• Title/Summary/Keyword: Scanning probe microscope

Search Result 233, Processing Time 0.033 seconds

Manipulation of Carbon Nanotube Tip Using Focused Ion Beam (집속이온빔을 이용한 탄소나노튜브 팁의 조작)

  • Yoon, Yeo-Hwan;Park, June-Ki;Han, Chang-Soo
    • Journal of the Korean Society for Precision Engineering
    • /
    • v.23 no.12 s.189
    • /
    • pp.122-127
    • /
    • 2006
  • This paper reports on the development of carbon nanotube tip modified with focused ion beam(FIB). We used an electric field which causes dielectrophoresis, to align and deposit CNTs on a metal-coated canning Probe Microscope (SPM) tip. Using the CNT attached SPM tip, we have obtained an enhanced resolution and wear property compared to that from the bare silicon tip through the scanning of the surface of the bio materials. The carbon nanotube tip was aligned toward the source of the ion beam allowing their orientation to be changed at precise angles. By this technique, metal coated carbon nanotube tips that are several micrometer in length are prepared for SPM.

Theoretical Study of Scanning Probe Microscope Images of VTe2

  • Park, Sung-Soo;Lee, Jee-Young;Lee, Wang-Ro;Lee, Kee-Hag
    • Bulletin of the Korean Chemical Society
    • /
    • v.28 no.1
    • /
    • pp.81-84
    • /
    • 2007
  • Ab initio periodic Hartree-Fock calculations with the full potential and minimum basis set are applied to interpretation of scanning tunneling microscope (STM) and atomic force microscope (AFM) images on 1TVTe2. Our results show that the simulated STM image shows asymmetry while the simulated AFM image shows the circular electron densities at the bright spots without asymmetry of electron density to agree with the experimental AFM image. The bright spots of both the STM and AFM images of VTe2 are associated with the surface Te atoms, while the patterns of bright spots of STM and AFM images are different.

Thermal Design and Batch Fabrication of Full SiO2 SThM Probes for Sensitivity Improvement (주사탐침열현미경의 감도향상을 위한 전체 실리콘 산화막 열전탐침의 열적설계 및 일괄제작)

  • Jaung, Seung-Pil;Kim, Kyeong-Tae;Won, Jong-Bo;Kwon, Oh-Myoung;Park, Seung-Ho;Choi, Young-Ki;Lee, Joon-Sik
    • Transactions of the Korean Society of Mechanical Engineers B
    • /
    • v.32 no.10
    • /
    • pp.800-809
    • /
    • 2008
  • Scanning Thermal Microscope (SThM) is the tool that can map out temperature or the thermal property distribution with the highest spatial resolution. Since the local temperature or the thermal property of samples is measured from the extremely small heat transferred through the nanoscale tip-sample contact, improving the sensitivity of SThM probe has always been the key issue. In this study, we develop a new design and fabrication process of SThM probe to improve the sensitivity. The fabrication process is optimized so that cantilevers and tips are made of thermally grown silicon dioxide, which has the lowest thermal conductivity among the materials used in MEMS. The new design allows much higher tip so that heat transfer through the air gap between the sample-probe is reduced further. The position of a reflector is located as far away as possible to minimize the thermal perturbation due to the laser. These full $SiO_2$ SThM probes have much higher sensitivity than that of previous ones.

Quantification of Melanin Density at Epidermal Basal Layer by Using Confocal Scanning Laser Microscope (CSLM) (Confocal Scanning Laser Microscope (CSLM)을 이용한 피부 기저층 멜라닌 밀도의 정량화)

  • Kim, Dong Hyun;Lee, Sung Ho;Oh, Myoung Jin;Choi, Go Woon;Yang, Woo Chul;Park, Chang Seo
    • Journal of the Society of Cosmetic Scientists of Korea
    • /
    • v.40 no.3
    • /
    • pp.259-268
    • /
    • 2014
  • Non-invasive technologies in skin research have enabled to use a live image of living skin without a biopsy or histologic processing of tissue. Confocal scanning laser microscope (CSLM) operated at a near-infrared wavelength of 830 nm allows visualization of inner structure of skin as a non-invasive manner. According to previous researches using CSLM, melanin cap and papillary ring were clearly observed in pigmented areas between stratum basale and papillary dermis. In this study, conversional analysis of CSLM digital images into numerical estimation using scanning probe image processor (SPIP) software was attempted for the first time. It is concluded that a quantification of CSLM images can pave way to expand the field of applications of CSLM.

