• Applied Microscopy
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• 제38권3호
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• pp.275-278
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• 2008

Electron tomography (ET) is an electron microscopic technique for obtaining a 3-D image from any electron microscopy specimen and its application in biomedical science has been increased thanks to development of electron microscopy and related technologies during the last decade. There are few researches on ET in Korea during this period. Although the importance of ET has been recognized recently by many researchers, initial approach to electron tomographic research is not easy for beginners. The 4th International Congress on Electron Tomography (4 ICET) was held on Nov $5{\sim}8$, 2006, at San Diego. The program dealt instrumentation, reconstruction algorithm, visualization/quantitative analysis and electron tomographic presentation of biological specimen and nano particles. 1 have summarized oral presentations and analyzed the posters presented on the meeting. Cryo-electron microscopic system was popular system for ET and followed conventional transmission electron microscopic system. Cultured cell line and tissue were most popular specimens analyzed and microorganisms including bacteria and virus also constituted important specimens. This analysis provides a current state of art in ET research and a guide line for practical application of ET and further research strategies.

• 한국재료학회:학술대회논문집
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• 한국재료학회 1998년도 추계학술발표강연 및 논문개요집
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• pp.130-130
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• 1998

• 한국공작기계학회논문집
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• 제14권1호
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• pp.44-51
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• 2005

Material degradation is a multibillion-dollar problem which affects all the industries amongst others. The last decades have seen the development of newer and more effective techniques such as Focused-ion beam(FIB), Transmission electron microscopy(TEM), Secondary-ion mass spectroscopy(SIMS), auger electron spectroscopy(AES), X-ray Photoelectron spectroscopy(XPS) , Electrochemical impedance spectroscopy(EIS), Photo- stimulated luminescence spectroscopy(PSLS), etc. to study various forms of material degradation. These techniques are now used routinely to obtain information on the chemical state, depth profiling, composition, stress state, etc. to understand the degradation behavior. This paper describes the use of these techniques specifically applied to materials degradation and failure analysis.

• Current Research on Agriculture and Life Sciences
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• 제32권3호
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• pp.125-130
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• 2014

This study used transmission electron microscopy (TEM) to investigate the micro-morphological features of two formaldehyde to urea (F/U) mole ratio liquid urea-formaldehyde (UF) resins with three hardener levels as a function of the curing time. The micro-morphological features of the liquid UF resins were characterized after different curing times. As a result, the TEM examination revealed the presence of globular/nodular structures in both liquid UF resins, while spherical particles were only visible in the low F/U mole ratio resins. The high F/U mole ratio liquid UF resins also showed extensive particle coalescence after adding the hardener, along with the appearance of complex filamentous networks. When the resins were cured with a higher amount of hardener and longer curing time, the spherical particles disappeared. For the low mole UF resins, the particles tended to coalesce with a higher amount of hardener and longer curing time, although discrete spherical particles were still observed in some regions. This is the first report on the distinct features of the crystal structures in low F/U mole ratio UF resins cured with 5% hardener and after 0.5 h of curing time. In conclusion, the present results indicate that the crystal structures of low F/U mole ratio UF resins are formed during the curing process.

• 대한전자공학회논문지SD
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• 제41권1호
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• pp.15-20
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• 2004

산화막위에 증착된 금속박막과 산화막과의 계면효과를 조사하였다. 산화막으로는 현재 반도체소자제조공정에 많이 사용되고 있는 BPSG 산화막과 PETEOS 산화막을 사용하였다. 이 두 종류의 산화막위에 적층구조의 금속박막을 형성한 후, 금속박막의 열처리에 의한 계면의 영향을 SEM (scanning electron microscopy), TEM (transmission electron microscopy), AES (auger electron spectroscopy)를 사용하여 조사하였다. BPSG 산화막위에 증착된 금속박막을 $650^{\circ}C$ 이상에서 RTP anneal을 한 경우, BPSG 산화막과 금속박막의 계면결합상태가 좋지 않았고, BPSG 산화막과 금속박막의 계면에 phosphorus가 축적된 영역을 확인하였다. 반면에 PETEOS 산화막위에 증착된 금속박막의 경우, RTP anneal 온도에 관계없이 계면결합상태는 좋았다. 본 연구에서 BPSG 산화막위에 금속박막을 증착할 경우 RTP anneal 온도는 $650^{\circ}C$ 보다 작게 하여야 함을 알 수 있었다.

