• Journal of the Korean Society of Safety
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• v.9 no.3
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• pp.22-27
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• 1994

For the $\beta$=1 specimen with constant thickness, Crack growth rate is smoothly increasing in the a-N curve. On the other hand for $\beta$=2 specimen with various thickness, the inflection point is observed in crack growth rate near the thickness interface. da/dN before the inflection point is increased, and da/dN after the point is decreased, compared to the $\beta$=1 specimen. da/dN near the thickness interface is approached zero. The descending point was observed earlier as $\beta$ increased. Considering the relation between da/dN and λ, the crack propagation rates for the case of $\beta$ =1 incrased almost linearly, however, the crack propagation rates for $\beta$=2,3 decreased more rapidly near the thickness interface. Additionally, the decreased point in da/dN for $\beta$=3 is farther from the thickness interface than the case for $\beta$ =2.

• Coupled systems mechanics
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• v.5 no.2
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• pp.127-144
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• 2016

Two dimensional numerical investigations were carried out to study the influence of interface thickness and their pattern on the behavior of reinforced concrete frames subjected to in-plane lateral loads using commercial finite element tool SAP 2000. The linear elastic analysis was carried out on one and two bay structural systems as well as the influence of number of stories was studied by varying the number of stories as single, three and five. The cement mortar was used as interface material and their effect was studied by varying thicknesses as 6, 8, 10, 14 and 20 mm. The interface was recognized as one sided, two sided, three sided and four sided and their effect was studied by removing the interface material between the reinforced concrete frame and masonry infill. The effect of lateral loads on infill masonry wall was also studied by varying assumed loads as 10, 20, 30, 40, 50 and 60 kN. The behavior of infilled frames studied has revealed that there is a maximum influence of interface thickness and interface pattern corresponding to 10 mm thickness. In general, the lateral displacement of frame is increased linearly with increase in lateral loads.

• Korean Journal of Materials Research
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• v.16 no.2
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• pp.92-98
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• 2006

Molecular dynamics simulations were performed to study interface structures between an $Al_2O_3$ crystalline phase and a interface phase of $CaAl_2Si_2O_8$. We calculated atomic structures and excess interface energies in systems with different thicknesses of the interface film. It was found that excess interface energies at first readily decreased with increasing film thickness, but increased for larger thicknesses of more than 2 nm. The excess energies of $Al_2O_3/CaAl_2Si_2O_8$ interfaces exhibit a minimum at a thickness around 1 nm. In this range of film thicknesses, the atoms in the interface film show a short-range ordered structure and slow diffusion rather than the random structure and rapid diffusion expected to an observation of an equilibrium thickness for interface films in ceramics.

• Proceedings of the KSME Conference
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• 2004.11a
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• pp.1086-1091
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• 2004

The boundary layer is a very important characteristic of a liquid-vapor interface since it governs the heat and mass transfer phenomena across an interface. However, the thickness of a boundary layer is generally micro- or nano-sized, which requires highly accurate measurement devices and, consequently, costs the related experiments very high and time-consuming. Due to these size dependent limitations, the experiments related with a nano-scaled size have suffered from the errors and the reliability of the obtained data. This study is performed to grasp the characteristics of a liquid-vapor interface, by using a molecular dynamics method. The simulation results were compared with other studies if possible. Although other studies reported that there existed a temperature discontinuity over an interface when the system was reduced to micro- or nano-sized, we confirmed that there was no such a temperature discontinuity.

• Journal of Magnetics
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• v.17 no.4
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• pp.245-250
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• 2012

Ferromagnetic resonance and X-ray specular reflectivity measurements were performed on $Ni_{81}Fe_{19}/Ir_{20}Mn_{80}/Co_{90}Fe_{10}$ exchange bias trilayers, which were grown using the pulsed-DC magnetron sputtering technique on Si(100)/$SiO_2$(1000 nm) substrates, to investigate the evolution of the interface roughness and exchange bias and their dependence on the NiFe layer thickness. The interface roughness values of the samples decrease with increasing NiFe thickness. The in-plane ferromagnetic resonance measurements indicate that the exchange bias field and the peak-to-peak line widths of the resonance curves are inversely proportional to the NiFe thickness. Furthermore, both the exchange bias field and the interface roughness show almost the same dependence on the NiFe layer thickness. The out-of plane angular dependent measurements indicate that the exchange bias arises predominantly from a variation of exchange anisotropy due to changes in interfacial structure. The correlation between the exchange bias and the interface roughness is discussed.

