• Journal of Magnetics
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• 제12권2호
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• pp.77-80
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• 2007

Recently there was a proposal for a spin filter by using the spin superlattice structure. In a certain energy range, the proposed structure exhibits a high spin filtering efficiency close to 100%. Unfortunately such energy range turns out to be narrow. In this paper, we report a method to widen the energy range by using an analogy to optical anti-reflection coating. In optics, it is well known that a stack of alternating layers of two dielectric materials can function as a highly transmissive or reflective filter for wide range of wavelength. Since electrons also have wave character as light, it would be possible to make an electronic analog of an optical filter. We demonstrate that alternating layers of two materials with different g-factors can function as a spin filter that allows electrons to be transmitted only when their spins point towards a certain particular direction. This spin-superlattice-based spin filter operates in wide energy ranges, curing the problem in the previous proposal.

• 한국재료학회지
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• 제10권7호
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• pp.478-481
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• 2000

$Pb(Mg_{1/3}Nb_{2/3})O_3$의 $Pb_{2+}$ 자리에 치환되어 전자주게 역할을 하는 $La^3,\; Pr^{3+,4+},\; Nd^{3+},\; Sm^{3+}$ 등이 10mol% 첨가된 단일상의 $Pb(Mg_{1/3}Nb_{2/3})O_3$ 소결체를 합성하여 이들의 B자리 양이온 질서배열구조를 XRD와 TEM을 이용하여 분석하였다. 전자 주게가 첨가되지 않았을 때에는 XRD패턴에서 공간군 Pm3m에 해당하는 기본 회절선(fundamental reflection) 만 검출되었으나 전자 주게가 첨가된 경우에는 $Mg_{2+}$와 $Nb_{5+}$의 1:1 질서배열로 인하여 단위포의 체적이 8배가 되어(h/2 k/2 l/2)(h,k,l 모두 홀수) 조격자 회절선(superlattice reflection)이 검출되었다. TEM 제한시야회절패턴(selected area diffraction pattern)에서는 전자 주게의 첨가 여부에 관계없이 초격자 회절점이 검출되었으나 전자 주게가 첨가된 경우에 기본 회절점에 대한 초격자 반사점의 상대적인 강도가 현저히 증가하였다. TEM 암시양상(dark field image)에서는 전자 주게가 첨가되었을 때에만 반상경계(antiphase boundary)가 관찰되었다. 이로부터 전자 주게인 $La^3,\; Pr^{3+,4+},\; Nd^{3+},\; Sm^{3+}$등이 $Pb_{2+}$를 치환함에 따라 $Pb(Mg_{1/3}Nb_{2/3})O_3$의 B자리 양이온 1:1 질서배열이 강화됨을 실험적으로 증명하였다. 얻어진 결과는 전하보상기구에 근거하여 해석하였다.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2000년도 하계학술대회 논문집 C
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• pp.1664-1666
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• 2000

The structural and microwave properties of Ba($Mg_{1/3}Ta_{2/3})O_3$-Ba($Co_{1/3}Nb_{2/3})O_3$ ceramics were investigated with composition ratio. The specimens were sintered at 1525$^{\circ}C$ for 5 hours in air. All specimens exhibited superlattice reflection planes of (100), (111), (200), (201), and (112). Increasing mole ratio of BCN ceramics, the peak intensity of superstructure reflection plane were decreased, while dielectric constant was slightly increased. The dielectric constant and quality factor of the 0.8BMT-0.2BCN ceramics were 27.51, 103,681 [at 1GHz], respectively.

