• 제목/요약/키워드: Silicon thin

검색결과 1,697건 처리시간 0.034초

실리콘 박막 태양전지 전면 전극용 ZnO : Al 투명전도막의 표면형상 및 산란광 특성 (Characterization of Surface Morphology and Light Scattering of Transparent Conducting ZnO:Al Films as Front Electrode for Silicon Thin Film Solar Cells)

  • 김영진;조준식;이정철;왕진석;송진수;윤경훈
    • 한국재료학회지
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    • 제19권5호
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    • pp.245-252
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    • 2009
  • Changes in the surface morphology and light scattering of textured Al doped ZnO thin films on glass substrates prepared by rf magnetron sputtering were investigated. As-deposited ZnO:Al films show a high transmittance of above 80% in the visible range and a low electrical resistivity of $4.5{\times}10^{-4}{\Omega}{\cdot}cm$. The surface morphology of textured ZnO:Al films are closely dependent on the deposition parameters of heater temperature, working pressure, and etching time in the etching process. The optimized surface morphology with a crater shape is obtained at a heater temperature of $350^{\circ}C$, working pressure of 0.5 mtorr, and etching time of 45 seconds. The optical properties of light transmittance, haze, and angular distribution function (ADF) are significantly affected by the resulting surface morphologies of textured films. The film surfaces, having uniformly size-distributed craters, represent good light scattering properties of high haze and ADF values. Compared with commercial Asahi U ($SnO_2$:F) substrates, the suitability of textured ZnO:Al films as front electrode material for amorphous silicon thin film solar cells is also estimated with respect to electrical and optical properties.

TFT의 길이와 두께에 관한 특성 (Characterization of length and width of poly-silicon thin film transistors)

  • 이정인;황성현;정성욱;장경수;이광수;정호균;최병덕;이기용;이준신
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2006년도 추계학술대회 논문집 전기물성,응용부문
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    • pp.121-122
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    • 2006
  • Recently, poly-Si TFT-LCD starts to be mass produced using excimer laser annealing (ELA) poly-Si. The main reason for this is the good quality poly-Si and large area uniformity. We report the influence of channel length and width on poly-Si TITs performance. Transfer characteristics of n-channel poly-Si thin film transistors fabricated on polycrystalline silicon (poly-Si) thin film transistors (TFTs) with various channel lengths and widths of $2-30{\mu}m$ has been investigated. In this paper, we analyzed the data of n-type TFTs. We studied threshold voltage ($V_{TH}$), on/off current ratio ($I_{ON}/I_{OFF}$), saturation current (I_{DSAT}$), and transconductance ($g_m$) of n-channel poly-Si thin film transistors with various channel lengths and widths.

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Superhard SiC Thin Films with a Microstructure of Nanocolumnar Crystalline Grains and an Amorphous Intergranular Phase

  • Lim, Kwan-Won;Sim, Yong-Sub;Huh, Joo-Youl;Park, Jong-Keuk;Lee, Wook-Seong;Baik, Young-Joon
    • Corrosion Science and Technology
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    • 제18권5호
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    • pp.206-211
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    • 2019
  • Silicon carbide (SiC) thin films become superhard when they have microstructures of nanocolumnar crystalline grains (NCCG) with an intergranular amorphous SiC matrix. We investigated the role of ion bombardment and deposition temperature in forming the NCCG in SiC thin films. A direct-current (DC) unbalanced magnetron sputtering method was used with pure Ar as sputtering gas to deposit the SiC thin films at fixed target power of 200 W and chamber pressure of 0.4 Pa. The Ar ion bombardment of the deposited films was conducted by applying a negative DC bias voltage 0-100 V to the substrate during deposition. The deposition temperature was varied between room temperature and $450^{\circ}C$. Above a critical bias voltage of -80 V, the NCCG formed, whereas, below it, the SiC films were amorphous. Additionally, a minimum thermal energy (corresponding to a deposition temperature of $450^{\circ}C$ in this study) was required for the NCCG formation. Transmission electron microscopy, Raman spectroscopy, and glancing angle X-ray diffraction analysis (GAXRD) were conducted to probe the samples' structural characteristics. Of those methods, Raman spectroscopy was a particularly efficient non-destructive tool to analyze the formation of the SiC NCCG in the film, whereas GAXRD was insufficiently sensitive.

