• Title/Summary/Keyword: Substrate-heating

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A New Technology for Strengthening Surface of Forging Die

  • Xin Lu;Zhongde Liu
    • Proceedings of the Korean Society for Technology of Plasticity Conference
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    • 2003.10b
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    • pp.189-192
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    • 2003
  • The Electro-thermal Explosion Coating (EEC) technique is a new surface treatment technology emerged in recent years. It uses an electrical discharge (with very high voltage from 5 to 30 kV or more) to produce a pulse current with large density inside the material to be deposited, the metal wire undergo the heating, melting, vaporization, ionization and explosion processes in a very short time (from tens ns to several hundreds ${\mu}s$), and the melted droplets shoot at the substrate with a very high velocity (3000 - 4500 m/s), so that the coating materials can be deposited on the surface of the substrate. Coatings with nano-size grains or ultra- fine grains can be formed because of rapid solidification (cooling rate up to $10^6-10^9\;k/s$). Surface of the substrate (about $1-5{\mu}m$ in depth) can be melted rapidly and coatings with very high bonding strength can be obtained.

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A study on the AIN thin films fabricated by RF magnetron sputtering (RF Magnetron Sputtering 법으로 제조된 AIN 박막에 관한 연구)

  • 남창길;최승우;천희곤;조동율
    • Journal of the Korean Vacuum Society
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    • v.6 no.1
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    • pp.44-49
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    • 1997
  • AIN thin films were deposited on silicon and glass substrates by sputtering Al target and introducing mixed gases of argon and nitrogen into reactive RF magnetron sputter. The substrate was not heated to protect the PC (polycarbonate) substrate and the micro-sized pregroove morphology on the surface of PC substrate. But its temperature was around $100^{\circ}C$ due to the self-heating by plasma. The crystallinity, cross-section morphology and refractive index were characterized by changing various deposition parameters.

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Properties of AZO Thin Film deposited on the PES Substrate (PES 기판상에 증착된 AZO 박막의 특성)

  • Kim, Sang-Mo;Kim, Kyung-Hwan
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.20 no.12
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    • pp.1072-1076
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    • 2007
  • We prepared the Al doped ZnO (AZO) thin film on polyethersulfon (PES) without any substrate heating by Facing Targets Sputtering (FTS) system. FTS system has two different facing targets. One is ZnO doped the content of Al 2 wt% and the other is Zn in order to decrease resistivity. The electrical, structural and optical properties of AZO thin films were investigated. To evaluate the as-deposited thin film properties, we employed four-point probe (CMT-R100nw, Changmin), Surface profiler (Alpha-step, Tencor), UV/VIS spectrometer (HP), X-ray diffractometer (XRD, Rigaku) and Field Emission Scanning Electron Microscopy (FESEM, Hitachi S-4700). As a result, We obtained that AZO thin film deposited on PES substrate at a DC Power of 150 W, working pressure of 1 mTorr and $O_2$ gas flow ratio of 0.2 exhibited the resistivity of $4.2{\times}10^{-4}\;[{\Omega}cm]$ and the optical transmittance of about 85 % in the visible range.

A calculation on the Metal-Film Mixing by Intense Pulse Ion Beam (IPIB)

  • Le, X.Y.;Yan, S.;Zhao, W.J.;Wang, Y.G.;Xue, J.M.
    • Journal of the Korean Vacuum Society
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    • v.12 no.S1
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    • pp.74-78
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    • 2003
  • In this paper, we studied, by numerical calculation, a system, which was composed of metal-film and metal-substrate irradiated by IPIB with beam ion energy 250 keV, current density 10 to 250 A/$\textrm{cm}^2$. While the IPIB irradiation was going on, an induced effect named mixing occurred. In this case, metal-film and part of metal-substrate melted and mixed. The mixing state was kept as it was in melting phase due to the fast cooling rate. Our works were simulating the heating and cooling process via our STEIPIB program and tried to find proper parameters for a specific film-substrate system, 500 nmtitanium film coated on aluminum, to get best mixing results. The parameters calculated for such Ti-Al system were compared with the experimental results and were in good accordance to the experimental results.

CORROSION BEHAVIOR OF Al-Zn ALLOY AS A SACRIFICIAL ANODE OF ORV TUBES

  • Jin, Huh;Lee, Ho-Kyun;Lee, Jae-Ho
    • Journal of the Korean institute of surface engineering
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    • v.32 no.3
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    • pp.452-455
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    • 1999
  • ORV which vaporizes LNG to NG is consisted of tube and header whose substrate is aluminum alloy. The corrosion of the tube is very severe because of sea water being used as the heating source. In this research to protect ORV substrate material, the corrosion behavior of aluminum alloys was investigated for the sacrificial role of Al-Zn alloy for ORV tubes. The electrochemical behavior of aluminum alloys in sea water was investigated. The corrosion behavior of thermally-sprayed and cladded samples were compared through salt spray tests. Al-Zn alloy can act as a sacrificial anode and cladded Al-Zn alloy has a better corrosion resistance than that of thermally sprayed one. The galvanic effect of Al-Zn to substrate material was conformed from scratched sample tests.

