• Title/Summary/Keyword: Tightened Critical Value

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TIGHTENED CRITICAL VALUE DEGRADATION TEST

  • Jang, J.S.;Jang, S.J.;Park, B.H.;Lim, H.K.
    • Proceedings of the Korean Reliability Society Conference
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    • 2004.07a
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    • pp.193-200
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    • 2004
  • Determination of sample sizes and the inspection intervals for degradation tests is considered. The cases of degradation rate model and degradation path model are analyzed with some examples. Tightened critical value tests are also considered that are shown to be advantageous over non-tightened ones.

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Design of Degradation Test without Replacement Based on Tightened Critical Value (엄격한 고장판정기준을 적용한 비복원 열화시험 설계에 관한 연구)

  • Park Boo Hee;Lim Ho Kyung;Jang Joong Soon
    • Journal of Applied Reliability
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    • v.5 no.1
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    • pp.167-180
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    • 2005
  • Design of a degradation test without replacement is considered based on tightened critical value to reduce the evaluation testing time. The sample size, number of inspections, and the critical values are determined to assure the same probability of acceptance when the testing time is reduced to some degree. Photo-diode balance of an optical pickup is analyzed as a case study.

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Design of Accelerated Degradation Test with Tightened Critical Values under Random Coefficient Degradation Rate Model (확률계수 열화율 모형하에서 판정가속을 도입한 가속열화시험의 설계)

  • Cho, You-hee;Seo, Sun-keun
    • Journal of Korean Institute of Industrial Engineers
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    • v.34 no.1
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    • pp.23-31
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    • 2008
  • This paper presents accelerated degradation test plans considering adoption of tightened critical values. Under arandom coefficient degradation rate and log-linear acceleration models, the asymptotic variance of an estimatorfor a lifetime quantile at the use condition as the optimization criterion is derived where the degradation ratefollows a lognormal and Reciprocal Weibull distributions, respectively and then the low stress level andproportions ofunits allocated to each stress level are determined. We also show that the developed test plans canbe applied to the multiplicative model with measurement error.

Design of Reliability Qualification Test Based on Performance Distribution at the Earlier Stage (초기 단계의 성능분포를 활용한 신뢰성 인증시험의 설계)

  • Jeong, Hai-Sung
    • Journal of Applied Reliability
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    • v.12 no.3
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    • pp.131-138
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    • 2012
  • A design of reliability qualification test based on performance distribution is developed. In general, the performance of an item degrades as the time goes by and the failure of an item occurs when the performance degradation reaches the pre-determined critical level. This article considers the reliability qualification test based on a more tightened critical value at the earlier stage to reduce the evaluation testing time and cost. A numerical example is provided to illustrate how to use the developed reliability qualification test.