• The KIPS Transactions:PartA
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• v.10A no.1
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• pp.69-74
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• 2003

Accurate process control in the manufacturing industry is essential to survive in the competitive market. Statistical process control (SPC) system has been widely used to satisfy the ever-increasing quality control requirements. However, most commercial products in the market are not flexible, semi-automatic, and difficult to interface with other tools. In this paper, we propose an advanced rSPC (Real-Time SPC) system which is based on the web and supports XML protocol. We also provide a powerful graphic facility and an efficient file system to handle the data in real time. Even though the idea can be applied to any manufacturing system, our system is optimized to the semi-conductor industry and TFT/LCD industry. The system is implemented in C++ and COM/DCOM, and shows a good result.

• Journal of the Korea Safety Management & Science
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• v.4 no.3
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• pp.107-122
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• 2002

There are two approaches to process control. The one is engineering process control(EPC) which is one of the techniques very widely used in the process industry and based on control theory which aims at keeping the process on target using manipulating variable. The other is statistical process control(SPC) whose main purpose is to look for assignable causes(variability) in the process. To design an integrated or combined scheme of SPC and EPC is gaining recognition in the process experiences for hybrid industry. This paper aims to investigate recent study concerned on the integration of SPC and EPC. First, we consider the difference between SPC and EPC in simple terms and review various models of EPC for integration including evaluation of previous study. Finally, we suggest some prospective research area concerned on the integration of SPC and EPC.

• Smart Structures and Systems
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• v.14 no.3
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• pp.377-395
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• 2014

Vibration-based fault detection and condition monitoring of rotating machinery, using statistical process control (SPC) combined with statistical pattern recognition methodology, has been widely investigated by many researchers. In particular, the discrete wavelet transform (DWT) is considered as a powerful tool for feature extraction in detecting fault on rotating machinery. Although DWT significantly reduces the dimensionality of the data, the number of retained wavelet features can still be significantly large. Then, the use of standard multivariate SPC techniques is not advised, because the sample covariance matrix is likely to be singular, so that the common multivariate statistics cannot be calculated. Even though many feature-based SPC methods have been introduced to tackle this deficiency, most methods require a parametric distributional assumption that restricts their feasibility to specific problems of process control, and thus limit their application. This study proposes a nonparametric multivariate control chart method, based on multiscale wavelet scalogram (MWS) features, that overcomes the limitation posed by the parametric assumption in existing SPC methods. The presented approach takes advantage of multi-resolution analysis using DWT, and obtains MWS features with significantly low dimensionality. We calculate Hotelling's $T^2$-type monitoring statistic using MWS, which has enough damage-discrimination ability. A bootstrap approach is used to determine the upper control limit of the monitoring statistic, without any distributional assumption. Numerical simulations demonstrate the performance of the proposed control charting method, under various damage-level scenarios for a bearing system.

• Journal of Applied Reliability
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• v.10 no.1
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• pp.39-56
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• 2010

Statistical process control (SPC) is a powerful technique for monitoring, managing, analysing and improving the process performance. However, its has limitations such as lack of engineering, statistical skill and training, and lesser importance of activity. To solve the problems, this study proposes an intelligent SPC system using specified agents which are derived through analysis and evaluation of the SPC activities. The activities investigated by the relevant researches are categorized as collection, process analysis, diagnosis, detection, cause analysis and rule generation. Also, the evaluation criteria are established as feasibility of automation, frequency, level and time. The requirements of the agent functions are derived by the evaluation, and the types of customized agents are as data collection, store, analysis, diagnosis, monitoring, alarm and reporting. A prototype SPC system represents that the functions of the proposed agents are successfully validated.

• Proceedings of the Korean Statistical Society Conference
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• 2004.11a
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• pp.179-184
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• 2004

Statistical process control (SPC) and engineering process control (EPC) are based on different strategies for process quality improvement. SPC reduces process variability by detecting and eliminating special causes of process variation, while EPC reduces process variability by adjusting compensatory variables to keep the quality variable close to target. Recently there has been need for an integrated process control (IPC) procedure which combines the two strategies. This article considers a scheme that simultaneously applies SPC and EPC techniques to reduce the variation of a process. The process disturbance model under consideration is an IMA(1,1) model with a location shift. The EPC part of the scheme adjusts the process, while the SPC part of the scheme detects the occurrence of a special cause. For adjusting the process repeated adjustment is applied by compensating the predicted deviation from target. For detecting special causes the two kinds of exponentially weighted moving average (EWMA) control chart are applied to the observed deviations: One for detecting location shift and the other for detecting increment of variability. It was assumed that the adjustment of the process under the presence of a special cause may change any of the process parameters as well as the system gain. The effectiveness of the IPC scheme is evaluated in the context of the average cost per unit time (ACU) during the operation of the scheme. One major objective of this article is to investigate the effects of the process parameters to the ACU. Another major objective is to give a practical guide for the efficient selection of the parameters of the two EWMA control charts.

