• JSTS:Journal of Semiconductor Technology and Science
• /
• v.12 no.3
• /
• pp.293-296
• /
• 2012

SOC test methodology in ultra deep submicron (UDSM) technology with reasonable test time and cost has begun to satisfy high quality and reliability of the product. A novel hierarchical test architecture using IEEE standard 1149.1, 1149.7 and 1500 compliant facilities is proposed for the purpose of supporting flexible test environment to ensure SOC test methodology. Each embedded core in a system-on- a-chip (SOC) is controlled by test access ports (TAP) and TAP controller of IEEE standard 1149.1 as well as tested using IEEE standard 1500. An SOC device including TAPed cores is hierarchically organized by IEEE standard 1149.7 in wafer and chip level. As a result, it is possible to select/deselect all cores embedded in an SOC flexibly and reduce test cost dramatically using star scan topology.

• Journal of KIISE:Computer Systems and Theory
• /
• v.35 no.6
• /
• pp.284-292
• /
• 2008

The density of Memory has been increased by great challenge for memory technology; therefore, elements of memory become more smaller than before and the sensitivity to faults increases. As a result of these changes, memory testing becomes more complex. In addition, as the number of storage elements per chip increases, the test cost becomes more remarkable as the cost per transistor drops. Recent development in system-on-chip(SoC) technology makes it possible to incorporate large embedded memories into a chip. However, it also complicates the test process, since usually the embedded memories cannot be controlled from the external environment. We present a ARM processor-programmable built-in self-test(BIST) scheme suitable for embedded memory testing in the SoC environment. The proposed BIST circuit can be programmed vis an on-chip microprocessor.

• Journal of the Institute of Electronics Engineers of Korea SD
• /
• v.41 no.8
• /
• pp.9-16
• /
• 2004

For a System-on-a-Chip(SoC) comprised of multiple IP cores, test control techniques have been developed to perform the internal and external test efficiently relying on the various design for testability techniques such as scan and BIST(Built-In Self-Test). However the test area overhead is too expensive to guarantee diverse test link configurations. In this paper, at first we introduce a new flag based Wrapped Core Linking Module(WCLM) that enables systematic integration of IEEE 1149.1 TAP'd cores and P1500 wrapped cores. Then a simple test control technique, which can interconnect internal scan chains of different cores, is described with requiring least amount of area overhead compared with other state-of-art techniques. The design preserves compatibility with standards and scalability for hierarchical access.

• Proceedings of the IEEK Conference
• /
• 1999.06a
• /
• pp.1137-1140
• /
• 1999

In this thesis, we research about Communication System Construction and Test-Bed Realization Method and Software’s Design with written program into Embedded Micro Controller’s restricted memory region using a DSP Chip to deal with mainly high speed communication. Tools used for modern communication network control use TI or AMD general chip class, but nevertheless responsibility for the point at issue, Analog Device is architecture design model moderated for small communication system. In this thesis, we present extended model, and realize basic case.

• Journal of Information Processing Systems
• /
• v.3 no.1
• /
• pp.16-20
• /
• 2007

This paper describes the development of the sensor interface and driver program for a point of care (POC) device. The proposed pac device comprises an ARM9 embedded processor and eight-channel sensor input to measure various bio-signals. It features a user-friendly interface using a full-color TFT-LCD and touch-screen, and a bluetooth wireless communication module. The proposed device is based on the system on a programmable chip (SOPC). We use Altera's Excalibur device, which has an ARM9 and FPGA area on a chip, as a test bed for the development of interface hardware and driver software.

• ETRI Journal
• /
• v.29 no.3
• /
• pp.371-380
• /
• 2007

This paper proposes a new automatic compensation network (ACN) for a system-on-chip (SoC) transceiver. We built a 5 GHz low noise amplifier (LNA) with an on-chip ACN using 0.18 ${\mu}m$ SiGe technology. This network is extremely useful for today's radio frequency (RF) integrated circuit devices in a complete RF transceiver environment. The network comprises an RF design-for-testability (DFT) circuit, capacitor mirror banks, and a digital signal processor. The RF DFT circuit consists of a test amplifier and RF peak detectors. The RF DFT circuit helps the network to provide DC output voltages, which makes the compensation network automatic. The proposed technique utilizes output DC voltage measurements and these measured values are translated into the LNA specifications such as input impedance, gain, and noise figure using the developed mathematical equations. The ACN automatically adjusts the performance of the 5 GHz LNA with the processor in the SoC transceiver when the LNA goes out of the normal range of operation. The ACN compensates abnormal operation due to unusual thermal variation or unusual process variation. The ACN is simple, inexpensive and suitable for a complete RF transceiver environment.

• Journal of the Korea Institute of Information and Communication Engineering
• /
• v.16 no.2
• /
• pp.313-318
• /
• 2012

This paper presents an automatic system to detect variety of faults from fine pitch COF(chip-on-film) which is less than $30{\mu}m$. Developed system contains circuits and technique to detect fast various faults such as hard open, hard short, soft open and soft short from fine pattern. Basic principle for fault detection is to monitor fine differential voltage from pattern resistance differences between fault-free and faulty cases. The technique uses also radio frequency resonator arrays for easy detection to amplify fine differential voltage. We anticipate that proposed system is to be an alternative for conventional COF test systems since it can fast and accurately detect variety of faults from fine pattern COF test process.

• Journal of the Korea Academia-Industrial cooperation Society
• /
• v.5 no.6
• /
• pp.515-520
• /
• 2004

Core-based system-on-a-chip (SoC) designs present a number of test challenges. Two major problems that are becoming increasingly important are long application time during manufacturing test and high volume of test data. Highly efficient compression techniques have been proposed to reduce storage and application time for high volume data by exploiting the repetitive nature of test vectors. This paper proposes a new test data compression technique for SoC testing. In the proposed technique, compression is achieved by partitioning the test vector set and removing repeating segment. This process has $O(n^{-2})$ time complexity for compression with a simple hardware decoding circuitry. It is shown that the efficiency of the proposed compression technique is comparable with sophisticated software compression techniques with the advantage of easy and fast decoding.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
• /
• 2011.05a
• /
• pp.769-770
• /
• 2011

This paper presented a method constructing the ITSoC(Information Technology System-on-Chip). In order to implement the ITSoC, designers are increasing relying on reuse of intellectual property(IP) blocks. Since IP blocks are pre-designed and pre-verified, the designer can concentrate on the complete system without having to worry about the correctness or performance of the individual components. Also, embedded core in an ITSoC access mechanisms are required to test them at the system level. That is the goal, in theory. In practice, assembling an ITSoC using IP blocks is still an error-prone, labor-intensive and time-consuming process. This paper discuss the main challenge in ITSoC designs using IP blocks and elaborates on the methodology and tools being put in place for addressing the problem. It explains ITSoC architecture and gives algorithmic details on the high-level tools being developed for ITSoC design.

• Journal of the Institute of Electronics and Information Engineers
• /
• v.51 no.5
• /
• pp.106-113
• /
• 2014

Recently, to reduce test cost by efficiently compressing test patterns for SOCs(System-on-a-chip), different compression techniques have been proposed including the FDR(Frequency-directed run-length) algorithm. FDR is extended to EFDR(Extended-FDR), SAFDR(Shifted-Alternate-FDR) and VPDFDR(Variable Prefix Dual-FDR) to improve the compression ratio. In this paper, a frequency-ordered modification is proposed to further augment the compression ratios of FDR, EFDR, SAFRD and VPDFDR. The compression ratio can be maximized by using frequency-ordered method and consequently the overall manufacturing test cost and time can be reduced significantly.