• Title/Summary/Keyword: Surface reflectance

Search Result 615, Processing Time 0.037 seconds

Atomic Force Microscopy and Specular Reflectance Infrared Spectroscopic Studies of the Surface Structure of Polypropylene Treated with Argon and Oxygen Plasmas

  • Seo Eun-Deock
    • Macromolecular Research
    • /
    • v.12 no.6
    • /
    • pp.608-614
    • /
    • 2004
  • Isotactic polypropylene (PP) surfaces were modified with argon and oxygen plasmas using a radio­frequency (RF) glow discharge at 240 mTorr and 40 W. The changes in topography and surface structure were investigated by atomic force microscopy (AFM) in conjunction with specular reflectance of infrared (IR) microspectroscopy. Under our operating conditions, the AFM image analysis revealed that longer plasma treatment resulted in significant ablation on the PP surface, regardless of the kind of plasma employed, but the topography was dependent on the nature of the gases. Specular reflectance IR spectroscopic analysis indicated that the constant removal of surface material was an important ablative aspect when using either plasma, but the nature of the ablative behavior and the resultant aging effects were clearly dependent on the choice of plasma. The use of argon plasma resulted in a negligible aging effect; in contrast, the use of oxygen plasma caused a noticeable aging effect, which was due to reactions of trapped or isolated radicals with oxygen in air, and was partly responsible for the increased surface area caused by ablation. The use of oxygen plasma is believed to be an advantageous approach to modifying polymeric materials with functionalized surfaces, e.g., for surface grafting of unsaturated monomers and incorporating oxygen-containing groups onto PP.

The phase angle dependences of Reflectance on Asteroid (25143) Itokawa from the Hayabusa Spacecraft Multi-band Imaging Camera(AMICA)

  • Lee, Mingyeong;Ishiguro, Masateru
    • The Bulletin of The Korean Astronomical Society
    • /
    • v.40 no.1
    • /
    • pp.61.3-62
    • /
    • 2015
  • Remote-sensing observation is one of the observation methods that provide valuable information, such as composition and surface physical conditions of solar system objects. The Hayabusa spacecraft succeeded in the first sample returning from a near-Earth asteroid, (25143) Itokawa. It has established a ground truth technique to connect between ordinary chondrite meteorites and S-type asteroids. One of the scientific observation instruments that Hayabusa carried, Asteroid Multi-band Imaging Camera(AMICA) has seven optical-near infrared filters (ul, b, v, w, x, p, and zs), taking more than 1400 images of Itokawa during the rendezvous phase. The reflectance of planetary body can provide valuable information of the surface properties, such as the optical aspect of asteroid surface at near zero phase angle (i.e. Sun-asteroid-observer's angle is nearly zero), light scattering on the surface, and surface roughness. However, only little information of the phase angle dependences of the reflectance of the asteroid is known so far. In this study, we investigated the phase angle dependences of Itokawa's surface to understand the surface properties in the solar phase angle of $0^{\circ}-40^{\circ}$ using AMICA images. About 700 images at the Hayabusa rendezvous phase were used for this study. In addition, we compared our result with those of several photometry models, Minnaert model, Lommel-Seeliger model, and Hapke model. At this conference, we focus on the AMICA's v-band data to compare with previous ground-based observation researches.

  • PDF

Investigation of Wet Chemical Etching for Surface Texturing of Multi-crystalline Silicon Wafers (다결정 실리콘 웨이퍼의 표면 텍스쳐링을 위한 습식 화학 식각에 대한 연구)

  • Kim, Bum-Ho;Lee, Hyun-Woo;Lee, Eun-Joo;Lee, Soo-Hong
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 2006.11a
    • /
    • pp.19-20
    • /
    • 2006
  • Two methods that can reduce reflectance in solar cells are surface texturing and anti-reflection coating. Wet chemical etching is a typical method that surface texturing of multi-crystalline silicon. Wet chemical etching methods are the acid texturization of saw damage on the surface of multi-crystalline silicon or double-step chemical etching after KOH saw damage removal too. These methods of surface texturing are realized by chemical etching in acid solutions HF-$HNO_3$-$H_2O$. In this solutions we can reduce reflectance spectra by simple process etching of multi-crystalline silicon surface. We have obtained reflectance of 27.19% m 400~1100nm from acidic chemical etching after KOH saw damage removal. This result is about 7% less than just saw damage removal substrate. The surface morphology observed by microscope and scanning electron microscopy (SEM).

