• Progress in Superconductivity
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• v.10 no.2
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• pp.116-122
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• 2009

We introduce a measurement method that enables to measure the penetration depth($\lambda$) of superconductor films by using a short-ended parallel plate sapphire resonator. Variations in the $\lambda$ of $MgB_2$ films could be measured down to the lowest temperature using a sapphire resonator with a $YBa_2Cu_3O_{7-x}$ film at the bottom. A model equation of $\lambda=\lambda_0[1-(T/T_c)^{\tau}]^{-1/2}$ for $MgB_2$ films appeared to describe the observed variations of the resonant frequency of the sapphire resonator with temperature, with $\lambda_0,\;\tau$, and $T_C$ used as the fitting parameters.

• Progress in Superconductivity
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• v.1 no.1
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• pp.36-41
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• 1999

Methods for mode identification and accurate measurements of the unloaded Q ($Q_0$) of a dielectric-loaded $TE_{01{\delta}}$ mode cavity resonator with HTS endplates are proposed. A resonator with a sapphire rod and $YBa_2Cu_3O_{7-x}$(YBCO) endplates was prepared and its microwave properties were studied at temperatures above 30 K. The $TE_{01{\delta}}$ mode $Q_0$ of the resonator, designed to work as a tunable resonator with variations in the gap distance (s) between the sapphire rod and the top YBCO, was more than 1000000 at s = 0 mm and at 30 K with the resonant frequency of 19.56 GHz. The $TE_{01{\delta}}$ mode $Q_0$ decreases as s increases for s < 2 mm until mode couplings between the $TE_{01{\delta}}$ mode and other modes appeared at s = 2 mm. Significant dependence of the $TE_{01{\delta}}$ mode $Q_0$ on the input and output coupling constants was also observed. Applications of the open-ended $TE_{01{\delta}}$ mode cavity resonator for a tunable resonator with a very high Q as well as a characterization tool for the surface resistance measurements of HTS films are described.

• Progress in Superconductivity
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• v.11 no.2
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• pp.106-111
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• 2010

Sapphire resonators with $YBa_2Cu_3O_{7-\delta}$ (YBCO) endplates have provided a way to realize extremely high quality factor due to the extremely low dielectric loss of sapphire and conductive loss of YBCO films, which enables to measure the low surface resistance of superconductor films at microwave frequencies. We present microwave properties of HTS sapphire resonators designed for measuring the surface resistance of HTS films at millimeter-wave frequencies by using the two-resonance mode dielectric resonator method. Despite enhanced surface resistance ($R_S$) of YBCO films due to the quadratic frequency dependence of the $R_S$, the unloaded quality factor ($Q_0$) of the $TE_{021}$ mode sapphire resonator still appears to be well above $1\;{\times}\;10^6$ at a mm-wave frequency of 38 GHz at 10 K. However, it appears that the $TE_{012}$ mode $Q_0$ is unexpectedly low despite that the corresponding resonance peak looks uncoupled with parasitic modes. We discuss possible reasons for the unexpected results using the surface resistance at the $TE_{021}$, $TE_{012}$, and $TE_{011}$ mode frequencies.

• 한국초전도학회:학술대회논문집
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• v.9
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• pp.75-82
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• 1999

TE$_{01\;{\delta}}$ mode Cavity Resonators with a low loss dielectric rod and YBa$_2Cu_3O_{7-{\delta}}$ (YBCO) endplates were prepared and their microwave properties were studied at temperatures above 30 K. Both sapphire and rutile were used as the dielectrics. The TE$_{01\;{\delta}}$ mode Q$_0$ of the resonator, designed to work as a tunable resonator with variations in the gap distance (s) between the dielectric rod and the top YBCO, was more than 1000000 at s = 0 mm and at 30 K and .the resonant frequency of 19.56GHz when a sapphire rod was used for the dielectric. The TE$_2Cu_3O_{7-{\delta}}$ mode resonant frequency (f$_0$) appeared to decrease as the temperature is raised. Meanwhile, the temperature dependence of the TE$_2Cu_3O_{7-{\delta}}$ mode f$_0$ of the rutile-loaded resonator appeared different with f$_0$ increasing according to the temperature and Q$_0$ more than 300000 at 30 K and f$_0$ = 8.56 CHz. Comparisons were made between the microwave properties of the sapphire-loaded and the rutile-loaded resonators. Also, applications of the TE$_2Cu_3O_{7-{\delta}}$ mode cavity resonator for a tunable resonator with a very high Q$_0$ as · well as a characterization tool for surface resistance measurements of HTS films are described.

• Proceedings of the Optical Society of Korea Conference
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• 2005.02a
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• pp.140-141
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• 2005

• Korean Journal of Optics and Photonics
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• v.18 no.1
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• pp.66-73
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• 2007

The various output characteristics of a pulsed Ti:sapphire laser oscillator with a plane-parallel resonator, pumped longitudinally by the second harmonic wave of a Nd:YAG laser, and the output of a Ti:sapphire laser amplifier operated along the single path of the oscillator beam were investigated and analyzed. In the case of the oscillator, we measured the spectrum, the pulse buildup time, the temporal duration time of the pulse, and the output energy according to the variation of the pumping energy, resonator length, and the reflectance of the output coupler. And, in the case of the amplifier, we investigated and analyzed the output energy of the amplifier as a function of the time difference between the two pump beams of the oscillator and the amplifier, the pumping energy of the oscillator, and the pumping energy of the amplifier When pump energies of both the oscillator and the amplifier were 18 mJ/pulse, we could find that the output energy of the amplifier increased linearly and gradually up to the time difference of 35 ns. Finally, we determined that the slope efficiencies of the oscillator and the amplifier were 23.5 % and 11.6 %, respectively.