$MgTiO_3$산화물 박막의 성장 및 전기적 특성 연구 (Growth and electrical properties of $MgTiO_3$ thin films)

  • 강신충;임왕규;안순홍;노용한;이재찬
    • 한국진공학회지
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    • 제9권3호
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    • pp.227-232
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    • 2000
  • 광소자와 마이크로파 유전체 소자 및 절연 산화막으로의 응용을 위한 $MgTiO_3$ 박막을 펄스레이저 증착법을 이용하여 다양한 기판 위에서 증착하였다. 사파이어 기판에(c-plane Sapphire) 성장된 $MgTiO_3$ 박막은 에피텍셜 성장(epitaxial growth)이 되었으며, $SiO_2$/Si 및 Pt/Ti/$SiO_2$/Si(plantinzed silicon)기판 위에 성장된 $MgTiO_3$ 박막의 경우, 기판과 관계없이 c축 방향으로 배향(oriented)되었다. 사파이어 기판 위에 증착된 $MgTiO_3$ 박막은 가시영역에서 투명하였으며, 약 290 nm 파장을 갖는 영역에서 급격한 흡수단을 보였다. 사파이어 기판 위에 성장된 박막의 AM(Atomic Force Microscopy)분석결과 약 0.87 nm rms roughness 값을 갖는 매우 평탄한 표면상태를 갖고 있음을 확인하였다. MIM(Pt/$MgTiO_3$/Pt) 구조의 캐패시터를 형성시켜 $MgTiO_3$박막의 유전특성 (dielectric properties)을 관찰하였는데, 펄스레이저 증착법으로 성장된 $MgTiO_3$ 박막의 유전율(relative dielectric constant)은 약 24.5였으며, 1 MHz에서 약 1.5%의 유전손실(dielectric loss) 값을 보였다. 또한 이때 $MgTiO_3$박막은 낮은 유전분산을 보였다.

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The study of silicon etching using the high density hollow cathode plasma system

  • Yoo, Jin-Soo;Lee, Jun-Hoi;Gangopadhyay, U.;Kim, Kyung-Hae;Yi, Jun-Sin
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2003년도 International Meeting on Information Display
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    • pp.1038-1041
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    • 2003
  • In the paper, we investigated silicon surface microstructures formed by reactive ion etching in hollow cathode system. Wet anisotropic chemical etching technique use to form random pyramidal structure on <100> silicon wafers usually is not effective in texturing of low-cost multicrystalline silicon wafers because of random orientation nature, but High density hollow cathode plasma system illustrates high deposition rate, better film crystal structure, improved etching characteristics. The etched silicon surface is covered by columnar microstructures with diameters form 50 to 100nm and depth of about 500nm. We used $SF_{6}$ and $O_{2}$ gases in HCP dry etch process. This paper demonstrates very high plasma density of $2{\times}10^{12}$ $cm^{-3}$ at a discharge current of 20 mA. Silicon etch rate of 1.3 ${\mu}s/min$. was achieved with $SF_{6}/O_{2}$ plasma conditions of total gas pressure=50 mTorr, gas flow rate=40 sccm, and rf power=200 W. Our experimental results can be used in various display systems such as thin film growth and etching for TFT-LCDs, emitter tip formations for FEDs, and bright plasma discharge for PDP applications. In this paper we directed our study to the silicon etching properties such as high etching rate, large area uniformity, low power with the high density plasma.

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비정질실리콘 박막트랜지스터 비휘발성 메모리소자 (The nonvolatile memory device of amorphous silicon transistor)

  • 허창우;박춘식
    • 한국정보통신학회논문지
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    • 제13권6호
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    • pp.1123-1127
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    • 2009
  • 본 연구는 비정질실리콘 박막트랜지스터를 비휘발성 메모리소자로 제작함으로써 스위칭 소자로 사용되는 박막 트랜지스터(TFT)의 응용범위를 확대시키고, 비정질 실리콘 사용에 따라 대면적화에 적합하고 아울러 값싼 기판을 사용할 수 있게 한 비정질 실리콘 비휘발성 메모리소자에 관한 것이다. 이와 같은 본 연구는 유리기판과 그 유리기판위에 증착시켜 패터닝한 게이트, 그 게이트를 덮어씌운 제1 절연층, 그 제1 절연층위에 증착시켜 패터닝한 플로우팅 게이트와 그 플로우팅 게이트를 덮어씌운 제2 절연층, 그 제2 절연층위에 비정질실리콘을 증착시킨 액티브층과 그 액티브층위에 n+ 비정질실리콘을 증착시켜 패터닝한 소오스/드레인층 그리고 소오스/드레인층 위에 증착시킨 소오스/드레인층 전극으로 비정질실리콘 박막트랜지스터 비휘발성 메모리소자를 구성한다.