• 제목/요약/키워드: Silicon thin

검색결과 1,697건 처리시간 0.03초

선결정화법을 이용한 금속 유도 일측면 결정화에 의해 제작된 다결정 실리콘 박막 트랜지스터 소자 및 회로의 전기적 특성 개선 효과 (Dynamic Characteristics of Metal-induced Unilaterally Crystallized Polycrystalline Silicon Thin-film Transistor Devices and Circuits Fabricated with Precrystallization)

  • 황욱중;강일석;김영수;양준모;안치원;홍순구
    • 한국진공학회지
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    • 제17권5호
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    • pp.461-465
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    • 2008
  • 적층 박막 내에서의 상변화는 주변 층에 영향을 준다. 결정화가 게이트 절연층에 주는 영향이 제거된 선결정화법(precrystallization)이 금속 유도 일측면 결정화(metal-induced unilateral crystallization)에 의해 제작된 다결정 실리콘 박막 트랜지스터 소자 및 회로의 전기적 특성에 미치는 영향에 대하여 연구하였다. 이 방법으로 만들어진 소자는 일반적인 후 결정화(postcrystallization) 소자에 비하여 높은 전류 구동력을 보였다. 여기에 본 연구는 DC bias에 의한 ring oscillator의 특성 변화를 연구하였다. 선결정화된 실리콘 박막을 이용하여 제작한 PMOS inverter는 후결정화된 실리콘 박막을 이용하여 제작한 inverter에 비하여 매우 동적(dynamic)이고도 안정적인 특성을 보였다.

Relationship between Secondary Electron Emissions and Film Thickness of Hydrogenated Amorphous Silicon

  • Yang, Sung-Chae;Chu, Byung-Yoon;Ko, Seok-Cheol;Han, Byoung-Sung
    • KIEE International Transactions on Electrophysics and Applications
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    • 제4C권4호
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    • pp.185-189
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    • 2004
  • The temporal variation of a secondary electron emission coefficient (${\gamma}$ coefficient) of hydrogenated amorphous silicon (a-Si:H) was investigated in a dc silane plasma. Estimated ${\gamma}$ coefficients have a value of 2.73 ${\times}$ 10$^{-2}$ on the pure aluminum electrode and 1.5 ${\times}$ 10$^{-3}$ after 2 hours deposition of -Si:H thin films on a cathode. It showed an abrupt decrease for about 30 minutes before saturation. The variation of the ${\gamma}$ coefficient was estimated as a function of the thin film thickness, and the film thickness was about 80 nm after 30 minutes deposition time. These results are compared with the results of a computer simulation for ion penetration into a cathode.

Expanding Thermal Plasma CVD of Silicon Thin Films and Nano-Crystals: Fundamental Studies and Applications

  • Sanden, Richard Van De
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2012년도 제43회 하계 정기 학술대회 초록집
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    • pp.78-78
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    • 2012
  • In this presentation I will review the expanding thermal plasma chemical vapour deposition (ETP-CVD) technology, a deposition technology capable of reaching ultrahigh deposition rates. High rate deposition of a-Si:H, ${\mu}c$-Si:H, a-SiNx:H and silicon nanocrystals will be discussed and their various applications, mainly for photovoltaic applications demonstrated. An important aspect over the years has been the fundamental investigation of the growth mechanism of these films. The various in situ (plasma) and thin film diagnostics, such as Langmuir probes, retarding field analyzer, (appearance potential) mass spectrometry and cavity ring absorption spectroscopy, spectroscopic ellipsometry to name a few, which were successfully applied to measure radical and ion density, their temperature and kinetic energy and their reactivity with the growth surface. The insights gained in the growth mechanism provided routes to novel applications of the ETP-CVD technology, such as the ultrahigh high growth rate of silicon nanorystals and surface passivation of c-Si surfaces.

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ECR 플라즈마에 의해 형성된 실리콘 질화막의 전기적 특성 (Electrical Properties of Silicon Nitride Thin Films Formed)

  • 구본영;전유찬;주승기
    • 전자공학회논문지A
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    • 제29A권10호
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    • pp.35-41
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    • 1992
  • Ultra-thin silicon nitride films were fabricated with ECR(Electron cyclotron Resonance) nitrogen plasma at room temperature. Film thickness was about 50$\AA$ after nitridation for 1min at microwave power of 1000W, RF power of 500W, and NS12T pressure of ${\times}10^{-3}$ torr. 50$\AA$ fo nitride film was grown within 1 min and no appreciable growth occured thereafter. Dielectric breakdown strength and leakage current density in Al/SiN/Si structure were measured to be about 7-11 MV/cm and ${\times}10^{-10}~5{\times}10^{-10}A/cm^{2}$, respectively. Observed linear relationship in 1n(J/E)-vs-E$^{1/2}$ and no polarity-dependence of the leakage current indicated that the Poole-Frenkel emission is mainly responsible for the conduction in this nitrided silicon films.

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Thin Film Transistor (TFT) Pixel Design for AMOLED

  • Han, Min-Koo;Lee, Jae-Hoon;Nam, Woo-Jin
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2006년도 6th International Meeting on Information Display
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    • pp.413-418
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    • 2006
  • Highly stable thin-film transistor (TFT) pixel employing both low temperature polycrystalline silicon (LTPS) and amorphous silicon (a-Si) for active matrix organic light emitting diode (AMOLED) is discussed. ELA (excimer laser annealing) LTPS-TFT pixel should compensate $I_{OLED}$ variation caused by the non-uniformity of LTPS-TFT due to the fluctuation of excimer laser energy and amorphous silicon TFT pixel is desired to suppress the decrease of $I_{OLED}$ induced by the degradation of a-Si TFT. We discuss various compensation schemes of both LTPS and a-Si TFT employing the voltage and the current programming.

