• 제목/요약/키워드: Statistical Control Chart

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두 개의 이상원인을 고려한 VSSI$\bar{X}$ 관리도의 경제적-통계적 설계 (Economic-Statistical Design of VSSI$\bar{X}$ Control Charts Considering Two Assignable Causes)

  • 이호중;임태진
    • 대한산업공학회지
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    • 제31권1호
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    • pp.87-98
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    • 2005
  • This research investigates economic-statistical characteristics of variable sampling size and interval (VSSI)$\bar{X}$charts under two assignable causes. A Markov chain approach is employed in order to calculate average run length (ARL) and average time to signal (ATS). Six transient states are derived by carefully defining the state. A steady state cost rate function is constructed based on Lorenzen and Vance(1986) model. The cost rate function is optimized with respect to six design parameters for designing the VSSI $\bar{X}$ charts. Computational experiments show that the VSSI $\bar{X}$ chart is superior to the Shewhart $\bar{X}$ chart in the economic-statistical sense, even under two assignable causes. A comparative study shows that the cost rate may increase up to almost 30% by overlooking the second cause. Critical input parameters are also derived from a sensitivity study and a few guideline graphs are provided for determining the design parameters.

와이블분포하에서의 최소값 및 최대값 관리도의 설계 (Design of Minimum and Maximum Control Charts under Weibull Distribution)

  • 조은경;이민구
    • 대한산업공학회지
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    • 제41권6호
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    • pp.521-529
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    • 2015
  • Statistical process control techniques have been greatly implemented in industries for improving product quality and saving production costs. As a primary tool among these techniques, control charts are widely used to detect the occurrence of assignable causes. In most works on the control charts it considered the problem of monitoring the mean and variance, and the quality characteristic of interest is normally distributed. In some situations monitoring of the minimum and maximum values is more important and the quality characteristic of interest is the Weibull distribution rather than a normal distribution. In this paper, we consider the statistical design of minimum and maximum control charts when the distribution of the quality characteristic of interest is Weibull. The proposed minimum and maximum control charts are applied to the wind data. The results of the application show that the proposed method is more effective than traditional methods.

VLAD 관리도의 설계 (Design of Variable Life-Adjusted Display (VLAD) Charts)

  • 이재헌;정상현
    • 응용통계연구
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    • 제20권3호
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    • pp.597-604
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    • 2007
  • 현대 사회에서 건강관리와 공중보건 분야의 이상원인 탐지와 감시를 위하여 관리도 기법을 많이 사용하고 있다 예를 들어, 외과의사의 수술 수행성과의 변화나 만성병과 전염병 등의 비율 변화를 탐지하는데 관리도를 사용할 수 있다. 이 논문에서는 건강관리와 공중보건 분야에서 많이 사용하는 VLAD (variable life-adjusted display) 관리도를 소개하고, 이 관리도에서 관리한계선을 설정하는 방법을 제안하였다.

CUSUM of Squares Chart for the Detection of Variance Change in the Process

  • Lee, Jeong-Hyeong;Cho, Sin-Sup;Kim, Jae-Joo
    • 품질경영학회지
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    • 제26권1호
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    • pp.126-142
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    • 1998
  • Traditional statistical process control(SPC) assumes that consective observations from a process are independent. In industrial practice, however, observations are ofter serially correlated. A common a, pp.oach to building control charts for autocorrelatd data is to a, pp.y classical SPC to the residuals from a time series model fitted. Unfortunately, one cannot completely escape the effects of autocorrelation by using charts based on residuals of time series model. For the detection of variance change in the process we propose a CUSUM of squares control chart which does not require the model identification. The proposed CUSUM of squares chart and the conventional control charts are compared by a Monte Carlo simulation. It is shown that the CUSUM of squares chart is more effective in the presence of dependency in the processes.

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역정규 손실함수를 이용한 기대손실 관리도의 개발 (A Development of Expected Loss Control Chart Using Reflected Normal Loss Function)

  • 김동혁;정영배
    • 산업경영시스템학회지
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    • 제39권2호
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    • pp.37-45
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    • 2016
  • Control chart is representative tools of statistical process control (SPC). It is a graph that plotting the characteristic values from the process. It has two steps (or Phase). First step is a procedure for finding a process parameters. It is called Phase I. This step is to find the process parameters by using data obtained from in-controlled process. It is a step that the standard value was not determined. Another step is monitoring process by already known process parameters from Phase I. It is called Phase II. These control chart is the process quality characteristic value for management, which is plotted dot whether the existence within the control limit or not. But, this is not given information about the economic loss that occurs when a product characteristic value does not match the target value. In order to meet the customer needs, company not only consider stability of the process variation but also produce the product that is meet the target value. Taguchi's quadratic loss function is include information about economic loss that occurred by the mismatch the target value. However, Taguchi's quadratic loss function is very simple quadratic curve. It is difficult to realistically reflect the increased amount of loss that due to a deviation from the target value. Also, it can be well explained by only on condition that the normal process. Spiring proposed an alternative loss function that called reflected normal loss function (RNLF). In this paper, we design a new control chart for overcome these disadvantage by using the Spiring's RNLF. And we demonstrate effectiveness of new control chart by comparing its average run length (ARL) with ${\bar{x}}-R$ control chart and expected loss control chart (ELCC).