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Performance of OLED Fabricated on the ITO Deposited by Facing Target Sputtering (대향식 스퍼터링법으로 증착된 ITO 양극 위에 제작된 OLED 성능)

  • Yoon, Chul;Kim, Sang-Ho
    • Journal of the Korean institute of surface engineering
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    • v.41 no.5
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    • pp.199-204
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    • 2008
  • Indium tin oxide (ITO) has been commonly used as an anode for organic light emitting diode (OLED), because of its relatively high work function, high transmittance, and low resistance. The ITO was mostly deposited by capacitive type DC or RF sputtering. In this study we introduced a new facing target sputtering method. On applying this new sputtering method, the effect of fundamental deposition parameters such as substrate heating and post etching were investigated in relation to the resultant I-V-L characteristics of OLED. Three kinds of ITOs deposited at room temperature, at $400^{\circ}C$ and at $400^{\circ}C$ with after surface modification by $O_2$ plasma etching were compared. The OLED on ITO deposited with substrate heating and followed by etching showed better I-V-L characteristics, which starts to emit light at 4 volts and has luminescence of $65\;cd/m^2$ at 9 volts. The better I-V-L characteristics were ascribed to the relevant surface roughness with uniform micro-extrusions and to the equi-axed micromorphology of ITO surface.

Fabrication and Characterization of Silicon Devices for Flow Measurement (II) (흐름측정용 실리콘 소자의 제작 및 특성 평가 (II))

  • Ju, B.K.;Ko, C.G.;Kim, C.J.;Tchah, K.H.;Oh, M.H.
    • Journal of Sensor Science and Technology
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    • v.3 no.1
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    • pp.12-18
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    • 1994
  • In this study, we fabricated and characterized a calorimetric-type flow sensing element using a micromachined silicon substrate. The cooling and heating effects resulted from the gas flow were measured by two temperature sensors located at both sides of the heating resistor, and the insulator diaphragm was employed as a substrate in order to improve thermal isolation. The sensor generated $0{\sim}378.4mV$ output signal under 10V bridge-applied voltage when the nitrogen gas was passed on the sensor surface having a mass flow rate of $0{\sim}0.25grs/min$, and reached to the stable operating condition within 10 seconds.

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Study of Temperature Uniformity Improvement of Inductive Heating in MOCVD Systems to Deposit White LED (백색 LED 증착용 MOCVD 장치에서 유도가열을 이용한 기판의 온도 균일도 향상에 관한 연구)

  • Hong, Kwang-Ki;Yang, Won-Kyun;Joo, Jung-Hoon;Lee, Seung-Ho;Lee, Tae-Wan
    • Journal of the Korean institute of surface engineering
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    • v.43 no.6
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    • pp.304-308
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    • 2010
  • Deposition temperature uniformity of GaN based MQW (multiple quantum well) layers is an important key which affects the wavelength uniformity of white LEDs. Temperature uniformity was assessed by infrared images for both cases of a static and a rotating susceptor. Rotating the susceptor at 2.5 rpm over the induction heater gave 4.3% of temperature non-uniformity. Temperature distribution of the graphite susceptor over the induction heater was numerically modelled and agreed with experimental results.

GaAs Epilayer Growth on Si(100) Substrates Cleaned by As/Ga Beam and Its RHEED Patterns (As과 Ga 빔 조사에 의해 세척된 Si(100) 기판 위에 GaAs 에피층 성장과 RHEED 패턴)

  • Yim, Kwang-Gug;Kim, Min-Su;Leem, Jae-Young
    • Journal of the Korean institute of surface engineering
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    • v.43 no.4
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    • pp.170-175
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    • 2010
  • The GaAs epitaxial layers were grown on Si(100) substrates by molecular beam epitaxy(MBE) using the two-step method. The Si(100) substrates were cleaned with different surface cleaning method of vacuum heating, As-beam, and Ga-beam at the substrate temperature of $800^{\circ}C$. Growth temperature and thickness of the GaAs epitaxial layer were $800^{\circ}C$ and 1 ${\mu}m$, respectively. The surface structure and epitaxial growth were observed by reflection high-energy electron diffraction(RHEED) and scanning electron microscope(SEM). Just surface structure of the Si(100) substrate cleaned by Ga-beam at $800^{\circ}C$ shows double domain ($2{\times}1$). RHEED patterns of the GaAs epitaxial layers grown on Si(100) substrates with cleaning method of vacuum heating, As-beam, and Ga-beam show spot-like, ($2{\times}4$) with spot, and clear ($2{\times}4$). From SEM, it is found that the GaAs epitaxial layers grown on Si(100) substrates with Ga-beam cleaning has a high quality.

Study of Phase Transition of Copper(II)-phthalocyanine using a Near Field Scanning Microwave Microscope (근접장 마이크로파 현미경을 이용한 Copper(II)-phthalocyanine의 Phase Transition 연구)

  • Park, Mie-Hwa;Yoo, Hyun-Jun;Yun, Soon-Il;Lim, Eun-Ju;Lee, Kie-Jin;Cha, Deok-Joon;Lee, Young-San
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.17 no.6
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    • pp.641-646
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    • 2004
  • We report the changes of the microwave reflection coefficients S$_{11}$ of copper(II)-phthalocyanine (CuPc) thin films by using a near-field microwave microscope(NSMM) in order to understand the phase transition of CuPc. For a NSMM system, a high-quality microstrip resonator coupled with a dielectric resonator was used. CuPc thin films were prepared on the pre-heated glass substrates using a thermal evaporation method. The reflection coefficients S$_{11}$ of CuPc thin films were changed by the dependence on the substrate pre-heating temperatures. By comparing reflection coefficient S$_{11}$ and crystal structures, we found the phase transition of CuPc thin films from $\alpha$-phase to $\beta$-phase at the substrate heating temperature 200 $^{\circ}C$./TEX>.