• Proceedings of the Korean Society of Precision Engineering Conference
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• 2000.11a
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• pp.93-96
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• 2000

This study discusses a non-contact optical technique, phase shifting electronic speckle pattern interferometry, that is well suited for a deformation measurement. However, the phase shifting method has difficulties for determinating a deformation quantitatively beacuse of the characteristics of arctan function. In order to solve this problem, phase unwrapping methods has been studied during the last few years. In this study, using phase unwrapping based on line by line scanning phase shifted fringe patterns are studied to determinate a deformation quantitatively. Also least square fitting method is applied to reduce noise and improve image resolution.

• Proceedings of the Korean Powder Metallurgy Institute Conference
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• 2006.09a
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• pp.22-23
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• 2006

High velocity compaction (HVC) is a production technique with capacity to significantly improve the mechanical properties of powder metallurgy (PM) parts. Investigated here are green body data such as density, tensile strength, radial springback, ejection force and surface flatness. Comparisons are performed with conventional compaction using the same pressing conditions. Cylindrical samples of a pre-alloyed water atomized iron powder are used in this experimental investigation. The HVC process in this study resulted in a better compressibility curve and lower ejection force compared to conventional quasi static pressing. Vertical scanning interferometry measurements show that the HVC process gives flatter sample surfaces.

• Journal of the Optical Society of Korea
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• v.12 no.4
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• pp.281-287
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• 2008

An acousto-optic tunable filter based 3-D micro surface profile measurement using an equally spaced 5 spectral phase shifting is described. The 5-bucket spectral phase shifting method is compared with a Fourier-transform method in the spectral domain. It can provide a fast measurement capability while maintaining high accuracy since it needs only 5 pieces of spectrally phase shifted imaging data and a simple calculation in comparison with the Fourier transform method that requires full wavelength scanning data and relatively complicated computation. The 3-D profile data of micro objects can be obtained in a few seconds with an accuracy of ${\sim}10nm$. The 3-D profile method also has an inherent benefit in terms of being speckle-free in measuring diffuse micro objects by employing an incoherent light source. Those simplicity and practical applicability is expected to have diverse applications in 3-D micro profilometry such as semiconductors and micro-biology.

• Journal of the Institute of Electronics and Information Engineers
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• v.50 no.8
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• pp.253-263
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• 2013

Frequency Scanning Interferometry(FSI) system, one of the most promising optical surface measurement techniques, generally results in superior optical performance comparing with other 3-dimensional measuring methods as its hardware structure is fixed in operation and only the light frequency is scanned in a specific spectral band without vertical scanning of the target surface or the objective lens. FSI system collects a set of images of interference fringe by changing the frequency of light source. After that, it transforms intensity data of acquired image into frequency information, and calculates the height profile of target objects with the help of frequency analysis based on Fast Fourier Transform(FFT). However, it still suffers from optical noise on target surfaces and relatively long processing time due to the number of images acquired in frequency scanning phase. 1) a Polarization-based Frequency Scanning Interferometry(PFSI) is proposed for optical noise robustness. It consists of tunable laser for light source, ${\lambda}/4$ plate in front of reference mirror, ${\lambda}/4$ plate in front of target object, polarizing beam splitter, polarizer in front of image sensor, polarizer in front of the fiber coupled light source, ${\lambda}/2$ plate between PBS and polarizer of the light source. Using the proposed system, we can solve the problem of fringe image with low contrast by using polarization technique. Also, we can control light distribution of object beam and reference beam. 2) the signal processing acceleration method is proposed for PFSI, based on parallel processing architecture, which consists of parallel processing hardware and software such as Graphic Processing Unit(GPU) and Compute Unified Device Architecture(CUDA). As a result, the processing time reaches into tact time level of real-time processing. Finally, the proposed system is evaluated in terms of accuracy and processing speed through a series of experiment and the obtained results show the effectiveness of the proposed system and method.

• Korean Journal of Optics and Photonics
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• v.20 no.5
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• pp.272-275
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• 2009

In order to enhance the background noise filtering performance of the white light interferometry(WLI), we demonstrate the noise filtering performance of preprocessing of the measured fringe signals. The WLI was realized through a mirau interferometer which was equipped with a green LED. When measuring large-height and rough surface objects, the illumination optics are considered the numerical aperture(NA) and the depth of focus(DOF). In this case, the limited NA of the illumination optics has a considerable impact on the interference fringe. Therefore, we propose a preprocessing method that uses the intensity difference between the measured intensity and the moving average intensity. The performance is demonstrated by measuring an array of metal solder balls fabricated on printed circuit board(PCB). The proposed method reduces the noise pixels by 15 percent.

