• Journal of the Semiconductor & Display Technology
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• v.19 no.3
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• pp.77-81
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• 2020

In this paper, we create scaffold defect classification models using machine learning based data. We extract the characteristic from collected scaffold external images using USB camera. SVM, KNN, MLP algorithm of machine learning was using extracted features. Classification models of three type learned using train dataset. We created scaffold defect classification models using test dataset. We quantified the performance of defect classification models. We have confirmed that the SVM accuracy is 95%. So the best performance model is using SVM.