• Journal of the Korean Institute of Telematics and Electronics
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• v.22 no.3
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• pp.68-76
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• 1985

A charge-coupled device (CCD) area image sensor has been demonstrated with an experi-mental 16$\times$16 prototype. The prototype is a vertical frame transfer charge.coupled imager using two-phase gate electrode structures. In this device, ion-implanted barriers are used for two -phase CCD, and NMOS process has been adopted. The total imaging setup consisting of optical lens, clock generators, clock drivels, staircase signal generators, and oscilloscope is easily achieved with the aid of PROM . English alphabets are displayed on the oscilloscope screen using the total imaging set-up. We measure charge transfer inefficiency and dark current for the fabricated devices.

• Journal of the Korean Institute of Telematics and Electronics
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• v.27 no.4
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• pp.534-540
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• 1990

In this paper the characteristics of submicron gate GaAs MESFET's have been studied using a particle model which takes into account the hot-electron transport phenomena, i.e., the velocity overshoot. \ulcornervalley(<000> direction), L valley (<111>direction), X valley (<100>direction) as the GaAs conduction energy band and optical phonon, acoustic phonon, equivalent intervalley, nonequivalent intervalley scattering as the scattering models, have been considered in this simulation. And the GaAs material and the device simulation have been done by determination of the free flight time, scattering mechanism and scattering angle according to Monte-Carlo algorithm which makes use of a particle model. As a result of the particle simulation, firstly the electron distribution, the potential energy distribution and the situation of electron displacement in 0.6 \ulcorner gate length device have been obtained. Secondly, the cutoff frequency, obtained by this method, is k47GHz which is in good agreement with the calculated result of theory. And the current-voltage characteristics curve which takes account of the buffer layer effect has been obtained. Lastly it has been verified that parasitic current at the buffer layer can be analyzed using channel depth modulation.

• Journal of the Korean Institute of Telematics and Electronics
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• v.27 no.9
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• pp.1409-1418
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• 1990

Characteristics of NMOS transistors with phosphorus source/drain junctions formed by two-step rapid thermal diffusion (RTD) process using a solid diffusion source have been investigated. Phosphorus profiles after RTD were measured by SIMS analysis. In the case of 1100\ulcorner, 10sec RTD of, P, the specific contact resistance of n+ Si-Al was 2.4x10**-7 \ulcorner-cm\ulcorner which is 1/5 of the As junction The comparison fo P junction devices formed by RTD and conventional As junction devices shows that both short channel effect and hot carrier effect of P junction devices are smaller than those of As junction devices when the devices have same junction depths. P junction device had maximum of 0.4 times lower Isub/Id than As junction device. Characteristics of P junction formed by several different RTD conditions have been compared and 1000\ulcorner RTD sample had the smaller hot carrier generation. Also, it has been shown that the hot carrier generation can be futher reduced by forming the P junctions by 3-step RTD which has RTO-driven-in process additionally.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.33A no.3
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• pp.117-125
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• 1996

The variation of the interfacial and the electrical properties of SiO$_{2}$TiW layers as a function of anneal temperature was extensively investigated. During the deposition of SiO$_{2}$ on TiW chemical bonds such as SiO$_{2}$, TiW, WO$_{3}$, WO$_{2}$ TiO$_{2}$ Ti$_{2}$O$_{5}$ has been created at the SiO$_{2}$/TiW interface. At the anneal temperature of 300$^{\circ}C$, WO$_{3}$ and TiO$_{2}$ bonds started to break due to the reduction phenomena of W and Ti and simultaneously the metallic W and Ti bonds started to create. Above 500$^{\circ}C$, a part of Si-O bonds was broken and consequently Ti/W silicide was formed. Form the current-voltage characteristics of Al/Sico$_{2}$(220$\AA$)/TiW antifuse structure, it was found that the breakdown voltage of antifuse device wzas decreased with increasing annealing temperature for SiO$_{2}$(220$\AA$)/TiW layer. When r, the insulating property of antifuse device of the deterioration of intermetallic SiO$_{2}$ film, caused by the influw of Ti and W.W.

• The Journal of The Korea Institute of Intelligent Transport Systems
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• v.8 no.2
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• pp.67-74
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• 2009

In this paper, the multi-band antenna with CPWG(Coplanar Waveguide with Ground) feed for telematics mobile devices is designed and fabricated. The proposed antenna improves the return loss characteristic by using open-circuited stub matching and rectangular slot in the radiation patch. In addition, CPWG structure makes up for the drawback of the CPW which is variation of impedance matching according to the gap variation of the feed line and the ground. The fabricated antenna has 1.4GHz ($1.43GHz{\sim}2.83GHz$, 65%) band width on -10dB (VSWR<2) and the maximum gains are 0.8dBi, 1.34dBi, 2.41dBi, 2.53dBi, 2.6dBi and 1.51dBi on each resonant frequency that are GPS $(1.564GHz{\sim}1.585GHz)$, PCS/DCS $(1.710GHz{\sim}1.984GHz)$, WCDMA $(2.170GHz{\sim}2300GHz)$, Bluetooth/Wi-Fi/WLAN $(2.4GHz{\sim}2.483GHz)$, WiBro $(2.3GHz{\sim}2.4GHz)$, SDMB $(2.605GHz{\sim}2.655GHz)$. It also has an omni-directional radiation pattern of H-Plane.

