• International Journal of Reliability and Applications
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• v.4 no.1
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• pp.1-12
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• 2003

Many software reliability growth models (SRGM's) based on a nonhomogeneous Poisson process (NHPP) have been proposed by many researchers. Most of the SRGM's which have been proposed up to the present treat the event of software fault-detection in the testing and operational phases as a counting process. However, if the size of the software system is large, the number of software faults detected during the testing phase becomes large, and the change of the number of faults which are detected and removed through debugging activities becomes sufficiently small compared with the initial fault content at the beginning of the testing phase. Therefore, in such a situation, we can model the software fault-detection process as a stochastic process with a continuous state space. In this paper, we propose a new software reliability growth model describing the fault-detection process by applying a mathematical technique of stochastic differential equations of an Ito type. We also compare our model with the existing SRGM's in terms of goodness-of-fit for actual data sets.

• Communications for Statistical Applications and Methods
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• v.18 no.5
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• pp.667-674
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• 2011

A recent trend in software reliability engineering accounts for the coverage growth behavior during testing. The coverage growth function (representing the coverage growth behavior) has become an essential component of software reliability models. Application of a coverage growth function requires the estimation of the coverage growth function. This paper considers the problem of estimating the coverage growth function. The existing maximum likelihood method is reviewed and corrected. A method of minimizing the sum of squares of the standardized prediction error is proposed for situations where the maximum likelihood method is not applicable.

• Journal of Korean Society for Quality Management
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• v.27 no.3
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• pp.125-141
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• 1999

Bayesian inference and model selection method for software reliability growth models are studied. Software reliability growth models are used in testing stages of software development to model the error content and time intervals between software failures. In this paper, we could avoid the multiple integration by the use of Gibbs sampling, which is a kind of Markov Chain Monte Carlo method to compute the posterior distribution. Bayesian inference and model selection method for Jelinski-Moranda and Goel-Okumoto and Schick-Wolverton models in software reliability with Poisson prior information are studied. For model selection, we explored the relative error.

• The Transactions of the Korea Information Processing Society
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• v.6 no.3
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• pp.615-621
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• 1999

On the aspect of on-time and development resource use, it is very important to predict the software release time during the software development process. In this paper, we present the optimal release problem based on the evaluation indicator and cost evaluation. And also we show the optimal release point considered with both of them. We applied the Exponential Software Reliability Growth Model(E-SRGM) and Testing-effort dependent Software Reliability Growth Model(Te-SRGM) and decided the software release time according to software reliability indicator. As a result of two models comparison, we verify the Te-SRGM is more adopted in our switching system software.

• The KIPS Transactions:PartD
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• v.11D no.6
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• pp.1287-1294
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• 2004

Recently relationships between reliability measures and the coverage have been developed for evaluation of software reliability. Particularly the mean value function of the coverage-based software reliability growth model is important because of its key role in rep-resenting the software reliability growth. In this paper, we first review the problems of the existing mean value functions with respect to the assumptions on which they are based. Then a new mean value function is proposed. The new mean value function is developed for a general testing environment in which imperfect fault detection and repeated construct execution are allowed. Finally performance of the proposed model is empirically evaluated by applying it to a real data set.

• The KIPS Transactions:PartD
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• v.10D no.5
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• pp.829-836
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• 2003

Software Reliability Growth Model that have been studied variously. But measurement of correct parameter of this model is not easy. Specially, estimation of correct model about failure data must be establish and estimation of parameter can consist exactly. To get correct testing, we calculate the normal score and describe the normal probability plot. Use the normal probability plot, we estimate the distribution for failure data. In this paper, we estimate the software reliability growth model for through the normal probability plot. In this research, we applies software reliability growth model through distribution characteristics of failure data. If we see plot, we determine the software reliability growth model, we can make sure superior in model's performance estimation.

• Journal of Korean Society for Quality Management
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• v.34 no.4
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• pp.133-138
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• 2006

In this paper, we propose a software reliability growth model (SRGM) based on the testing domain, which is isolated by the executed test cases. This model assumes an imperfect debugging environment in which new faults are introduced in the fault-correction process. We consider that the fault detection rate of NHPP model is changed in the proposed SRGM. We obtain the maximum likelihood estimate, and compare goodness-of-fit with another existing software reliability growth model.

• Journal of the Korean Data and Information Science Society
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• v.23 no.4
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• pp.815-823
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• 2012

In this paper reliability growth model in which the operating time between successive failure is a continuous random variable is proposed. This model is for Burr type XII distribution with two parameters which is discussed in two versions: the order statistics and non-homogeneous Poisson process. The two software reliability measures are obtained. The performance for two versions of the suggested model is tested on real data set by U-plot and Y-plot using Kolmogorov distance.

• Proceedings of the Korean Reliability Society Conference
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• 2005.06a
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• pp.259-264
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• 2005

In this paper, we generalize the software reliability growth model by assuming that the testing cost and maintenance cost are random and adopts the Bayesian approach to determine the optimal software release time. Numerical examples are provided to illustrate the Bayesian method for certain parametric models.

• Journal of Information Technology Applications and Management
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• v.12 no.2
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• pp.1-13
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• 2005

This paper proposes a software-reliability growth model incoporating the amount of testing effort expended during the software testing phase after developing it. The time-dependent behavior of testing effort expenditures is described by a Logistic curve. Assuming that the error detection rate to the amount of testing effort spent during the testing phase is proportional to the current error content, a software-reliability growth model is formulated by a nonhomogeneous Poisson process. Using this model the method of data analysis for software reliability measurement is developed. After defining a software reliability, This paper discusses the relations between testing time and reliability and between duration following failure fixing and reliability are studied. SRGM in several literatures has used the exponential curve, Railleigh curve or Weibull curve as an amount of testing effort during software testing phase. However, it might not be appropriate to represent the consumption curve for testing effort by one of already proposed curves in some software development environments. Therefore, this paper shows that a logistic testing-effort function can be adequately expressed as a software development/testing effort curve and that it gives a good predictive capability based on real failure data.