• 제어로봇시스템학회논문지
• /
• 제14권5호
• /
• pp.444-452
• /
• 2008

This paper presents an overall image processing approach of defect inspection of patterned TFT-LCD panels for the real manufacturing process. A prototype of AOI(Automatic Optical Inspection) system which is composed of air floating stage and multi line scan cameras is developed. Adjacent pattern comparison algorithm is enhanced and used for pattern elimination to extract defects in the patterned image of TFT-LCD panels. New region merging algorithm which is based on border expansion is proposed to identify defects from the pattern eliminated defect image. Experimental results show that a developed AOI system has acceptable performance and the proposed algorithm reduces environmental effects and processing time effectively for applying to the real manufacturing process.

• 전기학회논문지
• /
• 제57권2호
• /
• pp.307-313
• /
• 2008

In this paper, we propose a novel defects inspection algorithm for TFT-LCD panels. We first compensate the distorted image caused by the camera distortion and the uneven illumination environment using the least squares method and the bezier surface. We find a starting point of each pattern for restricting each pattern. A clean image is compared to each pattern to find defects using modified PCSR-G algorithm. The simulation example shows that our algorithm not only inspects the defects well, but also is robust to the 1-pixel error.

• 전기학회논문지
• /
• 제57권7호
• /
• pp.1295-1297
• /
• 2008

Large-sized flat-panel displays are widely used for PC monitors and TV displays. In this paper, frequency domain pre-filter algorithms are presented for detection of defects in large-sized Thin Film Transistor-Liquid Crystal Display(TFT-LCD) panel surfaces. Frequency analysis with 1-D, 2-D FFT methods for extract the periodic patterns of lattice structures in TFT-LCD is performed. To remove this patterns, frequency domain band-stop filters were used for eliminating specific frequency components. In order to acquire only defected images, 2-D inverse FFT methods to inverse transform of frequency domain images were used.

• 반도체디스플레이기술학회지
• /
• 제10권4호
• /
• pp.15-20
• /
• 2011

The lithography system installed inside precision industry's (e.g. TFT-LCD) production factories are increasing in size, thereby increasing its dynamic load along with it. Such condition causes vibration within the area where the system is installed, which then negatively affects the production line to produce defective products. To prevent this type of situation, the facilities should adopt dynamic design that considers the lithography system's dynamic load. This study predicts the maximum value allowed for dynamic stiffness (which is a ratio of vibration response against a single unit of the dynamic load) of the lithography system and explains the result of its application on actual structures inside the facilities.

• 한국광학회지
• /
• 제19권1호
• /
• pp.43-47
• /
• 2008

현재 TFT-LCD(Thin Film Transistor Liquid Crystal Display)에 사용되는 BLU(Back Light Unit) 패턴 크기는 수 십 ${\mu}m$인데 반해, 최근에는 BLU 패턴의 크기를 수 ${\mu}m$ 또는 그 이하로 조절함으로써 출력광의 휘도를 증가시키고 균일도를 향상시키고자 하는 연구가 진행되고 있다. 본 연구에서는 패턴의 크기, 분포 및 점유 면적이 출력광의 분포에 미치는 영향을 조사하였다.

• 한국정보디스플레이학회:학술대회논문집
• /
• 한국정보디스플레이학회 2009년도 9th International Meeting on Information Display
• /
• pp.1590-1592
• /
• 2009

The ubiquitous nature of large area TFT-LCD televisions are truly one of the major success stories of consumer electronic products for the $21^{st}$ century. It is the industry's ability to lower prices over the years that have made TFT-LCD television an affordable option for the majority of consumers. TFT-LCD equipment manufacturers have played a major role these cost reduction efforts. Increasing requirements for high process quality like for eg UHD panels need to be met simultaneously with the demand of an highly productive and reliable equipment. AKT provides an excellent PVD product by improving performance and cost of ownership (CoO) for Gen8.5 and beyond.

• 대한전기학회:학술대회논문집
• /
• 대한전기학회 2000년도 하계학술대회 논문집 D
• /
• pp.3084-3087
• /
• 2000

본 논문은 대면적 Poly-Si TFT-LCD 구동회로의 면적을 줄이기 위한 효율적인 구동방식을 제안한다. 구체적으로 화소의 충전 시간을 줄이기 위한 화면 수평 분할 구동방식과 데이터 라인 프리차징 방식을 제안한다. 또한 수평분할 구동을 위한 Bit-Reduced R-DAC를 제안한다. 마지막으로 본 논문에서는 제안하는 구동 방식을 14 1" XGA 6-bit 일체형 디지털 Poly-Si TFT-LCD 구동회로에 적용하여 효용성을 검증한다 시뮬레이션 결과 계조별 평균 구동오차는 14mv로서 1/2 LSB(${\risingdotseq}$23mV) 정확도 요구 조건을 만족한다. 데이터 드라이버의 폭은 상 하단 각각 약 6mm이며 이는 기존 설계에 비해 66% 감소한 값이다.

• 산업경영시스템학회지
• /
• 제28권1호
• /
• pp.41-48
• /
• 2005

In this paper, we propose a systematic procedure to determine standard time and cycle time in a TFT-LCD factory. The proposed procedure mainly consists of data preprocessing, hypothesis testing and Group technology. Data preprocessing extracts relevant data from large on-line data sets by eliminating corrupt and noisy data. Hypothesis test techniques have been used to determine whether the standard information has been changed. Also, Group technology has been applied to generate standard information for newly developed products. The proposed procedure has been successfully applied to the production information system of a TFT-LCD factory in Korea.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2000년도 춘계학술대회 논문집 디스플레이 광소자 분야
• /
• pp.165-168
• /
• 2000

An active-matrix LCD using thin film transistors (TFT) has been widely recognized as having potential for high-quality color fiat-panel displays. Pixel-Design Array Simulation Tool (PDAST) was used to profoundly understand the gate signal distortion and pixel charging capability, which are the most critical limiting factors for high-quality TFT-LCDs. In addition, PDAST can estimate voltage distributions in common electrode which can affect pixel voltage and feed-through voltage. Since PDAST can simulate the gate, data and the pixel voltages of a certain pixel on TFT array at any time and at any location on an array, the effect of common electrode voltage can be effectively analyzed. The information obtained from this study could be utilized to design the larger area and finer image quality panel.

• 한국정보디스플레이학회:학술대회논문집
• /
• 한국정보디스플레이학회 2002년도 International Meeting on Information Display
• /
• pp.46-49
• /
• 2002

Recent trends of low-temperature polycrystalline Si (LTPS) TFT technologies are presented. Characteristics of LTPS TFT processes are compared with those of a-Si TFT's. In order to compete with well-established a-Si TFT-LCD technology, LTPS process has to be as simple as possible. One of the most critical processes, recrystallization of a-Si thin films, could be the process for the differentiation of LTPS technology. Along with these technical reviews, a recent development of the 5.0-inch LTPS TFT-LCD is presented. In order to achieve high-performance display characteristics and save the power consumption, the transflective mode is adopted. The 5.0-inch display with 186 pixel-per-inch, high-resolution LCD was measured to be 10% for the reflectance and 70:1 for the contrast ratio. This display is designed for a high information content hand-held PC (HHPC) application.