• JSTS:Journal of Semiconductor Technology and Science
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• 제1권1호
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• pp.70-83
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• 2001

In this paper, the recent progress of RF MEMS research for wireless/mobile communications is reviewed. The RF MEMS components reviewed in this paper include RF MEMS switches, tunable capacitors, high Q inductors, and thin film bulk acoustic resonators (TFBARs) to become core components for constructing miniaturized on chip RF transceiver with multi-band and multi-mode operation. Specific applications are also discussed for each of these components with emphasis on for miniaturization, integration, and performance enhancement of existing and future wireless transceiver developments.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2003년도 하계학술대회 논문집 C
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• pp.1523-1525
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• 2003

Due to the rapid development of wireless networking system, researches on the communication devices are mainly focus on microwave frequency devices such as filters, resonators, and phase shifters. Among them, Film bulk acoustic resonator (FBAR) has been paid extensive attentions for their high performance. In this research, ZnO thin films were deposited by RF-magnetron sputtering on Al/$SiO_2$/Si wafer and then crystalline properties and surface morphology were examined. To measure crystalline structure and surface morphology X-ray diffraction (XRD) and Scanning Electron Microscope (SEM) were employed. It was showed that crystalline properties of ZnO thin films were strongly dependant on the deposition conditions. As increasing the deposition temperature and the deposition pressures, the peak intensities of ZnO(002) plane were increased until $300^{\circ}C$, then decreased rapidly. At the sputtering conditions of RF power of 213 W and working pressure of 15 m Torr, ZnO film had excellent c-axis orientation, surface morphology, and adhesion to the substrate. In conclusion we optimized smooth surface with very small grains as well as highly c-axis oriented ZnO film for FBAR applications.

• 한국세라믹학회지
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• 제40권3호
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• pp.268-272
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• 2003

직류 마그네트론 스퍼터링법을 이용하여 증착압력과 기판온도변화에 따른 텅스텐 박막의 미세구조 변화에 대하여 연구하였다. 기판온도 40$0^{\circ}C$에서 증착 압력의 감소에 따라 텅스텐 박막의 미세구조가 zone I에서 zone T로 변화하였다. 텅스텐 박막의 미세구조 비저항과 결정배향성은 상관관계를 보였으며. 미세구조가 zone T 영역에서 낮은 비저항(10$\times$$10^{-6}$ $\Omega$-cm) 과 99%의 (110)면 우선 배향성을 나타내었다. zone T 영역에 해당하는 미세구조를 지니는 텅스텐 박막을 이용한 박막형 공진기는 텅스텐 박막의 높은 탄성저항과 매끈한 표면으로 인해 494의 $Q_{s}$와 5.50%의 $K_{eff}$$^{2}$ 값의 우수한 공진특성을 보였다....