• Journal of the Korean Institute of Telematics and Electronics D
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• v.36D no.7
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• pp.66-79
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• 1999

We investigate the effects of high input power on the performance of optical bistable symmetric self-electooptic effect devices (S-SEEDs) using extremely shallow quantum wells (ESQWs). In this study, we consider the four ESQWs SEEDs; anti-reflection (AR)-coated ESQWs S-SEED, back-to-back AR coated ESQWs S-SEED, asymmetric F뮤교-Perot (AFP) ESQWs S-SEED, and back-to-back AFP-ESQWs S-SEED. As the input power increases, device performances such as on/off contrast ratio, on/off reflectivity difference are seriously degraded because of ohmic heating and exciton saturation. On the other hand, switching speed of the device increases up to certain value and then begins to decrease. With reasonable optimization of the input power for the best switching speed operation of the devices in a cascading optical interconnection system, we simulate and analyze the system bit-rate of the various ESQWs S-SEEDs, for a mesa of $5{\times}5{\mu}m^2$ size, changing the namber of quantum wells for the external bias of 0 V and -5V.

• Journal of the Korean Institute of Telematics and Electronics D
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• v.36D no.7
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• pp.34-41
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• 1999

In this paper, hot carrier induced performance degradation of peripheral circuits in memory devices such as static type imput buffer, latch type imput buffer and sense amplifier circuit has been measured and analyzed. The used design and fabrication of the peripheral circuits were $0.8 {\mu}m$ standard CMOS process. The analysis method is to find out which device is most significantly degraded in test circuits by using spice simulation, and then to characterize the correlation between device and circuit performance degradation. From the result of the performance degradation of static type input buffer, the trip point was increased due to the transconductance degradation of NMOS. In the case of latch type input buffer, there was a time delay due to the transconductance degradation of NMOS device. Finally, hot carrier induced the decrease of half-Vcc voltage and the increased of sensing voltage in sense amplifier circuits have been measured.

• Journal of the Korean Institute of Telematics and Electronics D
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• v.34D no.2
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• pp.27-37
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• 1997

Photoluminescent and cathodoluminescent charcteristics of inorganic luminescent materials were investigated ot develop possible phosphors for thin film electroluminescent (TFEL) device applications. Mg, Zn, and Photoluminescent and cathodoluminescent charcteristics of inorganic luminescent materials were investigated ot develop possible phosphors for thin film electroluminescent (TFEL) device applications. Mg, Zn, and $Si_3N_4$ powders were used to synthesize $(Mg_xZn_{1-x})SiN_2$ host materials. $Tb_4O_7$ and $Eu_2O_3$ powdrs were added as luminescent centers. Very sharp emission spectra of $Tb^{3+}$ ions were observed from $Mg._5Zn._5SiN_2:Tb$ sampels sintered at $1400^{\circ}C$ for an hour and the maximum intensity of emission spectra occured at wavelength of 550nm (green light). Synthetic conditions of $(Mg_xZn_{1-x})SiN_2:Eu$ phosphors were optimized for the hghest luminescence. The Eu concentrations were varied from 0.2% to 1.6%. Before firing, the powders were mixed using ballmills, methanol, acetone, or D.I. water. The Mg/Zn ratio also were varied from x=0.3 to x=0.7. The maximum PL intensity was obtained from a sample with 1.2% Eu concentration and the powder was mixed with methanol and dried before firing. The maximum intensity of the emission spectra occurred t the wavelength of 470nm(blue light). TFEL devices fabricated by using sputter deposition of $(Mg._3Zn._7)SiN_2:Eu$ phosphor layer showed yellowish white emission at the phosphor field of 2MV/cm.

• Journal of the Korean Institute of Telematics and Electronics
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• v.5 no.1
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• pp.6-12
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• 1968

Experiments have been made on alloys to determine the practicability of using the Peltier effect in a thermoelectric devices. The cooling and heating results of thermoelectrie material coposed of n and p type BiTe are used, whose properties are; , , , , and K: thermal conductivity. The temperature of the cold part has been measured in veccum with respect to the temperature of the hot part. The experiment result agreed fairly with expectation such as was 42 degree C.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.32A no.11
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• pp.17-28
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• 1995

In this paper, we developed a two-dimensional numerical simulator which could analyze the stripe geometry semiconductor laser diodes by modifying the commercial semiconductor device simulator, MEDICI. In order to study the characteristics of semiconductor laser diodes, it is necessary to solve the Helmholtz wave equation and photon rate equation in addition to the basic semiconductor equations. Also the recombination rates due to the spontaneous and the stimulated emissions should be included, which are very important recombination mechanisms in semiconductor laser diodes. Therefore, we included the solution routines which analyzed the Helmholtz wave equation and the photon rate equation and two important recombination rates to simulate the semiconductor laser diodes. Then we simulated the gain-guiding and index-guiding DH(Double Heterostructure) semiconductor laser diodes to verify the validity of the implemented functions. The results obtained from simulation are well consistent with the previously published ones. This allows us to know the operating characteristics of DH laser diodes and is expected to use as a tool for optimum design.