• The Journal of Korean Institute of Electromagnetic Engineering and Science
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• v.24 no.3
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• pp.316-323
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• 2013

This paper deals with the near-field to far-field calculation for far-field characteristics of antenna and electromagnetic compatibility(EMC) testing. Since the conventional EMC testing process is inefficient such as measurements of the wide band signals and mega structures, Stratton-Chu formula is used to predict the far-field emission by simple and direct process. The usefulness of Stratton-Chu formula is verified by comparing to the analytic solution of the uniform distribution aperture in free-space. In order to inspect the far-fields and to get the near-field values, full-wave simulation solver is utilized. Through the full-wave simulation about the patch antenna, calculated far-field results from Stratton-Chu formula are proven. The predicted magnitudes of the far-field are in error by less than 6 %.

• Journal of the Korean Institute of Telematics and Electronics
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• v.8 no.6
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• pp.17-24
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• 1971

All improved method of analysis is developed to determine the chsrateristics of a dielectric antenna of arbitrary shape. The analysis is based on scattering principles. The concept of polariaztion current and charge densities is incorporated into the Stratton-Chu formula and un integral equation is established for the electric field intensities in the dielectric. A new technique involving an equivalent spherical cell is developed to solve the integral equatioil numerically. The radiation characterstics of an omnidirectional dielectric antellna are determined based on the near field obtained by this volume cell technique.