• Title/Summary/Keyword: Surface probing

Search Result 81, Processing Time 0.031 seconds

Probing of Surface Potential Using Atomic Force Microscopy

  • Kwon, Owoong;Kim, Yunseok
    • Applied Microscopy
    • /
    • v.44 no.3
    • /
    • pp.100-104
    • /
    • 2014
  • As decreasing device size, probing of nanoscale surface properties becomes more significant. In particular, nanoscale probing of surface potential has paid much attention for understanding various surface phenomena. In this article, we review different atomic force microscopy techniques, including electrostatic force microscopy and Kelvin probe force microscopy, for measuring surface potential at the nanoscale. The review could provide fundamental information on the probing method of surface potential using atomic force microscopy.

Probing and Control of Surface Polarization Phenomena in Molecular Films for Organic Electronics

  • Iwamoto, Mitsumasa
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 2007.06a
    • /
    • pp.3-4
    • /
    • 2007
  • Orientational ordering of polar molecules and excess charges at the interface are main origins of surface polarization. For organic electronics, probing and control of these two surface polarization phenomena are key issues. In this presentation, I report a novel electrical measurement that can directly probe orientational dipolar motion in surface monolayers by Maxwell-displacement-current, and also report a novel optical technique that allows carrier motions in organic materials by measuring the optical second harmonic signals activated by the electric field. Then I discuss how the control of dipolar motions and carrier motions are linked to organic electronics applications such as organic field effect transistors.

  • PDF

An optical sensor of a probing system for inspection of PCBs (인쇄회로기판 검사용 프로브시스템의 광학센서)

  • 심재홍;조형석;김성권
    • 제어로봇시스템학회:학술대회논문집
    • /
    • 1997.10a
    • /
    • pp.1742-1745
    • /
    • 1997
  • We have developed a highly responsible probing system for inspection of electrical properties of assemble PCB$_{s}$ (printed circuit boards). However, as the duration of the impact occurring between a probe and a solder joint on PCB is very short, it is very difficult to control the harmful peak impact force and the slip motion of the probe to sufficient level only by its vorce feedback control with high gains. To overcome these disadvantages of the prototype, it needs ot obtain some information of the solder joint in advance before the contact. In addition, to guarantee the reliability of the probing task, the probing system is required to measure several points around the probale target point at high speed. There fore, to meet such requirements, we propose a new noncontaet sensor capable of detecting simultaneously position and normal vectors of the multiple points around the probable target point in real time. By using this information, we can prepare a control strategy for stable contact motion on impact. In this paper, we described measuring priniciple, design, and development of the sensor. The effectiveness of the proposed sensor is verified through a series of experiments.s.

  • PDF

The comparison of clinical changes during maintenance phase after non-surgical or surgical therapy of chronic periodontitis (만성 치주염에서 비외과적 또는 외과적 치주치료 후 유지관리기 동안 임상적 변화의 비교)

  • Kim, Jee-Hyun;Chung, Hyun-Ju
    • Journal of Periodontal and Implant Science
    • /
    • v.36 no.1
    • /
    • pp.69-84
    • /
    • 2006
  • Reports on the comparison of clinical effect between non-surgical and surgical therapy, and the change of the clinical parameters during maintenance phase have been rarely presented in Korea. This study was to observe the clinical changes during maintenance phase of 6 months in patients with chronic periodontitis treated by non-surgical or surgical therapy in Department of Periodontics, Chonnam National University Hospital. Among the systemically healthy and non-smoking patients with moderate to severe chronic periodontitis, twenty eight patients (mean age: 47.5 years) treated by non-surgical therapy (scaling and root planning) and nineteen patients (mean age: 47.3 years) treated by surgical therapy (flap surgery) were included in this study. The periodontal supportive therapy including recall check and oral hygiene reinforcement was started as maintenance phase since 1 month of healing after treatment. Probing depth, gingival recession. clinical attachment level and tooth mobility were recorded at initial, baseline and 1, 2, 3 and 6 month of maintenance phase. The clinical parameters were compared between the non-surgical and surgical therapies using Student t-test and repeated measure ANOVA by initial probing depth and surfaces. Surgical therapy resulted in greater change in clinical parameters than non-surgical therapy. During the maintenance phase of 6 months, the clinical effects after treatment had been changed in different pattern according to initial probing depth and tooth surface. During maintenance phase, probing depth increased more and gingival recession increased less after surgical therapy, compared to non-surgical therapy. The sites of initial probing depth less than 3 mm lost more clinical attachment level, and the sites of initial probing depth more than 7 mm gained clinical attachment level during maintenance phase after non-surgical therapy, compared to surgical therapy. Non-surgical therapy resulted in greater reduction of tooth mobility than surgical therapy during maintenance phase. These results indicate that the clinical effects of non-surgical or surgical therapy may be different and may change during the maintenance phase.

