Thin $SiO_2$ films of wet oxidation on n-type Si substrates has been studied by using self-healing method of breakdown and according to injection time high frequence C-V tests. These experiments have been performed to investigate the dielectric breakdown mechanism of a thin film in which positive charge generation during high-field Fowler-Nordheim tunneling are considered. In addition, The weak spots and robust areas are distinguished so that the localized dielectric breakdown could be described.

• 한국정보전자통신기술학회논문지
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• 제16권4호
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• pp.173-179
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• 2023

본 논문에서는 4세대 VNAND 공정으로 만들어진 Peri 소자의 스트레스 영역 별 time-dependent dielectric breakdown(TDDB) 열화 메커니즘을 분석하고, 기존의 수명 예측 모델보다 더 넓은 신뢰성 평가 영역에서 신속성과 정확성을 향상시킬 수 있는 수명 예측 보완 모델을 제시하였다. SiON 절연층 nMOSFET에서 5개의 Vstr 조건에 대해 각 10번의 constant voltage stress(CVS) 측정 후, stress-induced leakage current(SILC) 분석을 통해 저전계 영역에서의 전계 기반 열화 메커니즘과 고전계 영역에서의 전류 기반 열화 메커니즘이 주요함을 확인하였다. 이후 Weibull 분포로부터 time-to-failure(TF)를 추출하여 기존의 E-모델과 1/E-모델의 수명 예측 한계점을 확인하였고, 각 모델의 결합 분리 열화 상수(k)를 추출 및 결합하여 전계 및 전류 기반의 열화 메커니즘을 모두 포함하는 병렬식 상호보완 모델을 제시하였다. 최종적으로 실측한 TDDB 데이터의 수명을 예측할 시, 기존의 E-모델과 1/E-모델에 비해 넓은 전계 영역에서 각 메커니즘을 모두 반영하여 높은 스트레스에서 신속한 신뢰성 평가로 더 정확한 수명을 예측할 수 있음을 확인하였다.

• 한국정보전자통신기술학회논문지
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• 제10권6호
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• pp.558-569
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• 2017

본 논문에서는 MCU 내장형 1.5V 단일전원 256Kb EEPROM IP는 배터리 응용을 위해 설계되었다. 기존의 body-potential 바이어싱 회로를 사용하는 cross-coupled VPP (Boosted Voltage) 전하펌프회로는 erase와 program 모드에서 빠져나올 때 5V cross-coupled PMOS 소자에 8.53V의 고전압이 걸리면서 junction breakdown이나 gate oxide breakdown에 의해 소자가 파괴될 수 있다. 그래서 본 논문에서는 cross-coupled 전하펌프회로의 출력 노드는 VDD로 프리차징시키는 동시에 펌핑 노드들을 각 펌핑 단의 입력전압으로 프리차징하므로 5V PMOS 소자에 5.5V 이상의 고전압이 걸리지 않도록 하므로 breakdown이 일어나는 것을 방지하였다. 한편 256Kb을 erase하거나 program하는 시간을 줄이기 위해 all erase, even program, odd program과 all program 모드를 지원하고 있다. 또한 cell disturb 테스트 시간을 줄이기 위해 cell disturb 테스트 모드를 이용하여 256Kb EEPROM 셀의 disturb를 한꺼번에 인가하므로 disturb 테스트 시간을 줄였다. 마지막으로 이 논문에서는 erase-verify-read 모드에서 40ns의 cycle 시간을 만족하기 위해 CG disable 시간이 빠른 CG 구동회로는 새롭게 제안되었다.

• 대한전기학회:학술대회논문집
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• 대한전기학회 1989년도 하계종합학술대회 논문집
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• pp.302-305
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• 1989

Ac, dc and impulse dielectric strengths of $LN_2$ at 0.1MPa were investigated experimentally, referring to the behavior of thermally induced bubble, which might be generated at quenching condition of immerged-cooling superconducting devices. The experimental results show that the bubble shape under electric field stress depends significantly on the applied voltage waveform. With ac voltage, the breakdown voltage of $LN_2$ falls suddenly near to one of the saturated gas at the threshold heater power of boiling onset. In control to this, the reduction of impulse breakdown voltage with heater peter is gradual and the time to breakdown depends on the existence of thermal bubble. These breakdown characteristics can be explained satisfactorily by the bubble behavior under electric fields.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2000년도 하계학술대회 논문집
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• pp.699-702
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• 2000

Today, electrical machine is being large capacitor and EHV(Extra High Voltage) of power equipment is a need of high reliability of insulating matetials. Therefore, it is a need of fixed appraisement of lifetime to used data of breakdown. This paper studied a development of the program for estimation the lifetime of insullating materials and the long-time breakdown voltage by experimentation. The estimation program is based on the "Inverse Power Law", defined V$\^$n/t is constant. After gaining the life exponent n, it is mapping the long-time breakdown voltages. On the base of life exponent, the estimation of lifetime and usefulness of the insulation systems are possible, furthermore easy calculation is possible.

• 한국전기전자재료학회논문지
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• 제19권12호
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• pp.1073-1077
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• 2006

Proton irradiation technology was used for improvement of switching characteristics of the PT-IGBT. Proton irradiation was carried out at 5.56 MeV energy with $1{\times}10^{12}/cm^2$ doze from the back side of the wafer. The I-V, breakdown voltage, and turn-off delay time of the device were analyzed and compared with those of un-irradiated device and e-beam irradiated device which was conventional method for minority carrier lifetime reduction. For proton irradiated device, the breakdown voltage and the on-state voltage were 733 V and 1.85 V which were originally 749 V and 1.25 V, respectively. The turn-off time has been reduced to 170 ns, which was originally $6{\mu}s$ for the un-irradiated device. The proton irradiated device was superior to e-beam irradiated device for the breakdown voltage and the on-state voltage which were 698 V and 1.95 V, respectively, nevertheless turn-off time of proton irradiated device was reduced to about 60 % compared to that of the e-beam irradiated device.

• Journal of Electrical Engineering and Technology
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• 제7권4호
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• pp.601-605
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• 2012

Insulated Gate Bipolar Transistors(IGBTs) have received wide attention because of their high current conduction and good switching characteristics. To reduce the power loss of IGBT, the onstate voltage drop should be lowered and the switching time should be shortened. However, there is trade-off between the breakdown voltage and the on-state voltage drop. The FLoatingIsland(FLI) structure can lower the on-state voltage drop without reducing breakdown voltage. In this paper, The FLI IGBT shows an on-state voltage drop that is 22.5% lower than the conventional IGBT, even though the breakdown voltages of each IGBT are almost identical.