• 한국전기전자재료학회논문지
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• 제13권1호
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• pp.21-27
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• 2000

We used the surface photovoltage spectroscopy(SPVS) for characterization of GaAs/Al\ulcornerGa\ulcornerAs multi-quantum well(MQW) structures grown by molecular beam epitaxy(MBE) method. Energy gap related transitions in GaAs and AlGaAs were observed. The Al composition(x=0.3) was determined by Sek's composition formula. Transition energies in MQW were determined using the differential surface photo-volatage spectroscopy)DSPVS) of the measured resonanced. In order to indentify the transitions, the experimentally observed energies were compared with results of the envelope function approximation for a rectangular quantum well. We have observed and interesting behavior of the temperature dependence(80K~300K) of the 11Hand 11L transition for sample.

• 대한화학회지
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• 제28권4호
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• pp.251-258
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• 1984

색소를 흡착시킨 산화아연의 표면상태를 광기전력측정법을 이용하여 색소증감기구 및 바인더(binder)효과에 대한 연구를 수행하였다. 산화아연의 에너지트랩준위는 1.12eV이며, 색소흡착에 의해 0.99eV로 에너지준위가 낮아짐을 알았다. 바인더효과는 표면광기전력의 효율을 커지게 하나 에너지트랩준위에는 변화를 주지 않는다. 또한 색소증감기구로 흡착력이 강한 산형색소는 전자 이동(electron transfer)이며, 산화아연 고유흡수광에 減感작용이 있는 나트륨염형색소는 에너지이동(energy transfer)로써 추측된다. 근적외부인 1,100~1,350nm에 걸쳐 광기전력감도가 나타나므로 적외선에 의한 전자사진용 畵像材料로서 가능성을 제시하였다.

• 한국재료학회지
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• 제11권8호
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• pp.655-660
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• 2001

Metalorganic chemical vapor deposition (MOCVD)으로 성장한 $In_{0.5}$ ($Gal_{1-x}$ $Al_{x}$ )0.5P/GaAS 이중 이종접합 구조의 특성을 표면 광전압 (surface Photovoltage ; SPV) 측정으로 연구하였다. $In_{0.5}$($Gal_{1-x}$ $Al_{x}$ )0.5P/GaAS 이중 이종접합 구조의 SPV 측정값을 Lorentzian 피팅한 띠 간격에너지 ($E_{0}$ ) 값과 조성비 (x)로 구한 이론 값이 잘 일치하였다. 그리고 변조 주파수 의존성을 측정한 결과 SPV 신호의 형태는 변하지 않고, 신호의 크기만이 변하는 것은 광 조사에 따른 전기적 상태의 과도 현상에 따른 것이고, GaAs와 InGaAlP의 특성시간의 차이는 광 캐리어의 수명의 차이로 분석된다. 그리고 온도 의존성 측정으로 $In_{0.5}$ /($Gal_{1-x}$ $Al_{x}$ )0.5P/GaAS 이중 이종 접합 시료의 균일한 변형분포와 계면상태가 양호함을 알 수 있었다.

• Bulletin of the Korean Chemical Society
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• 제31권11호
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• pp.3093-3098
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• 2010

The core-shell $SnO_2$@AO (A=Ni, Cu, Zn and Mg) films were prepared and the effects of coatings on photovoltaic properties were investigated. Studies on X-ray photoelectron spectroscopy, energy dispersive X-ray analysis and transmission electron microscopy showed the formation of divalent oxides on the surface of $SnO_2$ nanoparticles. It was commonly observed that all the dye-sensitized core-shell films exhibited higher photovoltage than the bare $SnO_2$ film. Transient photovoltage measurements confirmed that the improved photovoltages were related to the decreased time constants for electron recombination.

• Bulletin of the Korean Chemical Society
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• 제35권4호
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• pp.1177-1181
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• 2014

A 2D grid-like (4, 4)-connected topology coordination polymer, $[Co(BTA)_2(H_2O)_2]_n$ (1), where HBTA = 2-(1H-benzotriazol-1-yl)acetic acid, has been synthesized by hydrothermal method and characterized by single crystal X-ray diffraction, IR spectroscopy, elemental analysis and surface photovoltage spectroscopy (SPS). X-ray diffraction analyses indicated that 1 displays octahedral metal centers with secondary building units (SBUs) [$Co(BTA)_2(H_2O)_2$] bridged by the $BTA^-$ ligands. In the crystal, the 2D supramolecular architecture is further supported by $O-H{\cdots}O$, $O-H{\cdots}N$, $C-H{\cdots}O$ hydrogen bonds and ${\pi}{\cdots}{\pi}$ stacking interactions. The SPS of polymer 1 indicates that there are positive response bands in the range of 300-600 nm showing photo-electric conversion properties. There are good relationships between SPS and UV-Vis spectra.

• 한국진공학회지
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• 제8권4A호
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• pp.403-409
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• 1999

The surface state of Ar plasma-exposed Fe doped SI-InP have been investigated by photoreflectance (PR). From Ar plasma-exposed InP with 30 W for 10sec, the PR signals include a peak $(E_{Ar})$ that is located at 1.336 eV. We think that this peak was originated shallow level related to $V_In-V_P$. And we compared this level with the level obtained by surface photovoltage spectroscopy (SPV) measurement. The result of the PR agrees well with that from SPV. Additionally, Ar plasma induced phosphorus vacancy is related to shallow level. Therefore, the change of surface electric field are attributed to the shallow level. This level is caused by the existence of phsophorus vacancy on InP surface.