• Applied Microscopy
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• 제37권3호
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• pp.199-208
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• 2007

본 장치는 실험자가 레이저 빔과 광학 렌즈를 조정하여 이미지 및 회절도형의 형성, 보강 및 소멸간섭과 같은 파동광학 현상을 이해하도록 제작된 실험 장치이다. 실험장치는 광원으로 쓰이는 레이저빔과 빔의 광축을 정렬하는 광원 부분과 시료대, 대물렌즈, 중간렌즈, 확대렌즈, CCD system, 컴퓨터, 그리고 렌즈를 상하 조절하는 경통부분으로 구성된다. 본 장치를 통해서 다양한 회절격자의 이미지 및 회절도형을 최대 약 44배 확대할 수 있고, 최대 약 5um의 분해능을 가지고 분석할 수 있다. 이 장치는 전자현미경 이용자들이 TEM의 원리를 보다 쉽게 이해하는데 도움을 주리라 기대한다.

• 한국전자현미경학회:학술대회논문집
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• 한국현미경학회 2001년도 제32차 추계학술대회
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• pp.18-22
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• 2001

A technique to characterize specific site of materials using a combination of a dedicated focused ion beam system(FIB), and Intermediate-voltage scanning transmission electron microscope(STEM) or transmission electron microscope(TEM) equipped with a scanning electron microscope(SEM) unit has been developed. The FIB system is used for preparation of electron transparent thin samples, while STEM or TEM is used for localization of a specific site to be milled in the FIB system. An FIB-STEM(TEM) compatible sample holder has been developed to facilitate thin sample preparation with high positional accuracy Positional accuracy of $0.1{\mu}m$ or better can be achieved by the technique. In addition, an FIB micro-sampling technique has been developed to extract a small sample directly from a bulk sample in a FIB system These newly developed techniques were applied for the analysis of specific failure in Si devices and also for characterization of a specific precipitate In a metal sample.

• Applied Microscopy
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• 제36권spc1호
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• pp.63-69
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• 2006

By utilizing a field emission gun and a biprism installed on a transmission electron microscope (TEM), electron holography is extensively carried out to visualize the electric and magnetic fields of nanomaterials. In the electric field analysis, the distribution of electric potential in a sharp tip made of W coated with $ZrO_2$ is visualized by applying the voltage to the tip. Denser contour lines due to the electric potential are observed with an increase in the bias voltage. In the magnetic field analysis by producing the strong magnetic field with a sharp magnetic needle made of a permanent magnet, the in situ experiment is carried out to investigate the magnetization of hard magnetic materials. The results of these experiments clearly demonstrate that electron holography is a promising advanced transmission electron microscopy technique to characterize the electric and magnetic properties of nanomaterials.

• 열처리공학회지
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• 제4권3호
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• pp.21-30
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• 1991

Microstructural analysis was conducted to observe the effect of aging treatments in a Cr-Mn austenitic stainless steel containing nitrogen, and the amount, size, shape and distribution of precipitates were investigated. It was found that on water quenching from $1000^{\circ}C$ after holding 3 h at that temperature, the steel contained no precipitates observable by optical microscopy. Precipitation of phases begins at places most favorable for the formation of nuclei-in the boundaries of grains and twins. Precipitates were studied in detail by means of scanning electron microscopy (SEM) and transmission electron microscopy (TEM). Chemical compositions of precipitates were examined by the use of scanning transmission electron microscopy (STEM) together with an energy dispersive X-ray (EDX) microanalysis. Also chromium depletion adjacent to grain boundary precipitates was investigated by the use of Auger electron spectroscopy (AES) for a direct examination of the fracture surface chemistry.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2005년도 International Meeting on Information Displayvol.II
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• pp.1081-1086
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• 2005

Dynamic behavior of carbon nanotubes (CNTs) in an electric field is directly observed by in-situ transmission electron microscopy (TEM). The CNT field emitters examined by in-situ TEM are multiwalled, double-walled and single walled CNTs. Threshold fields for electron emission and sustainable emission currents depending on the structure of CNTs are presented, and degradation mechanism of the CNT field emitters is discussed. In addition to the microscopy studies on individual CNTs, our recent development in surface treatment of CNT layers grown by chemical vapor deposition, which brings about high density of emission current and high uniformity, is also presented.