• Bulletin of the Korean Chemical Society
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• 제13권2호
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• pp.122-127
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• 1992

Some perovskites $A($Cu_{1}3}Nb_{2}3}$)O_3(A=$Sr^{2+}$$, $Ba^{2+}$ and $Pb^{2+}$) and their series of mixed perovskites have been prepared by solid state reaction. Single perovskite phase was obtained in Sr or Ba rich samples, but pyrochlore phase was found in Pb rich samples. The stability of perovskite phase is dependent on the ionicity of bonding as well as the tolerance factor. All the obtained perovskites have tetragonal symmetry distorted by Jahn-Teller effect of $Cu^{2+}$. In the case of $Sr(Cu_{1}3}Nb_{2}3})O_3$, some superlattice lines caused by threefold enlarging of fundamental unit cell were observed. And, the symmetry of B site octahedron and the bonding character of B-O bond have been studied by IR, ESR and diffuse reflection spectroscopy. It appeared that the symmetry and the bonding character are influenced by such factors as the size and the basicity of A cation.

• 한국세라믹학회지
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• 제34권2호
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• pp.175-180
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• 1997

새로운 복합페로브스카이트계 고용체 (1-x)Ba(Mg1/3Ta2/3)O3-xLa(Mg2/3Ta1/3)O3(x=0.0-1.0)를 설계하고 조성에 따른 고용체의 결정구조의 변화 및 MPB(Morphotropic Phase Boundary)를 분말 XRD를 이용하여 분석하였다. 초격자회절선의 변화로부터 MBT에 10mol%의 LMT를 치환함에 따라 1:2에서 1:1로의 규칙화타입의 전이가 일어남을 알 수 있었다. 면심입방정구조 영역(0.10.8조성의 경우, 주회절선의 피이크분리 및 새로운 회절선들로부터 격자비틀림의 형태가 단사정임을 알 수 있었다.

• 한국결정성장학회:학술대회논문집
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• 한국결정성장학회 1996년도 The 9th KACG Technical Annual Meeting and the 3rd Korea-Japan EMGS (Electronic Materials Growth Symposium)
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• pp.508-508
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• 1996

;The growth of films have considerable interest in the field of superlattice structured multi-layer epitaxy led to realization of new devices concepts. Molecular beam epitaxy (MBE) with in situ observation by reflection high-energy electron diffraction (RHEED) is a key technology for controlled layered growth on the atomic scale in oxide crystal thin films. Also, the combination of radical oxygen source and MBE will certainly accelerate the progress of applications of oxides. In this study, the growth process of single crystal films using by MBE method is discussed taking the oxide materials of Bi-Sr-Ca-Cu family. Oxidation was provided by a flux density of activated oxygen (oxygen radicals) from an rf-excited discharge. Generation of oxygen radicals is obtained in a specially designed radical sources with different types (coil and electrode types). Molecular oxygen was introduced into a quartz tube through a variable leak valve with mass flowmeter. Corresponding to the oxygen flow rate, the pressure of the system ranged from $1{\;}{\times}{\;}10^{-6}{\;}Torr{\;}to{\;}5{\;}{\times}{\;}10^{-5}$ Torr. The base pressure was $1{\;}{\times}{\;}10^{-10}$ Torr. The growth of Bi-oxides was achieved by coevaporation of metal elements and oxygen. In this way a Bi-oxide multilayer structure was prepared on a basal-plane MgO or $SrTiO_3$ substrate. The grown films compiled using RHEED patterns during and after the growth. Futher, the exact observation of oxygen radicals with MBE is an important technology for a approach of growth conditions on stoichiometry and perfection on the atomic scale in oxide. The oxidization degree, which is determined and controlled by the number of activated oxygen when using radical sources of two types, are utilized by voltage locked loop (VLL) method. Coil type is suitable for oxygen radical source than electrode type. The relationship between the flux of oxygen radical and the rf power or oxygen partial pressure estimated. The flux of radicals increases as the rf power increases, and indicates to the frequency change having the the value of about $2{\times}10^{14}{\;}atoms{\;}{\cdots}{\;}cm^{-2}{\;}{\cdots}{\;}S^{-I}$ when the oxygen flow rate of 2.0 seem and rf power 150 W.150 W.