• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.16 no.10 s.101
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• pp.1010-1019
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• 2005

In this paper, we used neural network technique to model memory effects of RF power amplifier which is fed by two-tone input signals. The memory effects in power amplifier were identified by observing the unsymmetrical distribution of IMD(Inter-Modulation Distortion) measurements with the change of tone spacings and power levels. Different asymmetries of IMD were also found at different center frequencies. We applied TDNN technique to model LDMOS power amplifier based on two tone IMD data, and the accuracy was very high compared to other modeling methods such as the(memoryless) adaptive modeling method.

• Proceedings of the KIEE Conference
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• 2004.11c
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• pp.261-264
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• 2004

In this paper, we identify the memory effect of high power(125W) laterally diffused metal oxide-semiconductor(LDMOS) RF Power Amplifier(PA) by two tone IMD measurement. We measure two tone IMD by changing the tone spacing and the power level. Different asymmetric IMD is founded at different center frequency measurements. We propose the Tapped Delay Line-Neural Network(TDNN) technique as the modeling method of LDMOS PA based on two tone IMD data. TDNN's modeling accuracy is highly reasonable compared to the memoryless adaptive modeling method.