VSI EWIMA 관리도의 경제적 설계 (An Economic Design of the EWMA Control Charts with Variable Sampling Interval)

  • 송서일;정혜진
    • 품질경영학회지
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    • 제30권4호
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    • pp.1-14
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    • 2002
  • Traditional SPC techniques are looking out variation of process by fixed sampling interval and fixed sample size about every hour, the process of in-control or out-of-control couldn't be detected actually when the sample points are plotted near control limits, and it takes no notice of expense concerned with such sample points. In this paper, to overcome that, consider VSI(variable sampling interval) EWMA control charts which VSI method is applied. The VSI control charts use a short sampling internal if previous sample points are plotted near control limits, then the process has high probability of out-of-control. But it uses a long sampling interval if they are plotted near centerline of the control chart, since process has high possibility of in-control. And then a comparison and analysis between FSI(fixed sampling interval) and VSI EWMA in the statistical aspect and economic aspect is studied. Finally, we show that VSI EWMA control chart is more efficient than FSI EWMA control chart in the both aspects.

시계열을 따르는 공정데이터의 모델 모수기반 이상탐지 (Model Parameter Based Fault Detection for Time-series Data)

  • 박시저;박정술;김성식;백준걸
    • 한국시뮬레이션학회논문지
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    • 제20권4호
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    • pp.67-79
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    • 2011
  • 본 연구에서는 시계열 공정데이터 관리를 위한 모델모수 기반 이상 탐지방법을 제안한다. 일반적인 공정관리에 널리 쓰이는 전통적인 통계적 관리기법의 관리도(SPC chart)는 측정되는 데이터가 특정 분포를 따르며 상관관계가 없는 상황을 가정한다. 따라서 공정데이터 형태가 시계열데이터와 같이 특정분포를 따르지 않고, 자기상관관계를 갖는다면 전통적인 관리도로는 관리에 한계를 보인다. 본 연구는 시계열을 따르는 공정의 이상을 탐지를 위한 MPBC(Model Parameter Based Control-chart) 방법을 제안한다. 제안된 MPBC는 시계열공정을 모델링하고, 모델모수의 변화를 감지하여 공정의 이상을 탐지하는 방법이다. 시계열 공정은 ARMA(p,q) 모델을 가정하며, RLS(Recursive Least Square)를 이용하여 시계열 모델의 모수를 추정하고, 추정된 모수를 $K^2$관리도로 관리한다. 제안된 방법은 기존 알고리즘과 비교하여 시계열 공정 변화 탐지에 우수한 성능을 보였으며 시계열 데이터에 있어서 보다 효율적인 공정관리 방향을 제시한다.

A VSR $\bar{X}$ Chart with Multi-state VSS and 2-state VSI Scheme

  • Lee, Jae-Heon;Park, Chang-Soon
    • 품질경영학회지
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    • 제32권4호
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    • pp.252-264
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    • 2004
  • Variable sampling Interval (VSI) control charts vary the sampling interval according to value of the control statistic while the sample size is fixed. It is known that control charts with 2-state VSI scheme, which uses only two sampling intervals, give good statistical properties. Variable sample size (VSS) control charts vary the sample size according to value of the control statistic while the sampling interval is fixed. In the VSS scheme no optimal results are known for the number of sample sizes. It is also known that the variable sampling rate (VSR) $\bar{X}$ control chart with 2-state VSS and 2-state VSI scheme leads to large improvements In performance over the fixed sampling rate (FSR) $\bar{X}$ chart, but the optimal number of states for sample size Is not known. In this paper, the VSR Χ charts with multi-state VSS and 2-state VSI scheme are designed and compared to 2-state VSS and 2-state VSI scheme. The multi-state VSS scheme is considered to, achieve an additional improvement by switching from the 2-state VSS scheme. On the other hand, the multi-state VSI scheme is not considered because the 2-state scheme is known to be optimal. The 3-state VSS scheme improves substantially the sensitivity of the $\bar{X}$ chart especially for small and moderate mean shifts.

The Effect of Estimated Control Limits

  • JaiWook Baik;TaiYon Won
    • Communications for Statistical Applications and Methods
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    • 제5권3호
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    • pp.645-657
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    • 1998
  • During the start-up of a process or in a job-shop environment conventional use of control charts may lead to erroneous results due to the limited number of subgroups used for the construction of control limits. This article considers the effect of using estimated control limits based on a limited number of subgroups. Especially we investigate the performance of $\overline{X}$ and R control charts when the data are independent, and X control chart when the data are serially correlated in terms of average run length(ARL) and standard deviation run length(SDRL) using simulation. It is found that the ARL and SDRL get larger as the number of subgroups used for the construction of the chart becomes smaller.

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통계적 공정 제어에 전문가 시스템의 적용에 관한 연구 (Applying an Expert System to Statistical Process Control)

  • 윤건상;김훈모;최문규
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 1995년도 추계학술대회 논문집
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    • pp.411-414
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    • 1995
  • Statistical Process Control (SPC) is a set of methodologies for signaling the presence of undesired sources of variation in manufacturing processes. Expert System in SPC can serve as a valuable tool to automate the analysis and interpretation of control charts. In this paper we put forward a method of successful application of Expert System to SPC in manufacturing process.

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