  • PDF

AFM and Specular Reflectance IR Studies on the Surface Structure of Poly(ethylene terephthalate) Films upon Treatment with Argon and Oxygen Plasmas

  • Seo, Eun-Deock
    • Macromolecular Research
    • /
    • v.12 no.1
    • /
    • pp.134-140
    • /
    • 2004
  • Semi-crystalline poly(ethylene terephthalate) (PET) film surfaces were modified with argon and oxygen plasmas by radio-frequency (RF) glow discharge at 240 mTorr/40 W; the changes in topography and surface structure were investigated by atomic force microscopy (AFM) in conjunction with specular reflectance of infrared microspectroscopy (IMS). Under our operating conditions, analysis of the AFM images revealed that longer plasma treatment results in significant ablation on the film surface with increasing roughness, regardless of the kind of plasma used. The basic topographies, however, were different depending upon the kind of gas used. The specular reflectance analysis showed that the ablative mechanisms of the argon and oxygen plasma treatments are entirely different with one another. For the Ar-plasma-treated PET surface, no observable difference in the chemical structure was observed before and after plasma treatment. On the other hand, the oxygen-plasma-treated PET surface displays a significant decrease in the number of aliphatic C-H groups. We conclude that a constant removal of material from the PET surface occurs when using the Ar-plasma, whereas preferential etching of aliphatic C-H groups, with respect to, e.g. , carbonyl and ether groups, occurs upon oxygen plasma.

An Approach to Measurement of Water Quality Factors and its Application Using NOAA satellite Data

  • Jang, Dong-Ho;Jo, Gi-Ho;Chi, Kwang-Hoon
    • Proceedings of the KSRS Conference
    • /
    • 1999.11a
    • /
    • pp.363-370
    • /
    • 1999
  • Remotely sensed data is regarded as a potentially effective data source for the measurement of water quality and for the environmental change of water bodies. In this study, we measured the spectral reflectance by using multi-spectral image of low resolution camera(LRC) which will be loaded in the OSMI multi-purpose satellite(KOMPSAT) scheduled to be launched on 1999 to use the data in analyzing water pollution. We also investigated the possibility of extraction of water quality factors in water bodies by using remotely sensed low resolution data such as NOAA/AVHRR. In this study, Shiwha-District and Sang-Sam Lake was set up as the subject areas for the study. In this part of the study, we measured the spectral reflectance of the water surface to analyze the radiance of the water bodies in low resolution spectral band and tried to analyze the water quality factors in water bodies by using radiance feature from another remotely sensed data such as NOAA/AVHRR. As the method of this study, first, we measured the spectral reflectance of the water surface by using SFOV( Single Field of View) to measure the reflectance of water quality analysis from every channel in LRC spectral band(0.4~O.9${\mu}{\textrm}{m}$). Second, we investigated the usefulness of ground truth data and the LRC data by measuring every spectral reflectance of water quality factors. Third, we analyzed water quality factors by using the radiance feature from another remotely sensed data such as NOAA/AVHRR. We carried out ratio process of what we selected Chlorophyll-a and suspended sediments as the first factors of the water quality. The results of the analysis are below. First, the amount of pollutants of Shiwha-Lake has been increasing every you since 1987 by factors of eutrophication. Second, as a result of the reflectance, Chlorophyll-a represented high spectral reflectance mainly around 0.52${\mu}{\textrm}{m}$ of green spectral band, and turbidity represented high spectral reflectance at 0.57${\mu}{\textrm}{m}$. But suspended sediments absorbed high at 0.8${\mu}{\textrm}{m}$. Third, Chlorophyll-a and suspended sediments could have a distribution chart as a result of the water quality analysis by using NOAA/AVHRR data.

  • PDF

Image segmentation by fusing multiple images obtained under different illumination conditions (조명조건이 다른 다수영상의 융합을 통한 영상의 분할기법)

  • Chun, Yoon-San;Hahn, Hern-Soo
    • Journal of Institute of Control, Robotics and Systems
    • /
    • v.1 no.2
    • /
    • pp.105-111
    • /
    • 1995
  • This paper proposes a segmentation algorithm using gray-level discontinuity and surface reflectance ratio of input images obtained under different illumination conditions. Each image is divided by a certain number of subregions based on the thresholds. The thresholds are determined using the histogram of fusion image which is obtained by ANDing the multiple input images. The subregions of images are projected on the eigenspace where their bases are the major eigenvectors of image matrix. Points in the eigenspace are classified into two clusters. Images associated with the bigger cluster are fused by revised ANDing to form a combined edge image. Missing edges are detected using surface reflectance ration and chain code. The proposed algorithm obtains more accurate edge information and allows to more efficiently recognize the environment under various illumination conditions.