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The Blue and Red Luminescences from Ambient Air Aged Porous Silicon

  • Chang, S.S;Yoon, S.O;Choi, G.J;Kawakami, Y;Sakai, A
    • The Korean Journal of Ceramics
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    • 제4권1호
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    • pp.28-32
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    • 1998
  • This paper reports on photoluminescence (PL), luminescence decay curves, and compositional analysis of porous silicon(PS) which is aged under air ambient by Fourier transform infrared vibrational spectroscopy (FTIR) and by Auger electron spectroscopy (AES). Porous silicos which has been aged under air ambient yields two PL band structures, i.e. blue/violet PL and red PL. The evolution of a blue/violet band is pronounced, especially for thin PS film which is prepared in dilute HF solution. The blue/violet PL band has been observed initially to increrase rapidly with aging, then saturated with further atmospheric aging. The ambient air aged PS exhibits a fast decay time of sub-nanosecond at room temperature and shows appreciably faster decay time than that at 20K. Atmospheric aging of this thin blue/violet luminescing PS yield non-stoichiometric oxide judging from the vibrational spectra of Si-O and AES analysis.

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실리콘 나노잉크를 이용한 결정질 실리콘 박막의 미세구조 (Microstructures of Crystalline Silicon Thin Film using Silicon Nanoink)

  • 이현경;정지영;장보윤
    • 한국전기전자재료학회:학술대회논문집
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    • 한국전기전자재료학회 2010년도 하계학술대회 논문집
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    • pp.266-266
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    • 2010
  • 실리콘 나노잉크를 이용한 프린팅 공정을 적용하여 결정질 실리콘 박막을 제조하였으며, 다양한 공정조건에 따른 박막의 특성을 연구하였다. 기존의 실리콘 박막형 제조 기술은 고가의 진공프로세스이므로, 비진공 프린팅 공정의 대체를 통하여 박막 태양전지의 제조원가를 획기적으로 절감할 수 있다. 실리콘 나노입자는 저온 플라즈마를 사용하여 합성하였으며, 스핀코팅 (spin coating), 드롭핑 (dropping), 딥핑 (dipping) 등의 프린팅 공정을 이용하여 단결정 실리콘 웨이퍼 위에 박막을 형성하였다. 사용된 실리콘 나노입자는 10 ~ 50 nm 의 크기와 단결정 구조를 갖는다. 이러한 실리콘 나노입자는 Propylene Glycol 용매에 분산시켜 하부기판에 프린팅 하였다. 이렇게 증착된 나노입자들은 $600{\sim}1000^{\circ}C$의 온도와 다양한 분위기에서 열처리되어 고밀도화 되었다. 제조된 실리콘 박막의 물성 분석은 SEM, EDX, 그리고 X-ray 회절 측정을 통하여 수행되었다.

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붕소 식각 정지층을 이용한 두 개의 한 방향 실리콘 미세 밸브의 제작 (Fabrication of Two One-Way Silicon Micro Valves using Boron Etch Stop Layer)

  • 서정덕;양의혁;양상식
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1993년도 정기총회 및 추계학술대회 논문집 학회본부
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    • pp.210-212
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    • 1993
  • In this paper, a silicon microvalve has been fabricated using micromachining technology. The valve consists of the several thin silicon diaphragms which are designed to open and close depending on the pressure difference. It is supposed to pass fluids in only one direction. The thin diaphragms are fabricated by boron etch stop using an anisotropic etchant, EPW. The fabricated valve has been tested for various pneumatic pressure. According to the experimental results, the slit width of the valve increases as the pneumatic pressure increases.

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결정입계의 선택적 식각을 이용한 다결정 규소 태양전지의 제작과 특성 (Fabrication and Characterization of Polycrystalline Silicon Solar Cells using Preferential Etching of Grain Boundaries)

  • 김상수;김철수;임동건;김도영;이준신
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 1997년도 하계학술대회 논문집 C
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    • pp.1430-1432
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    • 1997
  • A solar cell conversion effiency was degraded by grain boundary effect in polycrystalline silicon. To reduce these effects of the grain boundaries, we investigated various influencing factors such as preferential chemical etching of grain boundaries, grid design, transparent conductive thin film, and top metallization along grain boundaries. Pretreatment in $N_2$ atmosphere and gettering by $POCl_3$ and Al were performed to obtain polycrystalline silicon of the reduced defect density. Structural, electrical, and optical properties of solar cells were characterized. Improved conversion efficiencies of solar cell were obtained by a combination of Al diffusion into grain boundaries on rear side, fine grid finger, top Yb metal grid on Cr thin film of $200{\AA}$ and buried contact metallization along grain boundaries.

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실리콘과 코발트 박막의 계면구조에서 발생하는 1/f 잡음현상 연구 (Generation of 1/f Noise in Interfacial Structures between Silicon Substrate and Cobalt Thin Film)

  • 조남인;남형진;박종윤
    • 한국진공학회지
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    • 제5권1호
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    • pp.48-53
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    • 1996
  • We present a microscopic description for generation of 1/f noise in interfaces between cobalt thin film and silicon substrate. Along with surface resistance measurements and transmission electron diffraction observations. 1/f noise power spectral density has been measured for the interfacial structures at the liquid nitrogen temperature . The cobalt films have been deposited by the electron-beam evaporation technique onto p-type (100) silicon in the high vacuum condition. The measured noise power spectral density shows highest magnitude near the structural transition and metallization transition region. The noise magnitude rapidly decreased after the cobalt silicide nucleation. The noise parameter is concluded to be originated form the structural fluctuations.

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