• Title/Summary/Keyword: Si-Cl-H

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Thermodynamic analysis of the deposition process of SiC/C functionally gradient materials by CVD technique (CVD법을 이용한 SiC/C경사기능재료 증착공정의 열역학적 해석)

  • 박진호;이준호;신희섭;김유택
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.12 no.2
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    • pp.101-109
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    • 2002
  • A complex chemical equilibrium analysis was performed to study the hot-wall CVD process of the SiC/C functionally gradient materials (FGM). Thermochemical calculations of the Si-C-H-Cl system were carried out, and the effects of process variables(deposition temperature, reactor pressure, C/[Si+C] and H/[Si+C] ratios in the source gas) on the composition of deposited layers and the deposition yield were investigated. The CVD phase diagrams of the SiC/C FGM deposition were obtained, and the optimum process windows were estimated from the results.

Interaction of $HfCl_4$ with Two Hydroxyl's on Si (001) Surface: A First Principles Study ($HfCl_4$와 Si (001) 표면에 결합된 두 개의 수산화기와의 상호작용: 제일원리 연구)

  • Kim, Dae-Hyun;Kim, Dae-Hee;Seo, Hwa-Il;Kim, Yeong-Cheol
    • Journal of the Semiconductor & Display Technology
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    • v.8 no.2
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    • pp.55-58
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    • 2009
  • Density functional theory was used to investigate the adsorption and reaction of $HfCl_4$ with two hydroxyls on Si (001)-$2{\times}1$ surface in atomic layer deposition (ALD) process. We prepared a reasonable Si substrate which consisted of six inter-dimer dissociated $H_2O$ molecules and two intra-dimer dissociated $H_2O$ molecules. The $HfCl_4$must react with two hydroxyls to be a bulk-like structure. When $HfCl_4$ was adsorbed on a hydroxyl, there was energy benefit of -0.55 eV. Though there was energy loss for $HfCl_4$ to react with H of hydroxyl, thermal energy of ALD chamber would be enough to pass the energy barriers. There were five reaction pathways for $HfCl_4$ to react with two hydroxyls; inter-dimer, intra-dimer, cross-dimer, inter-row, and cross-row. Inter-row, inter-dimer and intra-dimer were relatively favorable among the five reaction pathways based on the energy difference. The electron densities between O and Hf in these three reactions were higher than the others and they had shorter Hf-O and O-O bond lengths than the other two reaction pathways.

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Preparation of Ultrafine Silica Powders by Chemical Vapor Deposition Process (기상반응(CVD)법 의한 실리카 미분말의 제조)

  • Choi, Eun-Young;Lee, Yoon-Bok;Shin, Dong-Woo;Kim, Kang-Ho
    • Korean Journal of Materials Research
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    • v.12 no.11
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    • pp.850-855
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    • 2002
  • Silica powders were prepared from $SiCl_4$-$H_2$O system by chemical vapor deposition process, and investigated on size control of the products with reaction conditions. The products were amorphous and nearly spherical particles with 130nm~50nm in size. The size distribution became narrow with the increase of [$H_2$O]/[SiCl$_4$] concentration ratio. The particle size decreased with the increase of reaction temperature, [$H_2$O]/[SiCl$_4$] concentration ratio and total flow rate. The specific surface area measured by BET method was about three times larger than that of electron microscope method.

Synthesis and Characterization of Poly(ferrocenylsilane) via Ring-Opening Polymerization(ROP) (고분자 고리 열림 반응을 이용한 Poly(ferrocenylsilane) 의 합성과 특성)

  • Jung, Kyoungsun;Kim, Sung Gi
    • Journal of Integrative Natural Science
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    • v.2 no.2
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    • pp.78-81
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    • 2009
  • In recent years, organometallic polymer containing silane and silole unit has been a topic of interest because of the wide range of optical, electrical and luminescent properties. In previous work, we synthesized functionalsilanebridged[1]ferrocenophane from the reaction of dimethyldichlorosilane[Me2SiCl2] and diphenyldichlorosilane[Ph2SiCl2] and dichloromethylvinylsilane[C3H6SiCl2] with ferrocene$[Fe({\eta}-C5H4)2]$ and n-BuLi. In this work, we have synthesized Poly(ferrocenylsilane) via the Thermal Ring-Opening Polymerization(ROP). characteristics of the poly(ferrocenylsilane) were investigated by gel permeation chromatography(GPC), 1H- and 13C-NMR spectroscopy.

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Chemoselective Iodination of Alcohols with CeCl3·7H2O/NaI over SiO2 under Microwave Irradiation

  • Hosseinzadeh, Rahman;Tajbakhsh, Mahmood;Lasemi, Zahra;Sharifi, Ali
    • Bulletin of the Korean Chemical Society
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    • v.25 no.8
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    • pp.1143-1146
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    • 2004
  • A simple and effective procedure for conversion of primary, secondary, allylic and benzylic alcohols into the corresponding iodides is described using $CeCl_3{\cdot}7H_2O/NaI\;over\;SiO_2$ under microwave irradiation. Benzylic alcohols are selectively converted in the presence of saturated alcohols into their corresponding benzylic iodides under these conditions.