  • PDF

A Fundamental Study on the Changes of Coefficients of Utilization by Surface Reflectance and Photometry (공간 반사율 및 배광에 따른 이용률 변화에 관한 기초적 연구)

  • Kim, Yu-Sin;Park, Byoung-Chul;Jeong, Keun-Young;Choi, An-Seop
    • Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
    • /
    • 2008.05a
    • /
    • pp.101-106
    • /
    • 2008
  • Zonal cavity method, which is a kind of the lumen method, is used the calculation of the average illuminance on the workplane in an interior. Important factors of the method are cavity ratio, coefficient of utilization, and light loss factor. A Coefficient of Utilization varies with a kind of luminaires and is affected by surface reflectance of space. For this, the data from Coefficient of Utilization computation were analyzed with the same lumens and different photometry. This paper analyzes the changes of Coefficients of Utilization on the photometry of luminaires and surface reflectance of space.

  • PDF

Variation of Electric Properties Depending on Isotropic and Anisotropic Texturing of Solar Cell (등방성 에칭과 이방성 에칭이 태양전지 셀의 전기적인 특성에 미치는 효과)

  • Oh, Teresa
    • Journal of the Semiconductor & Display Technology
    • /
    • v.10 no.4
    • /
    • pp.31-35
    • /
    • 2011
  • For high efficiency of Si-cells, Si wafers were textured by the KOH and NaOH etching solution to decreas the reflectance at surfaces of the cells. The textured surfaces were shown various types such as isotropic and anisotropic depending on the etching solution. The reflectance at sample of an anisotropic form with pyramid type was lower than that of isotropic form. The surface with isotropic form of general tiny circles on the surface increased the efficiency, however, the reflectance of it was increased. The efficiency was increased on surface with low roughness.

Micromachined Properties of a polyimide by a femtosecond laser (펨토초 레이저에 의한 폴리이마이드 가공 특성)

  • Min, Chul-Ki;Lee, Man-Seop
    • Laser Solutions
    • /
    • v.11 no.2
    • /
    • pp.20-25
    • /
    • 2008
  • Polyimide is one of the useful materials in industry. The surface treatment of polyimide by a femtosecond laser can help accurate and fine fabrication of microstructure. And it can change the transmittance and reflectance of polyimide, too. We put femtosecond laser pulses on polyimide for rectangular or square type surface treaments and observe the change of transmittance and reflectance. Pulsewidth is 172 fs, laser power changes for fabrication are from 5 mW to 20 mW, and transmittance and reflectance are measured under 20m W, 300m W, and 920 mW. Pulse patterning is stable and almost no unwanted surface damage is shown. As power increases, working depth increases but working line width does not increase significantly. As speed changes, they also have same results. It shows the efficiency of a femtosecond laser is good and thermal damage is small for polyimide.

  • PDF

Local Validation of MODIS Global Leaf Area Index (LAI) Product over Temperate Forest

  • Kim, Sun-Hwa;Lee, Kyu-Sung
    • Korean Journal of Remote Sensing
    • /
    • v.19 no.1
    • /
    • pp.1-9
    • /
    • 2003
  • MODIS LAI product has been one of key variable for analyzing the quantitative aspects of terrestrial ecology at global scale. This study was designed to validate MODIS global LAI product for regional application. To examine the quality of MODIS LAI data, we developed a reference LAI surface that was derived by relating the ground LAI measurements to Landsat ETM+ reflectance. The study area, the Kwangneung Experiment Forest in Korea, covers mixed deciduous and coniferous species of temperate forest. Ground measurements of LAI were conducted at 30 sample plots by using a photo-optical instrument during the growing season of 2002. Ground measured LAI data were then related to the ETM+ reflectance to produce a continuous map of LAI surface over the study area. From the comparison between the MODIS LAI and the reference LAI, it was found that the MODIS LAI values were slightly higher at the forestland. Considering the limitations of producing the reference LAI surface and the uncertainty of the input variable for the MODIS LAI algorithm, such small discrepancy mal not be significant.