• Journal of the Korean Society for Precision Engineering
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• v.20 no.8
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• pp.76-85
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• 2003

In this paper, a technical method for removing the solder from PCBs has been proposed to simplify the pulverizing process and to get higher quality of materials for recycling of the electronic parts in the Printed Circuit Boards (PCBs). There are several techniques to remove the solder from PCB, such as physical and chemical method, vibration, suction and blowing and so on. Among them, the suction technique turned out the best method by investigation. In the suction method, there are three variables for removing the solder. They are a temperature of the thermal wire, a velocity of moving PCB and a gap between PCB and thermal wire. To find the optimal variables for the system, an experiment has been conducted by a trial and error method. The optimal variables were found $220^{\circ}C$ of temperature, 11.58mm/s of velocity, 10mm of gap (A gap between suction hole and bottom of PCBs is 5mm). The result of the experiment shows that 50% of the solder were removed.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2009.06a
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• pp.327-328
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• 2009

• Journal of the Korea Academia-Industrial cooperation Society
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• v.13 no.1
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• pp.322-328
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• 2012

This paper deals with a digital Desoldering system for removing lead-free solder. We proposed a Desoldering system that is to cope with the changed work environment of the solder materials changing from lead solder to lead-free solder, we can be quickly stable to the set temperature, and continuous operation is possible. Proposed system consists of a Desoldering station and a Desoldering gun. For the PID temperature control, we designed the 8bit MCU peripheral circuit. We had a few experiments to confirm the performance of the proposed system, and compared with the specification of same kind of imports. As a result, proposed system than the imported products showed good performance as follows: the time to reach operating temperature is 11 seconds faster, ripple temperature variation is $1.5^{\circ}C$ lower, temperature recovery rate is about $0.14^{\circ}C$/sec faster.

• Journal of the Korean institute of surface engineering
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• v.50 no.3
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• pp.155-163
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• 2017

In this study, the effects of the concentration of metal ions and the applied current density in the Sn-Ag plating solutions were examined in regards to the resulting composition and morphology of the solder bumps' surface. Furthermore the effect of any impurities present in the methanesulfonic acid used as a base acid in the Sn-Ag solder plating solution on the stability of plating solution as well as the characteristics of the Sn-Ag alloys films was also explored. As expected, the uniform bump was obtained by means of removing impurities in the plating solution. Consequently the resultant solder bump was obtained in an optimal current density of the range of $1A/dm^2$ to $15A/dm^2$, which has acceptable bump shape and surface roughness with 12inch wafer trial results.

• Proceedings of the International Microelectronics And Packaging Society Conference
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• 2001.11a
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• pp.138-140
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• 2001

Fluxless flip chip bonding using plasma & ultrasonic wave was investigated in order to evaluate the effect of plasma & ultrasonic treatment on the bondability of the Sn-3.5wt%Ag solder bumped die to TSM-coated glass substrate. The $Ar+10%H_2plasma$ was effective in removing tin oxide on solder surface. The die shear strength of the plasma-treated Si-chip is higher than that of non-treated specimen but lower than that of specimen bonded with flux. The die shear strength with the bonding load at 25W ultrasonic power increased to 0.8N/bump for all bonding temperature but decreased above 1.0N/bump.