Atomic Layer Deposition (ALD) of ZrO2 in Ultrahigh Vacuum (UHV)

  • Roy, Probir Chandra;Jeong, Hyun Suck;Doh, Won Hui;Kim, Chang Min
    • Bulletin of the Korean Chemical Society
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    • v.34 no.4
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    • pp.1221-1224
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    • 2013
  • The atomic layer deposition (ALD) of $ZrO_2$ was conducted in ultrahigh vacuum (UHV) conditions. The surface was exposed to $ZrCl_4$ and $H_2O$ in sequence and the surface species produced after each step were identified in situ with X-ray photoelectron spectroscopy (XPS). $ZrCl_4$ is molecularly adsorbed at 140 K on the $SiO_2$/Si(111) surface covered with OH groups. When the surface is heated to 300 K, $ZrCl_4$ loses two Cl atoms to produce $ZrCl_2$ species. Remaining Cl atoms of $ZrCl_2$ species can be completely removed by exposing the surface to $H_2O$ at 300 K followed by heating to 600 K. The layer-by-layer deposition of $ZrO_2$ was successfully accomplished by repeated cycles of $ZrCl_4$ dosing and $H_2O$ treatment.

The Characteristics of silicon nitride thin films prepared by atomic layer deposition method using $SiH_2Cl_2 and NH_3$ ($SiH_2Cl_2와 NH_3$를 이용하여 원자층 증착법으로 형성된 실리콘 질화막의 특성)

  • 김운중;한창희;나사균;이연승;이원준
    • Journal of the Korean Vacuum Society
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    • v.13 no.3
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    • pp.114-119
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    • 2004
  • Silicon Nitride thin films were deposited on p-type Si (100) substrates by atomic layer deposition (ALD) method at $550^{\circ}C$ using alternating exposures of $SiH_2Cl_2$ and $NH_3$, and the physical and electrical propeties of the deposited films were characterized. The thickness of the films was linearly increased with the number of deposition cycles, and the growth rate of the films was 0.13 nm/cycle with the reactant exposures of $3.0\times10^{9}$ L. The silicon nitride thin films deposited by Alf exhibited similar physical properties with the silicon nitride thin films deposited by low-pressure chemical vapor deposition (LPCVD) method in terms of refractive index and wet etch rate, lowering deposition temperature by more than 200 $^{\circ}C$. The ALD films showed the leakage current density of 0.79 nA/$\textrm{cm}^2$ at 3 MV/cm, which is lower than 6.95 nA/$\textrm{cm}^2$ of the LPCVD films under the same condition.

Characteristics of the Silicon Epitaxial Films Grown by RTCVD Method (RTCVD 법으로 성장한 실리콘 에피막의 특성)

  • Chung, W.J.;Kwon, Y.K.;Bae, Y.H.;Kim, K.I.;Kang, B.K.;Sohn, B.K.
    • Journal of Sensor Science and Technology
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    • v.5 no.1
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    • pp.63-70
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    • 1996
  • Silicon epitaxial films of submicron level were successfully grown by the RTCVD method. For the growth of silicon epitaxial layers, $SiH_{2}Cl_{2}\;/\;H_{2}$ gas mixtures and various process parameters including $H_{2}$ prebake process were used. The growth conditions were varied to investigate their effects on the interface abruptness of doping profile, the film growth rates and crystalline properties. The crystallinity of the undoped silicon was excellent at the growth temperature of $900^{\circ}C$. The doping profiles were measured by SIMS technique. The abruptness of doping profile would be controlled within about $200{\AA}/decade$ in the structure of undoped Si / $n^{+}-Si$ substrate.

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Application of thermodynamics to chemical vapor deposition (화학증착에서 열역학의 응용)

  • Latifa Gueroudji
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.9 no.1
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    • pp.80-83
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    • 1999
  • Processing of thin films by chemical vapor deposition(CVD) is accompanied by chemical reactions, in which the rigorous kinetic analysis is difficult to achieve. In these conditions, thermodynamic calculation leads to better understanding of the CVD process and helps to optimise the experimental parameters to obtain a desired product. A CVD phase diagram has been used as guide lines for the process. By determining the effect of each process variable on the driving force for deposition, the thermodynamic limit of the substrate temperature for a diamond deposition is calculated in the C-H system by assuming that the limit is defined by the CVD diamond phase diagram. The addition of iso-supersaturation ratio lines to the CVD phase diagram in the Si-Cl-H system provides additional information about the effects of CVD porcess variables.

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Interaction of Hf precursor with adsorbed hydroxyl on Si (001)-$(2\times1)$ surface using density functional theory (Density functional theory를 이용한 $H_2O$가 흡착된 Si(001)-$(2\times1)$ 표면과 Hf precursor의 상호작용)

  • Kim, Dae-Hyun;Oh, Hyun-Chul;Kim, Dae-Hee;Baek, Seung-Bin;Seo, Hwa-Il;Kim, Yeong-Cheol
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.11a
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    • pp.109-110
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    • 2008
  • We have performed a density functional theory study to investigate the reaction of the $HfCl_4$ molecule on $H_2O$ terminated Si (001)-$(2\times1)$ surface. The reaction of the $HfCl_4$ molecule is more favorable on OH-terminated site than H-terminated site. The first $HfCl_4$ molecule is adsorbed on a OH-terminated site with 0.21 eV energy benefit. The second $HfCl_4$ molecule is adsorbed on the most adjacent OH-terminated site of the first molecule and the energy benefit is 0.28 eV. The third and forth molecules have same tendency with the first and second ones. The adsorption energies of the fifth and sixth $HfCl_4$ molecules are 0.01 eV, -0.06 eV respectively. Therefore, we find that the saturation Hf coverage is approximately 5/8 of the available hydroxyl site, which is $2.08\times10^{14}/cm^2$. Our model is well matched with an experimental study by reference.

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