• Journal of the Korean Society for Precision Engineering
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• v.25 no.7
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• pp.19-26
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• 2008

• Journal of the Korean Society for Precision Engineering
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• v.27 no.10
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• pp.34-39
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• 2010

We developed a path algorithm for ultrafast/wide area laser processing. Demands for high precision laser processing with a wide area has been increasing for a number of applications such as in solar cell battery, display parts, electronic component and automobile industry. Expansion of the area in which laser processing is an important factor to handle the ultrafast/wide area processing, it will require a processing path. Processing path is path of 2- axis stage and stage of change in velocity can be smooth as possible. In this paper, we proposed a smoothingnurbs method of improved speed profile. This method creates soft path from edge part, it is main purpose that scan area ($50mm{\times}50mm$) inside processing path makes path of topology of possible straight line. We developed a simulation tool using Visual C++.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.36C no.2
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• pp.14-25
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• 1999

The IEEE standard 1149.1, which was proposed to increase the observability and the controllability in I/O pins, makes it possible the board level testing. In the boundary-scan environments, many shift operations are required due to their serial nature. This increases the test application time and the test application costs. To reduce the test application time, the method based on the parallel opereational multiple scan paths was proposed, but this requires the additional I/O pins and the internal wires. Moreover, it is difficult to make the designs in conformity to the IEEE standard 1149.1 since the standard does not support the parallel operation of data shifts on the scan paths. In this paper, the multiple scan path access algorithm which controls two scan paths simultaneously with one test bus is proposed. Based on the new algorithm, the new algorithm, the new board level BIST architecture which has a relatively small area overhead is developed. The new BIST architecture can reduce the test application time since it can shift the test patterns and the test responses of two scan paths at a time. In addition, it can reduce the costs for the test pattern generation and the test response analysis.

• Journal of the Korean Society for Precision Engineering
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• v.32 no.1
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• pp.89-96
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• 2015

In this paper, it is studied that kinematic analysis of a 5-axis ultrasonic inspection equipment. The equipment is comprised of three straight axes and two rotary axes. With features of ultrasonic, the transmitter and receiver of the equipment are vertical to a test surface, operating at regular intervals. To perform this well, the motions of every link should be found on the based of kinematic analysis of the equipment. We chose starting point for testing and defined relations among all links through transformation of coordinates. For double curvature-shaped test object, we generated test paths. To follow these, we found motions of all links using inverse kinematics. By using Matlab/Simulink, simulator was developed, so that we could find out desired trajectories of main axes for a scan.

• The Transactions of the Korea Information Processing Society
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• v.6 no.6
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• pp.1656-1666
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• 1999

The more complex and large digital circuits become, the more important delay test becomes which guarantees that circuits operate in time. In this paper, the proposed algorithm is developed, which enable the fast indirect implication for efficient test pattern generation in sequential circuits of standard scan environment. Static learning algorithm enables application of a new implication value using contrapositive proposition. The static learning procedure found structurally, analyzes the gate structure in the preprocessing phase and store the information of learning occurrence so that it can be used in the test pattern generation procedure if it satisfies the implication condition. If there exists a signal line which include all paths from some particular primary inputs, it is a partitioning point. If paths passing that point have the same partial path from primary input to the signal or from the signal to primary output, they will need the same primary input values which separated by the partitioning point. In this paper test pattern generation can be more effective by using this partitioning technique. Finally, an efficient delay fault test pattern generator using indirect implication is developed and the effectiveness of these algorithms is demonstrated by experiments.

• Proceedings of the International Union of Geodesy And Geophysics Korea Journal of Geophysical Research Conference
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• 2003.05a
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• pp.14-14
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• 2003

SAR (Synthetic Aperture Radar) is an imaging radar which can scan and image Earth System targets without solar illumination. Most Earth observation Shh systems operate in X-, C-, S-, L-, and P-band frequencies, where the shortest wavelength is approximately 1.5 cm. This means that most opaque objects in the SAR signal path become transparent and SAR systems can image the planetary surface targets without sunlight and through rain, snow and/or even volcanic ash clouds. Most conventional SAR systems in operation, including the Canada's RADARSAT-1, operate in one frequency and in one polarization. This has resulted in black and with images, with which we are familiar now. However, with the launching of ENVTSAT on March 1 2002, the ASAR system onboard the ENVISAT can image Earth's surface targets with selected polarimetric signals, HH+VV, HH+VH, and VV+HV. In 2004, Canadian Space Agency will launch RADARSAT-II, which is C-band, fully polarimetric HH+VV+VH+HV. Almost same time, the NASDA of Japan will launch ALOS (Advanced land Observation Satellite) which will carry L-band PALSAR system, which is again fully polarimetric. This means that we will have at least three fully polarimetric space-borne SAR system fur civilian operation in less than one year. Are we then ready for this new all weather Earth Observation technology\ulcorner Actual imaging process of a fully polarimetric SAR system is not easy to explain. But, most Earth system scientists, including geologists, are familiar with polarization microscopes and other polarization effects in nature. The spatial resolution of the new generation of SAR systems have also been steadily increased, almost to the limit of highest optical resolution. In this talk some new applications how they are used for Earth system observation purpose.

• Journal of the Institute of Electronics Engineers of Korea SP
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• v.41 no.3
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• pp.139-146
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• 2004

A 2D/3D complex optical system and its vision inspection algerian is proposed and implemented as a single probe system for high speed, precise vision inspection of the solder pastes. One pass un length labeling algorithm is proposed instead of the conventional two pass labeling algorithm for fast extraction of the 2D shape of the solder paste image from the recent line-scan camera as well as the conventional area-scan camera, and the optical probe path generation is also proposed for the efficient 2D/3D inspection. The Moire interferometry-based phase shift algerian and its optical system implementation is introduced, instead of the conventional laser slit-beam method, for the high precision 3D vision inspection. All of the time-critical algorithms are MMX SIMD parallel-coded for further speedup. The proposed system is implemented for simultaneous 2D/3D inspection of 10mm${\times}$10mm FOV with resolutions of 10 ${\mu}{\textrm}{m}$ for both x, y axis and 1 ${\mu}{\textrm}{m}$ for z axis. Experiments conducted on several nBs show that the 2D/3D inspection of an FOV, excluding an image capturing, results in high speed of about 0.011sec/0.01sec, respectively, after image capturing, with $\pm$1${\mu}{\textrm}{m}$ height accuracy.