• 터널과지하공간
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• 제12권3호
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• pp.142-151
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• 2002

대전 식품냉동저장창고 파일럿 공동주위의 거리에 따른 비정상상태의 온도 분포를 산정하기 위해 Claesson(2001)의 해석해 및 Dirichlet과 Neuman 내부 경계조건을 갖는 수치모델들을 검토하였다. 온도 강하 단계동안 일정 표면 온도 경계조건에 기초하고 있는 Claesson의 해석해를 활용한 결과, 실제 암반에서의 온도 계측결과를 오차 평균 0.89$^{\circ}C$ 수준으로서 비교적 정확히 예측할 수 있었는데, $0^{\circ}C$근처의 실험실 암석 열물성을 입력하였고 현지 암반 조건을 표현하기 위한 특별한 물성 보정을 하지 않았다. 내부 공동 암반 벽면을 통한 열유속을 갖는 수치해석의 경우, 대류 열전달계수와 공동 내부 온도가 냉각시간에 따라 변화하기 때문에 경계조건을 가하기 어려운 단점을 극복하기 위해 새로운 경계조건 설정 기법을 제안하였다. 그 결과 오차 평균 1.58$^{\circ}C$의 수준으로서 온도 계측치와 부합하였다. 또한 공동 벽면에서 고정 온도 조건을 갖는 수치해와 비교하였다. 마지막으로 Claesson의 해석해 및 다양한 내부 경계조건을 갖는 수치모델을 활용하여, 공동 주변의 온도 분포를 정확히 예측할 수 있는 일련의 해석 단계 프로그램을 제안하였다.

• 천문학회보
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• 제41권2호
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• pp.64.3-65
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• 2016

The NISS (Near-infrared Imaging Spectrometer for Star formation history) is the near-infrared instrument optimized to the Next Generation of small satellite series (NEXTSat). The capability of both imaging and low spectral resolution spectroscopy in the near-infrared range is a unique function of the NISS. The major scientific mission is to study the cosmic star formation history in local and distant universe. For those purposes, the main observational targets are nearby galaxies, galaxy clusters, star-forming regions and low background regions. The off-axis optical design is optimized to have a wide field of view ($2deg.{\times}2deg.$) as well as the wide wavelength range from 0.95 to $3.8{\mu}m$. Two linear variable filters are used to realize the imaging spectroscopy with the spectral resolution of ~20. The mechanical structure is considered to endure the launching condition as well as the space environment. The compact dewar is confirmed to operate the infrared detector as well as filters at 80K stage. The electronics is tested to obtain and process the signal from infrared sensor and to communicate with the satellite. After the test and calibration of the engineering qualification model (EQM), the flight model of the NSS is assembled and integrated into the satellite. To verify operations of the satellite in space, the space environment tests such as the vibration, shock and thermal-vacuum test were performed. Here, we report the test results of the flight model of the NISS.

• 한국안전학회지
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• 제32권2호
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• pp.34-37
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• 2017

In recent emerging industry, Display field becomes bigger and bigger, and also semiconductor technology becomes high density integration. In Flat Panel Display, there is an issue that electrostatic phenomenon results in fine dust adsorption as electrostatic capacity increases due to bigger size. Destruction of high integrated circuit and pattern deterioration occur in semiconductor and this causes the problem of weakening of thermal resistance. In order to solve this sort of electrostatic failure in this process, Soft X-ray ionizer is mainly used. Soft X-ray Ionizer does not only generate electrical noise and minute particle but also is efficient to remove electrostatic as it has a wide range of ionization. X-ray Generating efficiency has an effect on soft X-ray Ionizer affects neutralizing performance. There exist variable factors such as type of anode, thickness, tube voltage etc., and it takes a lot of time and financial resource to find optimal performance by manufacturing with actual X-ray tube source. MCNPX (Monte Carlo N-Particle Extended) is used for simulation to solve this kind of problem, and optimum efficiency of X-ray generation is anticipated. In this study, X-ray generation efficiency was measured according to target material thickness using MCNPX under the conditions that tube voltage is 5 keV, 10 keV, 15 keV and the target Material is Tungsten(W), Gold(Au), Silver(Ag). At the result, Gold(Au) shows optimum efficiency. In Tube voltage 5 keV, optimal target thickness is $0.05{\mu}m$ and Largest energy of Light flux appears $2.22{\times}10^8$ x-ray flux. In Tube voltage 10 keV, optimal target Thickness is $0.18{\mu}m$ and Largest energy of Light flux appears $1.97{\times}10^9$ x-ray flux. In Tube voltage 15 keV, optimal target Thickness is $0.29{\mu}m$ and Largest energy of Light flux appears $4.59{\times}10^9$ x-ray flux.