• Korean Journal of Remote Sensing
• /
• v.24 no.5
• /
• pp.427-436
• /
• 2008

This paper presents radar remote sensing of soil moisture and surface roughness for vegetated surfaces. A precise volume scattering model for a vegetated surface is derived based on the first-order radiative transfer technique. At first, the scattering mechanisms of the scattering model are analyzed for various conditions of the vegetation canopies. Then, the scattering model is simplified step by step for developing an appropriate inversion algorithm. For verifying the scattering model and the inversion algorithm, the polarimetric backscattering coefficients at 1.85 GHz, as well as the ground truth data, of a tall-grass field are measured for various soil moisture conditions. The genetic algorithm is employed in the inversion algorithm for retrieving soil moisture and surface roughness from the radar measurements. It is found that the scattering model agrees quite well with the measurements. It is also found that the retrieved soil moisture and surface roughness parameters agree well with the field-measured ground truth data.

• Korean Journal of Optics and Photonics
• /
• v.13 no.3
• /
• pp.209-214
• /
• 2002

The effect of surface roughness on mirror scattering has been studied. Five kinds of substrates with different surface roughness were fabricated. On those substrates, a dielectric multi-layer coating with high reflectivity was deposited by ion beam sputtering and electron beam evaporation. A total integrated scattering measurement set-up was built for the evaluation of deposited samples. Most of the ion beam sputtered mirrors showed lower scattering than the electron beam evaporated one, which deposited on substrates similar in surface roughness. Over ~2 $\AA$ in surface roughness, scattering strongly depend on the micro-structure of the super-polished surface. The lowest scattering we have achieved is 2.06 ppm by ion beam sputtering from the substrate with surface roughness of 0.23 $\AA$.

• Transactions of the Korean Society of Mechanical Engineers
• /
• v.16 no.2
• /
• pp.267-280
• /
• 1992

This paper describes a numerical analysis of the light scattering patterns of roughness profiles. This analysis was based upon the light scattering theory developed by Beckmann. In the analysis, the roughness profile was regarded as a profile whose irregularities depend on the production process and the shape of cutting tool. Generally, waviness of an actual surface seriously distorts the scattered pattern of roughness profile. In order to avoid the effects of waviness of actual surfaces, several theoretically calculated scattering patterns, instead of actual scattering patterns, were used to analyze the scattering patterns of typical engineering roughness profiles. The characteristics of the light scattering patterns for five model surfaces were studied.

• Journal of the Korea Institute of Military Science and Technology
• /
• v.2 no.2
• /
• pp.157-165
• /
• 1999

Production and measurement of a super-polished few-ppm-scattering mirror substrate are investigated. In order to improve the surface roughness directly determining scattering, the super-polishing process using Bowl-Feed technique is tried. The surface quality of the super-polished substrate is estimated by the phase-measuring interferometer. For the reliable roughness measurement using the interferometer, data averaging method is applied so that the optimal data averaging condition, 30 phase-data averaging and 20 intensity-data averaging, minimizing the measurement error is experimently searched. Based on the optimal data averaging condition, surface roughness of home-made mirror substrate is measured to be less than $0.5{\AA}$ rms corresponding to 2-ppm total-integrated-scattering.

• Transactions of the Korean Society of Mechanical Engineers A
• /
• v.35 no.1
• /
• pp.107-114
• /
• 2011

In this study, a correlation between the roughness of nanoscale lapping surface and its laser scattering pattern has been identified experimentally. The characteristics of laser scattering on a reflected surface are investigated, and a laser scattering mechanism is newly designed by adopting the dark-field method. Laser scattering patterns resulting from nanoscale lapping shape are in the shape of crossed irregular lattice. In addition, optimum laser scattering images are obtained by the design of experiment, and the roughness of nanoscale lapping surface is estimated using regression analysis certain useful features of the laser scattering patterns. The results of fifty experiments on three types of nanoscale lapping surfaces show that the roughness of nanoscale lapping surfaces can be accurately estimated by the proposed mathematical modeling method.

• Transactions of the Korean Society of Mechanical Engineers A
• /
• v.34 no.1
• /
• pp.35-41
• /
• 2010

In this paper, surface roughness has been experimentally identified using laser scattering images. The parameters and optical deflected rays of laser scattering are investigated on laser scattering system, and then their optimum parameters on grinding surfaces are selected using design of experiment. The application of the optimum parameters results in featured laser scattering images, in which the mean of vertical scattering distributions is regarded as a feature. It is shown that the feature of laser scattering distributions is linearly increased according to grinding surface roughness and so the information can be used as important factor for the measurement and evaluation of various surface roughness. In the future, the performance of the proposed laser scattering method will be evaluated using AFM.

• Proceedings of the Korean Society for Technology of Plasticity Conference
• /
• 2003.05a
• /
• pp.397-401
• /
• 2003

In this work, diamond turning process is used to produce mirror surface on a Al cone. The Al cone as used as a mirror which can reflect a laser beam without scattering and, hence, it is critical to minimize the surface roughness of a Al cone. During diamond turning, feedrate and tool nose radius are changed to investigate characteristics of the ultra precision machined surface of a Al cone. A laser beam of 633 nm is applied to examine the effect of surface roughness on the characteristics of reflectivity. It is found that surface roughness is not significantly affected by feedrate. The main factor influencing surface roughness is tool nose radius. The line patterns of reflected laser beams show that the minimum surface roughness of 0.08 $\mu\textrm{m}$ (Ra) is required to avoid scattering phenomena of reflectivity.

• Journal of the Korean Society for Precision Engineering
• /
• v.11 no.6
• /
• pp.168-178
• /
• 1994

This paper presents an optical surface roughness sensor developed for intermediate- process measurement on the machine. The light scattering method is adopted for the sensor, which is designed conpact and flexible enough to apply to 'on the machine' measurement of surface roughness. The developed sensor has special features such that it makes use, as the measurement parameter, of the ratio between fluxes of the incident light, and the specularly and partly diffusely reflected light, and that it can adjust the incident light angle. The experimental investigation reveals not only the sensor has good performance as a surface roughness sensor but the sensor is very robust so as to be useful in in-process measurement.

• Proceedings of the Optical Society of Korea Conference
• /
• 2007.07a
• /
• pp.187-188
• /
• 2007

Four kinds of mirror substrates with same surface roughness were fabricated. On those substrates, a dielectric multi-layer coating with high reflectivity was deposited by ion beam sputtering technique. Most of the fused silica mirrors showed lower scattering than the ZERODUR mirrors one, which deposited on substrates similar in surface roughness. The ZERODUR mirrors scattering strongly depend on the micro-structure of $Ta_2O_5/SiO_2$ thin films wear deposited on ZERODUR substrates.

• Korean Journal of Optics and Photonics
• /
• v.9 no.2
• /
• pp.63-69
• /
• 1998

For detailed characterization of scattering losses occurring in VCSEL's distributed Bragg reflectors, we performed scattering experiment and obtained the information about surface roughness through the analysis of a modified transmission matrix method. The various wafers grown for VCSELs were used for the scattering experiment. The fractal surface assumption and extrapolation is used to estimate the scattered intensity near specular angle. The modified transmission matrix method employed in the analysis considers the scattering loss at each interface and calculates the reflectivity efficiently and easily. As a result, the surface roughness ranges from $4{\AA}$ to $10{\AA}$ The reduction of reflectivity due to the scattering amounts to 0.26% in case of $10{\AA}$ roughness.