NANO-STRUCTURAL AND NANO-CHEMICAL ANALYSIS OF NI-BASE ALLOY/LOW ALLOY STEEL DISSIMILAR METAL WELD INTERFACES

  • Choi, Kyoung-Joon;Shin, Sang-Hun;Kim, Jong-Jin;Jung, Ju-Ang;Kim, Ji-Hyun
    • Nuclear Engineering and Technology
    • /
    • v.44 no.5
    • /
    • pp.491-500
    • /
    • 2012
  • The dissimilar metal joints welded between Ni-based alloy, Alloy 690 and low alloy steel, A533 Gr. B with Alloy 152 filler metal were characterized by using optical microscope, scanning electron microscope, transmission electron microscope, secondary ion mass spectrometry and 3-dimensional atom probe tomography. It was found that in the weld root region, the weld was divided into several regions including unmixed zone in Ni-base alloy, fusion boundary, and heat-affected zone in the low alloy steel. The result of nanostructural and nanochemical analyses in this study showed the non-homogeneous distribution of elements with higher Fe but lower Mn, Ni and Cr in A533 Gr. B compared with Alloy 152, and the precipitation of carbides near the fusion boundary.

Electrostatically-Driven Polysilicon Probe Array with High-Aspect-Ratio Tip for an Application to Probe-Based Data Storage (초소형 고밀도 정보저장장치를 위한 고종횡비의 팁을 갖는 정전 구동형 폴리 실리콘 프로브 어레이 개발)

  • Jeon Jong-Up;Lee Chang-Soo;Choi Jae-Joon;Min Dong-Ki;Jeon Dong-Ryeol
    • Journal of the Korean Society for Precision Engineering
    • /
    • v.23 no.6 s.183
    • /
    • pp.166-173
    • /
    • 2006
  • In this study, a probe array has been developed for use in a data storage device that is based on scanning probe microscope (SPM) and MEMS technology. When recording data bits by poling the PZT thin layer and reading them by sensing its piezoresponse, commercial probes of which the tip heights are typically shorter than $3{\mu}m$ raise a problem due to the electrostatic forces occurring between the probe body and the bottom electrode of a medium. In order to reduce this undesirable effect, a poly-silicon probe with a high aspect-ratio tip was fabricated using a molding technique. Poly-silicon probes fabricated by the molding technique have several features. The tip can be protected during the subsequent fabrication processes and have a high aspect ratio. The tip radius can be as small as 15 nm because sharpening oxidation process is allowed. To drive the probe, electrostatic actuation mechanism was employed since the fabrication process and driving/sensing circuit is very simple. The natural frequency and DC sensitivity of a fabricated probe were measured to be 18.75 kHz and 16.7 nm/V, respectively. The step response characteristic was investigated as well. Overshoot behavior in the probe movement was hardly observed because of large squeeze film air damping forces. Therefore, the probe fabricated in this study is considered to be very useful in probe-based data storages since it can stably approach toward the medium and be more robust against external shock.

Vibration Characteristics and Performance of Cantilever for Non-contact Atomic Force Microscopy (비접촉 원자간력 현미경의 탐침 캔틸레버 진동 특성 및 측정 성능 평가)

  • 박준기;권현규;홍성욱
    • Transactions of the Korean Society for Noise and Vibration Engineering
    • /
    • v.14 no.6
    • /
    • pp.495-502
    • /
    • 2004
  • This paper presents the vibration analysis and the performance evaluation of cantilevers with probing tips for non-contact scanning probe microscopy. One of the current issues of the scanning probe microscopy technology is to increase the measurement speed, which is closely tied with the dynamic characteristics of cantilevers. The primary concern in this research is to investigate the relation between the maximum possible speed of non-contact scanning probe microscopy and the dynamic characteristics of cantilevers. First, the finite element analysis is made for the vibration characteristics of various cantilevers in use. The computed natural frequencies of the cantilevers are in good agreement with measured ones. Then, each cantilever is tested with topographic measurement for a standard sample with the scanning speed changed. The performances of cantilevers are analyzed along with the natural frequencies of cantilevers. Experiments are also performed to test the effects of how to attach cantilevers in the piezo-electric actuator. Finally, measurement sensitivity has been analyzed to enhance the performance of scanning probe microscopy.