• Progress in Superconductivity
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• v.8 no.2
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• pp.143-151
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• 2007

Accurate measurements of the microwave surface resistance (Rs) of high temperature superconductor (HTS) films are important with regard to applications of HTS materials for wireless communications. As the surface resistance values of HTS films are usually extracted from the measured unloaded quality factor ($Q_0$) of resonators made of HTS films, it is essential to measure the resonator $Q_0$ with accuracy. The $TE_{011}\;mode\;Q_0$ of sapphire resonators with the endplates made of $YBa_2Cu_3O_{7-{\delta}}$(YBCO) film on $LaAlO_3$ is measured by using the S-parameter circle-fit method at a frequency of about 19.6 GHz and temperatures of 30 K to 90 K, which is compared with the measured values by using the Lorentzian-fit method. Good agreements are found between the two sets of $Q_0$ values measured by using the two different methods whether the resonator is used in a weak-coupling scheme or a strong-coupling scheme, showing reliability of both methods fur measuring the resonator $Q_0$ accurately. The $Q_0$ of sapphire resonators with a gap between the top plate and the rest of the resonator is also discussed.

• 한국초전도학회:학술대회논문집
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• v.10
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• pp.201-206
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• 2000

Effects of the post-annealing temperature of CeO$_2$ buffer layers on the properties of YBCO films on CeO$_2$-buffered sapphire were investigated. 45 nm-thick CeO$_2$ buffer layer was prepared in-situ on r-cut sapphire using an on-axis rf magnetron sputtering method, which was later post-annealed at temperatures between 950$^{\circ}$C and 1100$^{\circ}$C in an oxygen-flowing environment. YBCO films were prepared on CeO$_2$-buffered sapphire (CbS), for which the surface morphology, crystal structures and electrical properties of the YBCO films were studied. YBCO films on post-annealed CbS appeared to have better properties than those on as-grown CbS with regard to the morphological, structural and electrical properties when the YBCO films were prepared on CeO$_2$ buffer layer post-annealed at temperatures of 1000 - 1050$^{\circ}$C. A TE$_{011}$ mode rutileloaded cylindrical cavity resonators was fabricated with the YBCO films placed as the endplates, for which the unloaded Q of the resonator was measured. It turned out that the resonator with the endplates prepared from the YBCO films on postannealed CbS at 1000 $^{\circ}$C showed the highest unloaded Q with the value more than 8 ${\times}$ 10$^5$ at 30 K and 8.6 CHz, revealing that the YBCO films on post-annealed CbS at 1000$^{\circ}$C the temperature could be the lowest among the YBCO films on post-annealed CbS.

• Progress in Superconductivity
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• v.2 no.2
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• pp.86-91
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• 2001

Temperature dependences of the unloaded Ｑ(Ｑ$_{0}$) and the resonant frequency ( $f_{0}$) of YB $a_2$C $u_3$ $O_{7-{\delta}}$ (YBCO) microstrip ring resonators and rutile-loaded cylindrical cavity resonators were measured at low temperatures. Dc magnetron-sputtered YBCO films grown on Ce $O_2$-buffered r-cut sapphire (CbS) substrates were used fur this purpose. The surface resistances ( $R_{s}$) of YBCO films measured by both a microstrip ring resonator and a TE $01\delta$/ mode rutile-loaded cylindrical cavity resonator are compared with each other. It turned out that the values of $R_{s}$ measured by the microstrip resonator technique are comparable to those by the rutile-loaded resonator technique at temperatures lower than ~50 K. However, above 50 K, the $R_{s}$ measured by the microstrip resonator technique appeared higher according to the temperature. Our results show that the current crowding effects near the edge of a microstrip resonator become more significant at temperatures near the critical temperature.emperature.e.e.e.e.e.e.

• 한국초전도학회:학술대회논문집
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• v.10
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• pp.173-178
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• 2000

A prototype for a highly sensitive, automated measurement system for the microwave surface resistance of high-T$_c$ superconductor films was set up, and tested by measuring the microwave surface resistances of high-T$_c$ YBa$_2$Cu$_3$O$_{7-{\delta}}$(YBCO) films at the frequency of about 19.6 GHz and the temperature of 30 K ${\sim}$ 90 K. An open-ended TE$_{011}$ mode sapphire-loaded cylindrical cavity resonator was used as the measurement probe, where YBCO films were used as the endplates of the cylindrical cavity. The characteristics of the measurement system include functions to display the unloaded ${\varrho}$ and the resonant frequency of the TE$_{011}$ mode resonator as well as the microwave surface resistance of the YBCO films, all simultaneously as a function of temperature. Applicability of the measurement system for investigating the homogeneity in the microwave properties of large high-T$_c$ superconductor films is discussed.