• Korean Journal of Optics and Photonics
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• v.17 no.1
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• pp.47-53
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• 2006

The Integrated Ballistics Identification Systems (IBIS) is widely used for bullet and casing signature identification. The IBIS obtains a pair of ballistic signatures from two bullets (or casings) using optical microscopy, and estimates a correlation score which can represent the degree of signature match. However, this method largely depends on lighting and surface conditions because optical image contrast is primarily a function of test surface's slope, shadowing, multiple reflections, optical properties, and illumination direction. Moreover, it can be affected with surface height variation. To overcome these problems and improve the identification system, we used well known surface topographic techniques, such as confocal microscopy and white-light scanning interferometry. The measuring instruments were calibrated by a NIST step height standard and verified by a NIST sinusoidal profile roughness standard and a commercial roughness standard. We also suggest a new analysis method for the ballistic identification. In this method, the maximum cross-correlation function CCFmax is used to quantify the degree of signature match. If the compared signatures were exactly the same, CCFmax would be $100\%$.

• Korean Journal of Optics and Photonics
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• v.21 no.1
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• pp.21-25
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• 2010

In this paper, in order to enhance the image reconstruction performance of white light scanning interferometry(WLI), we demonstrate the scattered point noise filtering performance of post-processing methods. Median filtering is similar to using an averaging filter. Because the median value is less sensitive than the mean to extreme values, the median filter can remove the scattered point noise from a height-map without significantly reducing the sharpness of the image. In several specific cases, however, the median filter can't remove the scattered point noise. Therefore, we propose a comparative mean filter that uses order-statistic filtering and the mean of the neighborhood pixels. The performance is demonstrated by measuring an array of metal solder balls fabricated on PCB. The proposed method reduced the noise pixels by 4.4 percent.

• Current Optics and Photonics
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• v.1 no.6
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• pp.604-612
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• 2017

An effective and precise method using a scanning white-light interferometer (SWLI) for three-dimensional surface measurements, in particular for roughness measurements, has been proposed. The measurement of a microscopically sloped area using an interferometer has limitations, due to the numerical aperture of the lens. In particular, for roughness measurements, it is challenging to obtain accurate height data for a sloped area using the interferometer, due to diffraction of the light. Owing to these optical limitations of the interferometer for roughness measurements, the Ra measurements performed using an interferometer contain errors. To overcome the limitations, we propose a method consisting of the following two steps. First, we evaluate the height data and set the invalid height area to be blank, using the characteristics of the modulus peak, which has a low peak value for signals that have low reliability in the interferogram. Next, we interpolate the blank area using the adjacent reliable area. Rubert roughness standards are used to verify the proposed method. The results obtained by the proposed method are compared to those obtained with a stylus profilometer. For the considered sinusoidal samples, Ra ranges from $0.053{\mu}m$ to $6.303{\mu}m$, and we show that the interpolation method is effective. In addition, the method can be applied to a random surface where Ra ranges from $0.011{\mu}m$ to $0.164{\mu}m$. We show that the roughness results obtained using the proposed method agree well with profilometer results. The $R^2$ values for both sinusoidal and random samples are greater than 0.995.

• Korean Journal of Optics and Photonics
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• v.20 no.1
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• pp.29-33
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• 2009

We propose a new measuring technique based on optical low-coherence reflectometry that enables us to determine the refractive index and the geometrical thickness of a transparent sample by one-time scanning only. By passing a collimated beam having a finite size through the edge of the sample, the refractive index and the geometrical thickness can be determined simultaneously from the comparison of interferograms generated by two kinds of reflected beams. In this study, a refractive index could be determined with the accuracy of $10^{-3}$, and its accuracy would be enhanced by using a more precise translator and a thicker sample.

• Journal of The Korean Astronomical Society
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• v.38 no.4
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• pp.437-443
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• 2005

The Solar Radio Burst Locator (SRBL) is a spectrometer that can observe solar microwave bursts over a wide band (0.1-18 GHz) as well as detect the burst locations without interferometry or mechanical scanning. Its prototype has been operated at Owens Valley Radio Observatory (OVRO) since 1998. In this study, we have evaluated the capability of the SRBL system in flux and radio burst location measurements. For this, we consider 130 microwave bursts from 2000 to 2002. The SRBL radio fluxes of 53 events were compared with the fluxes from USAF/RSTN and the burst locations of 25 events were compared with the optical flare locations. From this study, we found: (1) there is a relatively good correlation (r = 0.9) between SRBL flux and RSTN flux; (2) the mean location error is about 8.4 arcmin and the location error (4.7 arcmin) of single source events is much smaller than that (14.9 arcmin) of multiple source events; (3) the minimum location error usually occurred just after the starting time of burst, mostly within 10 seconds; (4) there is a possible anti-correlation (r = -0.4) between the pointing error of SRBL antenna and the location error. The anti-correlation becomes more evident (r=-0.9) for 6 strong single source events associated with X-class flares. Our results show that the flux measurement of SRBL is consistent with that of RSTN, and the mean location error of SRBL is estimated to be about 5 arcmin for single source events.