• Proceedings of the Korean Reliability Society Conference
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• 2011.06a
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• pp.55-60
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• 2011

Recently, the application of electronics in vehicle is increasing, in order to assess the reliability of the electronics, highly accelerated life test is used, highly accelerated life test can assess the reliability of the electronics in the short time. In this study, optimized HALT technique can be applied to the electronics is proposed. The main results are as follows; i) HALT is proceed to the 8-step process. ii) The test mode of HALT is composed of the cold step stress, hot step stress, vibration step stress and combined environments stress. iii) The time dwell is set to at least 20 minutes.

• International Journal of Reliability and Applications
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• v.1 no.2
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• pp.155-165
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• 2000

In this paper, we propose some estimators of Kullback- Leibler Information functions using the data from three step stress accelerated life tests. This acceleration model is assumed to be a tampered random variable model. Some asymptotic properties of proposed estimators are proved. Simulations are performed for comparing the small sample properties of the proposed estimators under use condition of accelerated life test.

• Journal of the Korean Data and Information Science Society
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• v.17 no.4
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• pp.1375-1386
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• 2006

In life testing, the lifetimes of test units under the usual conditions are so long that life testing at usual conditions is impractical. Testing units are subjected to conditions of high stress to yield informations quickly. In this paper, the inferences of parameters on the three step-stress accelerated life testing are studied. The two-parameter exponential distribution with a failure rate function that a log-quadratic function of stress and the tempered failure rate model are considered. We obtain the maximum likelihood estimators of the model parameters and their confidence regions. A numerical example will be given to illustrate the proposed inferential procedures.

• Journal of the Korean Data and Information Science Society
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• v.26 no.1
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• pp.271-280
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• 2015

In this paper, the maximum likelihood estimators for parameters are derived under three step-stress accelerated life tests for Type-I hybrid censored data. The exponential distribution and the cumulative exposure model are considered based on the assumption that a log quadratic relationship exits between stress and the mean lifetime ${\theta}$. The test plan to search optimal stress change times minimizing the asymptotic variance of maximum likelihood estimators are presented. A numerical example to illustrate the proposed inferential procedures and some simulation results to investigate the sensitivity of the optimal stress change times by the guessed parameters are given.

• Journal of the Korean Data and Information Science Society
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• v.5 no.2
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• pp.87-94
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• 1994

In this paper, we consider optimum plan to determine stress change times under the three-step stress PALTs, assuming that each test units follows an exponential distribution. The tampered random variable(TRV) model for the three-step stress PALTs setup are introduced, and maximum likelihood estimators(MLEs) of the failure rate and the acceleration factors are obtained. The change times to minimize the generalized asymptotic variance(GAVR) of MLEs of the failure rate and the acceleration factors are proposed for the three-step stress PALTs.

• Journal of the Korean Data and Information Science Society
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• v.23 no.4
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• pp.843-850
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• 2012

The inferences of data obtained from periodic inspection and type I censoring for the three step stress accelerated life test are studied in this paper. The failure rate function that a log-quadratic relation of stress and the tampered failure rate model are considered under the exponential distribution. The optimal stress change times which minimize the asymptotic variance of maximum likelihood estimators of parameters is determined and the maximum likelihood estimators of the model parameters are estimated. A numerical example will be given to illustrate the proposed inferential procedures.

• International Journal of Reliability and Applications
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• v.15 no.2
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• pp.125-150
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• 2014

Accelerated life tests (ALTs) are extensively used to determine the reliability of a product in a short period of time. Test units are subject to elevated stresses which yield quick failures. ALT can be carried out using constant-stress, step-stress, progressive-stress, cyclic-stress or random-stress loading and their various combinations. An ALT with linearly increasing stress is ramp-stress test. Much of the previous work on planning ALTs has focused on constant-stress, step-stress, ramp-stress schemes and their various combinations where the stress is generally increased. This paper presents an optimal design of ramp soak-stress ALT model which is based on the principle of Thermal cycling. Thermal cycling involves applying high and low temperatures repeatedly over time. The optimal plan consists in finding out relevant experimental variables, namely, stress rates and stress rate change points, by minimizing variance of reliability function with pre-specified mission time under normal operating conditions. The Burr type XII life distribution and time-censored data have been used for the purpose. Burr type XII life distribution has been found appropriate for accelerated life testing experiments. The method developed has been explained using a numerical example and sensitivity analysis carried out.

• Communications for Statistical Applications and Methods
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• v.23 no.4
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• pp.269-285
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• 2016

In this paper, a simple step-stress accelerated life test (ALT) under progressive type-II censoring is considered. Progressive type-II censoring and accelerated life testing are provided to decrease the lifetime of testing and lower test expenses. The cumulative exposure model is assumed when the lifetime of test units follows an extension of the exponential distribution. Maximum likelihood estimates (MLEs) and Bayes estimates (BEs) of the model parameters are also obtained. In addition, a real dataset is analyzed to illustrate the proposed procedures. Approximate, bootstrap and credible confidence intervals (CIs) of the estimators are then derived. Finally, the accuracy of the MLEs and BEs for the model parameters is investigated through simulation studies.

• Journal of the Korean Society of Manufacturing Technology Engineers
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• v.7 no.5
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• pp.120-126
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• 1998

Second step shot peening was applied on both smooth specimen and U-notch specimen in order to investigate the stress distribution and the improvement in fatigue strength. Various experiments and measurements such as rotary bending fatigue test and the measurement of compressive residual stress were performed. The results showed that the fatigue strength of second step shot peened specimens increased by 34 percent compared to that of unpeened ones. Compressive residual stress also considerably increased, which resulted in the increase of fatigue strength. finite element analysis showed that shot peening is effective in decreasing the bending stress by external force. The effectiveness of shot peening in reducing the compressive residual stress was anticipated by the superposition of the concentrated stress and the compressive residual stress.

• Proceedings of the Korea Society for Industrial Systems Conference
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• 2009.05a
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• pp.107-113
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• 2009

This paper deals with noninformative priors for such as Jeffres' prior, reference prior and probability matching prior for scale parameter of exponential distribution when the data are collected in multiple step stress accelerated life tests. We find the noninformative priors for this model and show that the reference prior satisfies first order matching criterion. Using artificial data, we perform Bayesian analysis for proposed priors.