• Journal of radiological science and technology
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• v.45 no.5
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• pp.439-448
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• 2022

The purpose of this study was to analyze the results from statistical process control (SPC) to recommend upper and lower control limits for planning parameters based on delivery quality assurance (DQA) results and establish our institutional guidelines regarding planning parameters for helical tomotherapy (HT). A total of 53 brain, 41 head and neck (H & N), and 51 pelvis cases who had passing or failing DQA measurements were selected. The absolute point dose difference (DD) and the global gamma passing rate (GPR) for all patients were analyzed. Control charts were used to evaluate upper and lower control limits (UCL and LCL) for all assessed treatment planning parameters. Treatment planning parameters were analyzed to provide its range for DQA pass cases. We confirmed that the probability of DQA failure was higher when the proportion of leaf open time (LOT) below 100 ms was greater than 30%. LOT and gantry period (GP) were significant predictor for DQA failure using the SPC method. We investigated the availability of the SPC statistic method to establish the local planning guideline based on DQA results for HT system. The guideline of each planning parameter in HT may assist in the prediction of DQA failure using the SPC statistic method in the future.

• Journal of the Korean Society for Precision Engineering
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• v.15 no.10
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• pp.103-112
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• 1998

The evolution of semiconductor manufacturing technology has accelerated the reduction of device dimensions and the increase of integrated circuit density. In order to improve yield within a short turn around time and maintain it at high level, a system that can rapidly determine problematic processing steps is needed. The statistical process control detects abnormal process variation of key parameters. Expert systems in SPC can serve as a valuable tool to automate the analysis and interpretation of control charts. A set of IF-THEN rules was used to formalize knowledge base of special causes. This research proposes a strategy to apply expert system to SPC in semiconductor manufacturing. In analysis, the expert system accomplishes the instability detection of process parameter, In diagnosis, an engineer is supported by process analyzer program. An example has been used to demonstrate the expert system and the process analyzer.

• IE interfaces
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• v.20 no.2
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• pp.94-102
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• 2007

Portfolio management deals with decision making on 'when' and 'how' to revise an existing portfolio. In this paper, we show that a classical statistical process control (SPC) chart for normal data, a wellestablished tool in quality engineering, can effectively be used for signaling times for revising a portfolio. Noting that the day-to-day performance of a portfolio may be auto-correlated, we use the exponentially weighted moving average center-line chart to develop an automatic portfolio management procedure. The portfolio management procedure is extensively tested on historical data of equities traded in the Korea Exchange (KRX), the American Stock Exchange (AMEX), and the New York Stock Exchange (NYSE). In comparison with the performances of the KOSPI, XAX, and NYA indices during the same time periods, results from these experiments show that SPC chart-based portfolio revision presents itself a convenient and reliable method for optimally managing portfolios.

• Proceedings of the Korean Reliability Society Conference
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• 2000.04a
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• pp.123-129
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• 2000

SPC is the quality improvement technique of gathering since Motorola of U.S.A. have used SPC technique as a statistical process control method for promoting 6-sigma quality improvement strategy in 1988. In Korea, small and medium-sized enterprises are needed building of a system for statistical production control . In the present study, the methods of building SPC system with a moderate cost using a graphic programs of easy-to-use and high flexibility for small and medium-sized enterprises were inquired. The SPC system which enables statistic marking (maximum, minimum, mean, standard deviation, process capability index) and graph marking (X-Y coordinates and histogram) using LabVIEW 5.0, the graphic program by National Instrument Co., Ltd. was implemented in this study.

• Journal of Korean Society for Quality Management
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• v.28 no.2
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• pp.70-88
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• 2000

Short runs where it is neither possible nor practical to obtain sufficient subgroups to estimate accurately the control limit are common in modem business environments. In this study, the standardized control chart, Hillier's exact method, Q chart, EWMA(Exponentially Weighted Moving Average) chart for Q statistics and EWMA chart for mean and absolute deviation among many SPC(Statistical Process Control) techniques for short runs have been reviewed and advantages and disadvantages of these techniques are discussed. The simulation experiments to compare performances of these variable charts for process mean and variations are conducted for combination of subgroup size, scale and timing of shifts of process mean an/or standard deviation. Based upon simulation results, some guidelines for practitioners to choose short run SPC techniques are recommended.