• Proceedings of the Korean Society of Surveying, Geodesy, Photogrammetry, and Cartography Conference
• /
• 2010.04a
• /
• pp.207-208
• /
• 2010

In this paper, we carried out calibration of laser scanning MMS(Mobile Mapping System) using Lynx Mobile Mapper, a new MMS developed at Optech Incorporated. Laser scanning MMS could be defined as an integration of several subsystems. Subsystems are composed of laser scanner, gps receiver and antenna, INS(Inertial Navigation System), DMI(Distance Measurement Instrument). These are obtained 3D spatial information by direct-georeferencing technology. To obtain 3D spatial information, calibration of laser scanning MMS is required prior to operation system, it is similar to airborme lidar system. 145 checkpoints were used to accuracy estimation. The accuracy results are about 5cm(RMSE) for calibration in all directions(east, north, ellipsoidal height).

• Ceramist
• /
• v.22 no.4
• /
• pp.368-380
• /
• 2019

A ceramic is used as a key material in various fields. Accordingly, the use of scanning electron microscopy is increased for the purpose of evaluating the reliability and defects of advanced ceramic materials. The scanning electron microscope is developed to overcome the limitations of optical microscopy and uses accelerated electrons for imaging. Various signals such as SE, BSE and characteristic X-rays provide useful information about the surface microstructure of specimens and, the content and distribution of chemical components. The development of electron guns, such as FEG, and the improved lens system combined with the advanced in-lens detectors and STEM-in-SEM system have expanded the applications of SEM. Automated SEM-EDS analysis also greatly increases the amount of data, enabling more statistically reliable results. In addition, X-ray CT, XRF, and WDS, which are installed in scanning electron microscope, have transformed SEM a more versatile analytical equipment. The performance and specifications of the scanning electron microscope to evaluate ceramics were reviewed and the selection criteria for SEM analysis were described.

• Korean Journal of Computational Design and Engineering
• /
• v.16 no.2
• /
• pp.126-136
• /
• 2011

The existing approaches to freeform building construction cause many problems. However, recent BIM technique development based on parametric modeling method and improvement of freeform materials manufacturing technology using IT technology encouraged many advanced countries to try experimental projects. Thus, laser scanning technique is in the limelight as a new alternative in the field of freeform building construction and inspection. This study selected a domestic small freeform building and practiced laser scanning and as-planned modeling by using Reverse Engineering. Then each deviation was comparatively analyzed through figures which extracted data by numerically analyzing the newly modeled as-built and Excel spread sheet. Through the process, limits and follow-up research subjects are discussed as well.

• Journal of Advanced Marine Engineering and Technology
• /
• v.12 no.4
• /
• pp.32-45
• /
• 1988

The scanning moire method, in which the master grating is replaced by the scanning line of television camera and in which the moire pattern is obtained by thining out some scanning line, is discussed by the sampling theory. It is determined also by the sampling theory that relationship between the fringe pattern. The programs that analyze the strain by the scanning moire method have been developed. For the simulation model in which we are able to calculate analytically the distribution of strains, the scanning moire method is discussed. It is shown that the small strains and the large strains are analyzed from the same picture by the thinning out technique and that the accuracy of analysis is improved by change of the phase in the thinning out technique.

• Proceedings of the Korean Institute of Building Construction Conference
• /
• 2014.11a
• /
• pp.100-101
• /
• 2014

The generation of 3D models for freeform buildings is an important task while continuous monitoring of the related spatial information at different time phases. Realistic models of freeform building have to provide high geometric accuracy and detail at an effective data size.(Al-kheder, S. 2008) The efficiency of this image-based technique has been increased considerably by the development of digital technologies. Furthermore, 3D data collection based on laser scanning has become an high quality 3D models for construction site. Therefore, in this research, we have an effort to review construction methods to make freeform envelope of building using 3D scanning technology.

• Proceedings of the Korean Society of Machine Tool Engineers Conference
• /
• 2005.05a
• /
• pp.15-18
• /
• 2005

We have designed and fabricated a thermal scanning electron microscopy. It includes an electron source, two condenser lenses, one objective lens, a scanning coil and a stigmator coil for focusing in column and also have a secondary electron detector for constructing the image in chamber with a high vacuum condition and control part for operating the SEM. Especially, in order for us to find out the optical characteristics, our attention and studies have been concentrated on the effects of two condenser lenses and one objective lens for high resolution with SEM. Finally, we developed a high resolution thermal scanning electron microscopy.

• Transactions of the Korean Society of Mechanical Engineers B
• /
• v.31 no.2 s.257
• /
• pp.181-187
• /
• 2007

Conventional PIV method uses two optical axis configuration during the image grabbing process. That is, the illumination plane and the recording plane must be parallel. This configuration is very natural to grab the whole field without the image distortion. In the real problem, it is often to meet the situation when this configuration is hard to be fulfilled. In the present study, the new PIV method which uses only single optical axis to grab the particle images is developed. This new PIV method becomes possible by utilizing the scanning method similar to the echo PIV technique. One particle image of the scanning PIV consists of scanned several line images and by repeating this scanning process, two particle images were grabbed and processed to produce the velocity vectors. An optimization study was performed to find parameters which minimize the measurement errors. The effects of particle diameter, beam overlap ratio and particle number density were investigated.

• Journal of the Korean Society of Manufacturing Technology Engineers
• /
• v.18 no.5
• /
• pp.455-461
• /
• 2009

In a scanning electron microscopy, image distortion is a critical issue and it is needed to be eliminated by some kinds of schemes. In this work, scanning frequency and scanning wave form are adjusted to have an improved image. The relationship between scan coil and its driver is investigated and appropriate frequency and wave form are suggested. It is proved that the selected frequency and wave form showed an enhanced image with less distortion, which were done by experiments. In addition, a noise elimination is addressed, providing improved image with a GROUND signal integration with the amplifier and the scan driver.

• Journal of the Semiconductor & Display Technology
• /
• v.11 no.3
• /
• pp.1-6
• /
• 2012

In this paper, inspection system based on optical scanning mechanism is designed and developed for solar cell wafer. It consists of optical scanning mechanism, NIR camera optics, machinery and control system, algorithm of defect detection and software. Optical scanning mechanism is composed of geometrical camera optics and structured hybrid illumination system. It is used to inspection of surface defects. NIR camera optics is used for inspection of defects inside solar cell wafer. It is shown that surface and internal micro defects can be detected in developed inspection system for solar cell wafer.

• The Journal of Korean Institute of Communications and Information Sciences
• /
• v.22 no.8
• /
• pp.1622-1631
• /
• 1997

A 3-stages Active Microstrip Phased Array Antenn(AMPAA) is implemented using Injection-Locking Coupled Oscillators(ILCO). The AMPAA is a beam scanning active antenna with capability of electrical scanning by frequency varation of ILCO. The synchronization of resonance frequencies in array elements is occured by ILCO, and the ILCO amplifies the injection signal and functions as a phase shifter. The microstrip ptch is operated as a radiation element. The unilateral amplifier is a mutual coupling element of AMPAA, eliminates the reverse locking signal and controls the locking bandwidth of ILCO. The possibility of Monolithic Microwave Integrated Circuits(MMIC) of T/R module is proposed by simplified and integrated fabrication process of AMPAA. The 0.75.$lambda_{0}$ is fixed for a mutual coupling space to wide the scanning angle and minimize the multi-mode. The AMPAA has beam scanning angle of 31.4.deg., HPBW(Half Power Beam Widths) of 26.deg., directive gain of 13.64dB and side lobe of -16.5dB were measured, respectively.