• 대한전기학회:학술대회논문집
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• 대한전기학회 2008년도 추계학술대회 논문집 전기기기 및 에너지변환시스템부문
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• pp.26-28
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• 2008

전기기기 제품, 부품의 부식을 검증하기 위해서 염수, 아황산가스, 암모니아 가스 등을 이용한다. 염수시험은 입수를 액체 분무형태로 생성하며, 시편이 부식되도록 일정한 양을 분무하고 시험조 내에 균일한 분포를 갖도록 조정할 필요가 있다 본 논문은 연수분무 시험장치의 주요 인자를 바탕으로 실험계획법을 적용하여 시험용액의 분포가 균질하도록 최적의 조건을 찾는 방법을 제시하였다.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2002년도 추계학술대회 논문집 전기기기 및 에너지변환시스템부문
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• pp.154-156
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• 2002

본 논문은 저압 차단기에 적용되는 IEC 60947-2 (Circuit breakers)와 전류고조파(Current harmonic) 내성시험 규격인 IEC 61000-3-2. IEC 61000-3-4에 대한 규격의 적용범위, 시험범위, 고조파에 대한 개념, 차단기의 고조파에 대한 영향 및 시험설비의 요구조건을 고찰하고, 16A 초과 전류 고조파 시험적용 방법과 시험결과를 고찰하고자 한다.

• 대한기계학회논문집A
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• 제28권3호
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• pp.259-266
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• 2004

Detailed two-dimensional and three-dimensional finite element (FE) analyses of double-edge cracked tension (DE(T)) specimens are carried out to investigate the effect of the relative crack length and the thickness on experimental J testing schemes. Finite element analyses involve systematic variations of relevant parameters, such as the relative crack depth and plate width-to-thickness ratio. Furthermore, the strain hardening index of material is systematically varied, including perfectly plastic (non-hardening) cases. Based on FE results, a robust experimental J estimation scheme is proposed.

• 한국정보처리학회:학술대회논문집
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• 한국정보처리학회 2017년도 춘계학술발표대회
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• pp.618-620
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• 2017

Currently, IoT mobile applications are growing fast in number and complexity. As a result, the applications quality issue became crucial, hence to ensure their quality a proper testing is highly required. Testing such mobile applications is always tedious, time-consuming and expensive. To cope with these issues, we propose a testing approach using activity diagram with data flow information. The main functionality of IoT applications is exposing the meaningful data obtained from the sensors to the users by doing a lot of analysis, comparison, and computation. Therefore, our focus is on identifying and selecting the most appropriate paths at which calculation is taking place and the paths at which predicate exists. In our case study, we have used a real-world IoT mobile application and identified a total of ten test paths with two predicate uses and two computation uses through an example. With applying only this four critical paths, we can adequately test the application's core functionalities while significantly reduce the testing effort and cost.

• E2M - 전기 전자와 첨단 소재
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• 제10권4호
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• pp.349-354
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• 1997

This paper aims at studying the improvement of test method for t-weight sensitive fault (t-wsf) detect. The development of RAM fabrication technology results in not only the increase at device density on chips but also the decrease in line widths in VLSI. But, the chip size that was large and complex is shortened and simplified while the cost of chips remains at the present level, in many cases, even lowering. First of all, The testing patterns for RAM fault detect, which is apt to be complicated , need to be simplified. This new testing method made use of Local Lower Bound (L.L.B) which has the memory with the beginning pattern of 0(l) and the finishing pattern of 0(1). The proposed testing patterns can detect all of RAM faults which contain stuck-at faults, coupling faults. The number of operation is 6N at 1-weight sensitive fault, 9,5N at 2-weight sensitive fault, 7N at 3-weight sensitive fault, and 3N at 4-weight sensitive fault. This test techniques can reduce the number of test pattern in memory cells, saving much more time in test, This testing patterns can detect all static weight sensitive faults and pattern sensitive faults in RAM.

• ETRI Journal
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• 제32권1호
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• pp.73-83
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• 2010

Combinatorial testing has been an active research area in recent years. One challenge in this area is dealing with the combinatorial explosion problem, which typically requires a very expensive computational process to find a good test set that covers all the combinations for a given interaction strength (t). Parallelization can be an effective approach to manage this computational cost, that is, by taking advantage of the recent advancement of multicore architectures. In line with such alluring prospects, this paper presents a new deterministic strategy, called multicore modified input parameter order (MC-MIPOG) based on an earlier strategy, input parameter order generalized (IPOG). Unlike its predecessor strategy, MC-MIPOG adopts a novel approach by removing control and data dependency to permit the harnessing of multicore systems. Experiments are undertaken to demonstrate speedup gain and to compare the proposed strategy with other strategies, including IPOG. The overall results demonstrate that MC-MIPOG outperforms most existing strategies (IPOG, IPOF, IPOF2, IPOG-D, ITCH, TConfig, Jenny, and TVG) in terms of test size within acceptable execution time. Unlike most strategies, MC-MIPOG is also capable of supporting high interaction strengths of t > 6.

• 품질경영학회지
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• 제11권1호
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• pp.10-17
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• 1983

본 연구에서는 제품의 수명시험을 수행하는데 있어서 수명이 지수분포를 따를 때의 결과를 [1]제품의 MTBF가 $T_1$인 경우, 검사에 통과될 확률 $1-{\alpha}$(${\alpha}$는 생산자 위험), 제품의 MTBF가 $T_2$인 ($T_1$ > $T_2$) 경우, 검사에 통과될 확률 ${\beta}$(${\beta}$는 소비자 위험)로 하여 수명이 Weibull 분포(Shape Parameter를 알고 있을 때)를 따를 때에로 확장하였다. 또한, 수명시험과 관계있는 검사특성곡선(QC curve)과 평균수명시험시간(Average Life Testing Time)을 구해 보았다. 비용분석은 [1]의 과정을 그대로 활용하였다. 위의 전 과정은 Level II Basic Language로 Programming하여 Micro-Computer를 이용하여 계산하였다. 본 연구와는 다른 관점에서 Weibull 분포의 수명시험계획을 다루었던 [6]의 결과는 모두 같은 방향 - 지수분포에 비해 수명시험시간의 절감 - 으로 귀결되었음을 알 수 있다.

• 비파괴검사학회지
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• 제2권1호
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• pp.31-49
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• 1982

Description of the French certification system; comparison between useful certification systems of other countries, look to the future.

• 품질경영학회지
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• 제36권4호
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• pp.1-6
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• 2008

As more and more data are collected one may ask whether the data collected within a short period of time are same. In this case traditional hypothesis testing of $H_o:{\mu}_1={\mu}_2$ vs $H_1:{\mu}_1{\neq}{\mu}_2$ is used to determine whether the data are same when there is no knowledge about equivalence testing. However, this type of hypothesis testing has the undesirable property of penalizing higher precision. So TOST is to be performed in the event of equivalence testing. In this study equivalence testing is introduced where one can find the applications in industry. Traditional two sample t testing is to be compared with the equivalent testing and the procedure to perform the equivalence testing is to be presented along with an example. Finally equivalence testing in terms of the other parameters such as variance, proportion or failure rate is to be sought.

• 한국전산응용수학회:학술대회논문집
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• 한국전산응용수학회 2003년도 KSCAM 학술발표회 프로그램 및 초록집
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• pp.13.2-13
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• 2003

We propose some properties of Bayesian fuzzy hypotheses testing by revision for prior possibility distribution and posterior possibility distribution using weighted fuzzy hypotheses versus on with loss function.