• Structural Engineering and Mechanics
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• v.64 no.1
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• pp.71-79
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• 2017

In this study, interaction of several interface cracks located between a functionally graded material (FGM) layer and an elastic layer under anti-plane deformation based on the distributed dislocation technique (DDT) is analyzed. The variation of the shear modulus of the functionally graded coating is modeled by an exponential and linear function along the thickness of the layer. The complex Fourier transform is applied to governing equation to derive a system of singular integral equations with Cauchy type kernel. These equations are solved by a numerical method to obtain the stress intensity factors (SIFs) at the crack tips. The effects of non-homogeneity parameters for exponentially and linearly form of shear modulus, the thickness of the layers and the length of crack on the SIFs for several interface cracks are investigated. The results reveal that the magnitude of SIFs decrease with increasing of FG parameter and thickness of FGM layer. The values of SIFs for FGM layer with exponential form is less than the linear form.

• Journal of computational fluids engineering
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• v.12 no.4
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• pp.20-27
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• 2007

Two-dimensional stagnation flow toward a plane wall coated with magnetic fluid of uniform thickness is investigated. The flow field is represented as a similarity solution of the Navier-Stokes equation for this incompressible laminar flow. The resulting third order ordinary differential equation is solved numerically by using the shooting method and by determining two shooting parameters so as to satisfy the boundary and interface conditions. Features of the flow including streamline patterns are investigated for the varying values of density ratio, viscosity ratio, and Reynolds number. An adverse flow with double eddy pair in magnetic fluid region is found to emerge as the Reynolds number becomes higher than a threshold value. The results for the interface velocity, interface and wall shear stress, and boundary layer and displacement thickness are also presented.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 1997.04a
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• pp.123-127
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• 1997

Recently, it is gradually raised necessity that interface is measured accurately and managed in industrial circles and medical world, An Ultrasonic wave transmitted from a focused beam transducer is being expected as a powerful tool for NDE of micro-defect. The ultrasonic NDE of the defect is based on the form of the wave reflected form the interface In this study, regarding to the thickness of film which is in opaque object and thickness measurement was done by MEM-cepstrum analysis of received ultrasonic wave. In measument results, film thickness which is beyond distance resolution capacity was measured accurately. Also, automatically repeated discrimination analysis method can be decided in the category of all kinds of defects on semiconductor package.

• Restorative Dentistry and Endodontics
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• v.47 no.1
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• pp.2.1-2.11
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• 2022

Objectives: This study investigated the impact of micro-computed tomography (micro-CT)-based voxel size on the analysis of material/dentin interface voids and thickness of different endodontic cements. Materials and Methods: Following root-end resection and apical preparation, maxillary premolars were filled with mineral trioxide aggregate (MTA), Biodentine, and intermediate restorative material (IRM) (n = 24). The samples were scanned using micro-CT (SkyScan 1272; Bruker) and the cement/dentin interface and thickness of materials were evaluated at voxel sizes of 5, 10, and 20 ㎛. Analysis of variance and the Tukey test were conducted, and the degree of agreement between different voxel sizes was evaluated using the Bland and Altman method (p < 0.05). Results: All materials showed an increase in thickness from 5 to 10 and 20 ㎛ (p < 0.05). When evaluating the interface voids, materials were similar at 5 ㎛ (p > 0.05), while at 10 and 20 ㎛ Biodentine showed the lowest percentage of voids (p < 0.05). A decrease in the interface voids was observed for MTA and IRM at 20 ㎛, while Biodentine showed differences among all voxel sizes (p < 0.05). The Bland-Altman plots for comparisons among voxel sizes showed the largest deviations when comparing images between 5 and 20 ㎛. Conclusions: Voxel size had an impact on the micro-CT evaluation of thickness and interface voids of endodontic materials. All cements exhibited an increase in thickness and a decrease in the void percentage as the voxel size increased, especially when evaluating images at 20 ㎛.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.22 no.5
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• pp.377-381
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• 2009

Tetragonal-NiSi (010)/Si superstructures were calculated for studying the interface structure using density functional theory, The orthorhombic-NiSi was changed to the tetragonal-NiSi to be matched with the Si surface for epitaxy interface. The eight interface models were produced by the type of the Si surfaces, The tetragonal-NiSi (010)/Si (020)[00-1] superstructure was energetically the most favorable, and the interface thickness of this superstructure was the shortest among the tetragonal-NiSi (010)/Si superstructures. However, in the case of tetragonal-NiSi (010)/Si (010)[00-1] superstructure, it was energetically the most unfavorable, and the interface thickness was the longest. The energies and interface thicknesses of tetragonal-NiSi (010)/Si superstructures were influenced by the coordination number of Ni atoms and the bond length between atoms located at the interface.