Direct Electrical Probing of Rolling Circle Amplification on Surface by Aligned-Carbon Nanotube Field Effect Transistor

  • Lee, Nam Hee;Ko, Minsu;Choi, Insung S.;Yun, Wan Soo
    • Bulletin of the Korean Chemical Society
    • /
    • v.34 no.4
    • /
    • pp.1035-1038
    • /
    • 2013
  • Rolling circle amplification (RCA) of DNA on an aligned-carbon nanotube (a-CNT) surface was electrically interfaced by the a-CNT based filed effect transistor (FET). Since the electric conductance of the a-CNT will be dependent upon its local electric environment, the electric conductance of the FET is expected to give a very distinctive signature of the surface reaction along with this isothermal DNA amplification of the RCA. The a-CNT was initially grown on the quartz wafer with the patterned catalyst by chemical vapor deposition and transferred onto a flexible substrate after the formation of electrodes. After immobilization of a primer DNA, the rolling circle amplification was induced on chip with the a-CNT based FET device. The electric conductance showed a quite rapid increase at the early stage of the surface reaction and then the rate of increase was attenuated to reach a saturated stage of conductance change. It took about an hour to get the conductance saturation from the start of the conductance change. Atomic force microscopy was used as a complementary tool to support the successful amplification of DNA on the device surface. We hope that our results contribute to the efforts in the realization of a reliable nanodevice-based measurement of biologically or clinically important molecules.

Practical Silicon-Surface-Protection Method using Metal Layer

  • Yi, Kyungsuk;Park, Minsu;Kim, Seungjoo
    • JSTS:Journal of Semiconductor Technology and Science
    • /
    • v.16 no.4
    • /
    • pp.470-480
    • /
    • 2016
  • The reversal of a silicon chip to find out its security structure is common and possible at the present time. Thanks to reversing, it is possible to use a probing attack to obtain useful information such as personal information or a cryptographic key. For this reason, security-related blocks such as DES (Data Encryption Standard), AES (Advanced Encryption Standard), and RSA (Rivest Shamir Adleman) engines should be located in the lower layer of the chip to guard against a probing attack; in this regard, the addition of a silicon-surface-protection layer onto the chip surface is a crucial protective measure. But, for manufacturers, the implementation of an additional silicon layer is burdensome, because the addition of just one layer to a chip significantly increases the overall production cost; furthermore, the chip size is increased due to the bulk of the secure logic part and routing area of the silicon protection layer. To resolve this issue, this paper proposes a practical silicon-surface-protection method using a metal layer that increases the security level of the chip while minimizing its size and cost. The proposed method uses a shift register for the alternation and variation of the metal-layer data, and the inter-connection area is removed to minimize the size and cost of the chip in a more extensive manner than related methods.

Design and Performance Evaluation of the Resistive V-Dipole for Surface and Subsurface Probing (지표 및 지하 탐사를 위한 저항성 V 다이폴의 디자인과 성능에 대한 연구)

  • Kim, Kang-Wook;Scott, Waymond R. Jr.
    • 한국지구물리탐사학회:학술대회논문집
    • /
    • 2006.06a
    • /
    • pp.281-284
    • /
    • 2006
  • The resistive V dipole (RVD) is a V antenna with both arms loaded with the continuous Wu-King resistive profile. The RVD has many advantages for surface and subsurface probing, such as the ability to radiate a short pulse in a desired direction. The radiated pulse is simply related to the input pulse, e.g., derivative. In addition, it mostly eliminates the multiple reflections between the surface of the ground and the antenna because of its low radar cross section. The drawbacks of the RVD include the high input impedance and the difficulty in implementation. This paper presents ways to improve the accuracy and easiness of the implementation and to improve the low-frequency performance while maintaining the characteristics of the V antenna that are good for probing applications. The implemented antenna is used to form a bistatic radar to scan targets underground, and the result is imaged.

  • PDF

Surface Dynamics using Coherent X-rays : X-ray Photon Correlation Spectroscopy (코히런트한 X-선을 이용한 표면 거동 연구)

  • Kim Hyeon Jeong
    • Proceedings of the Optical Society of Korea Conference
    • /
    • 2003.02a
    • /
    • pp.22-23
    • /
    • 2003
  • The new method of x-ray photon correlation spectroscopy (XPCS) [1] is developed recently for probing the dynamics of surface height fluctuations as a function of lateral length scale. Measurements were performed on supported polystyrene (PS) films of thicknesses varying from 84 to 333 nm at temperatures above the PS glass transition temperature. Within a range of wave vectors spanning $10^{-3}$ to $10^{-2}$ $nm^{-1}$, good agreement is found between the measured surface dynamics and the theory of overdamped thermal capillary waves on thin films. Quantitatively, the data can be accounted for using the viscosity of bulk PS. (omitted)

  • PDF