• JSTS:Journal of Semiconductor Technology and Science
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• 제3권2호
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• pp.96-101
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• 2003

Direct evidence on the incorporation of high concentration of oxygen into undoped AlGaN layers for the AlGaN/GaN heterostuctures is provided by scanning photoemission microscopy using synchrotron radiation. In-situ annealing at $1000^{\circ}C$ resulted in a significant increase in the oxygen concentration at the AlGaN surface due to the predominant formation of Al-O bonds. The oxygen incorporation into the AlGaN layers resulting from the high reactivity of Al to oxygen can enhance the tunneling-assisted transport of electrons at the metal/AlGaN interface, leading to the reduction of the Schottky barrier height and the increase of the sheet carrier concentration near the AlGaN/GaN interface.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2009년도 제38회 동계학술대회 초록집
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• pp.367-367
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• 2010

The adsorption configurations of S-proline on Ge(100) were studied using scanning tunneling microscopy (STM), density functional theory (DFT) calculations, and high-resolution core-level photoemission spectroscopy (HRCLPES). We identified three adsorption structures of S-proline on Ge(100) through analysis of the STM images, DFT calculations, and HRCLPES results: (i) an 'intrarow O - H dissociated and N dative bonded structure', (ii) an 'O - H dissociation structure', and (iii) an 'N dative bonded structure'. Moreover, because adsorption through the N atom of S-proline produces a new chiral center due to symmetry reduction by N dative bonding, the adsorption configurations have either (R,S) or (S,S) chirality, yielding an (R,S)-'intrarow O - H dissociated and N dative bonded structure' and an (R,S)-'N dative bonded structure', with a preference for reaction at the Re face. This work presents a novel method for generating stereoselective attachment using S-proline molecules adsorbed onto a Ge(100) surface.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2010년도 제39회 하계학술대회 초록집
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• pp.89-89
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• 2010

The atomic structure of Sb/Si(5 5 12)-$2{\times}1$ surface, deposited at room temperature (RT) and post-annealed, has been identified by scanning tunneling microscopy and the corresponding interface has been studied by synchrotron core-level photoemission spectroscopy. With 0.3-nm Sb deposition at RT and postannealing at $600^{\circ}C$, the surface has been facetted to (225)-$2{\times}1$ and (112)-$1{\times}1$, and its Si 2p has shown that all the Si 2p surface components have disappeared, while the single Sb-Si interfacial component has appeared. Such results indicate that all of surface Si atoms are replaced by Sb atoms and the charge is transferred from Si to passivating Sb-atoms at the top layer. With subsequent postannealing up to $700^{\circ}C$, the surface has been facetted to (113)-$2{\times}2$ and (335)-$4{\times}2$, still having Sb-Si interfacial component and partially re-exposed Si surface components. From the present study, the role of surfactant atom, Sb, as well as the thermal-stabilization of Sb-passivated high-index Si surface will be exposed. Especially, the key role of the Sb/Si(113)-$2{\times}2$, composed of Rebonded-Dimer-Rebonded atom 1D structures, for stabilization will be discussed.

• 한국진공학회:학술대회논문집
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• 한국진공학회 2011년도 제41회 하계 정기 학술대회 초록집
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• pp.53-53
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• 2011

This paper describes results for surface and bulk characterization of the most promising thin film solar cell material for high performance devices, (Ag,Cu) (In,Ga) Se2 (ACIGS). This material in particular exhibits a range of exotic behaviors. The surface and general materials science of the material also has direct implications for the operation of solar cells based upon it. Some of the techniques and results described will include scanning probe (AFM, STM, KPFM) measurements of epitaxial films of different surface orientations, photoelectron spectroscopy and inverse photoemission, Auger electron spectroscopy, and more. Bulk measurements are included as support for the surface measurements such as cathodoluminescence imaging around grain boundaries and showing surface recombination effects, and transmission electron microscopy to verify the surface growth behaviors to be equilibrium rather than kinetic phenomena. The results show that the polar close packed surface of CIGS is the lowest energy surface by far. This surface is expected to be reconstructed to eliminate the surface charge. However, the AgInSe2 compound has yielded excellent atomic-resolution images of the surface with no evidence of surface reconstruction. Similar imaging of CuInSe2 has proven more difficult and no atomic resolution images have been obtained, although current imaging tunneling spectroscopy images show electronic structure variations on the atomic scale. A discussion of the reasons why this may be the case is given. The surface composition and grain boundary compositions match the bulk chemistry exactly in as-grow films. However, the deposition of the heterojunction forming the device alters this chemistry, leading to a strongly n-type surface. This also directly explains unpinning of the Fermi level and the operation of the resulting devices when heterojunctions are formed with the CIGS. These results are linked to device performance through simulation of the characteristic operating behaviors of the cells using models developed in my laboratory.

• 대한치과재료학회지
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• 제45권4호
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• pp.257-274
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• 2018

본 논문에서는 순수 티타늄(cp-Ti) 임플란트를 SLA (Sandblasting with Large grit and Acid) 처리할 때 산-처리 용액의 유형, 산-처리 온도 및 산-처리 시간 등이 티타늄 표면에 주는 영향을 평가하고자 하였다. 원판형의 cp-Ti 시편을 준비하여 표면을 인산칼슘계 세라믹 분말로 RBM (Resorbable Blast Media) 처리하였다. 산-처리 용액으로 염산을 30 vol%로 고정하고 황산의 농도를 10, 20, 30, 35 vol%로 증가시키며 혼합한 용액에 증류수를 추가하여 4종의 산-처리 용액을 준비하였다. 실험군은 4종의 산-처리 용액, 3 종의 처리온도 및 3 종의 처리시간 등 36 가지로 분류하여 실험군당 4개의 시편을 산-처리하였다. 산-처리 전 후 시편 무게를 전자저울로 측정하여 무게 감소비율을 계산하였고, 공초점주사전자현미경으로 표면거칠기를 측정하였다. X-선 회절분석기(XRD)로 XRD 패턴을 측정하였고, 주사전자현미경으로 표면 형상을 관찰하였으며, 에너지 분산형 분석기(EDX)와 광전자분광법(XPS)로 표면성분을 분석하였다. 무게 감소비율과 표면거칠기 측정값은 Tukey-multiple comparison test (p = 0.05)로 통계 분석하여 다음의 결과를 얻었다. 산-처리에 따른 티타늄 시편의 무게 감소는 황산의 농도 및 산-처리 용액의 온도가 높을수록 유의하게 증가하였다. 산-처리한 티타늄의 표면 거칠기는 산-처리 조건(황산 농도, 온도, 시간)에 일정한 영향을 받지 않았다. XRD 분석에서 산-처리한 모든 시편에서 티타늄(${\alpha}-Ti$)과 수소화 티타늄($TiH_2$) 결정상이 관찰되었고, XPS 분석으로 티타늄 표면에 얇은 n산화 티타늄 층이 형성된 것을 알 수 있었다. $90^{\circ}C$ 산-용액에서 처리할 경우 티타늄 표면이 과도하게 용해될 수 있으므로 주의하여야 한다.