• Title/Summary/Keyword: SE Measurement

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Ga Distribution in Cu(In,Ga)Se2 Thin Film Prepared by Selenization of Co-Sputtered Cu-In-Ga Precursor with Ga2Se3 Layer (Ga2Se3 층을 Cu-In-Ga 전구체 위에 적용하여 제조된 Cu(In,Ga)Se2 박막의 Ga 분포 변화 연구)

  • Jung, Gwang-Sun;Shin, Young-Min;Cho, Yang-Hwi;Yun, Jae-Ho;Ahn, Byung-Tae
    • Korean Journal of Materials Research
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    • v.20 no.8
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    • pp.434-438
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    • 2010
  • The selenization process has been a promising method for low-cost and large-scale production of high quality CIGS film. However, there is the problem that most Ga in the CIGS film segregates near the Mo back contact. So the solar cell behaves like a $CuInSe_2$ and lacks the increased open-circuit voltage. In this study we investigated the Ga distribution in CIGS films by using the $Ga_2Se_3$ layer. The $Ga_2Se_3$ layer was applied on the Cu-In-Ga metal layer to increase Ga content at the surface of CIGS films and to restrict Ga diffusion to the CIGS/Mo interface with Ga and Se bonding. The layer made by thermal evaporation was showed to an amorphous $Ga_2Se_3$ layer in the result of AES depth profile, XPS and XRD measurement. As the thickness of $Ga_2Se_3$ layer increased, a small-grained CIGS film was developed and phase seperation was showed using SEM and XRD respectively. Ga distributions in CIGS films were investigated by means of AES depth profile. As a result, the [Ga]/[In+Ga] ratio was 0.2 at the surface and 0.5 near the CIGS/Mo interface when the $Ga_2Se_3$ thickness was 220 nm, suggesting that the $Ga_2Se_3$ layer on the top of metal layer is one of the possible methods for Ga redistribution and open circuit voltage increase.

Mössbauer Study of (Fe0.95Ni0.05)7Se8 ((Fe0.95Ni0.05)7Se8의 뫼스바우어 분광학적 연구)

  • Kim, Eng-Chan
    • Journal of the Korean Magnetics Society
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    • v.24 no.2
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    • pp.41-45
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    • 2014
  • By M$\ddot{o}$ssbauer spectroscopy and x-ray measurement $(Fe_{0.95}Ni_{0.05})_7Se_8$ has been studied. The crystal structure of $(Fe_{0.95}Ni_{0.05})_7Se_8$ is found to be a triclinic superstructure of the NiAs sturcture while $Fe_7Se_8$ has a orthohexagonal superstructure. Abrupt changes of quadrupole shifts near 125 K for $(Fe_{0.95}Ni_{0.05})_7Se_8$ suggests that the spin-rotation transition proceeds abruptly, in contrast with the gradual transition reported for $Fe_7Se_8$ with a triclinic superstructure. Isomer shifts indicate a ferrous state for the iron ions at all four states.

Effect of thermal annealing for $CuInSe_2$ layers obtained by photoluminescience measurement

  • Hong, Kwang-Joon;Kim, Hae-Jeong
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2009.06a
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    • pp.86-87
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    • 2009
  • High quality $CuInSe_2$ (CIS) were grown on GaAs substrate by using the hot wall epitaxy method. The behavior of point defects in the CIS layer investigated by using photoluminescence (PL) at 10 K. Point defects originating from $V_{Cu}$, $V_{Se}$, $Cu_{int}$, and $Se_{int}$ were classified as donor or acceptor types. These PL results also led us to confirm that the p-type CIS layer had obviously converted into n-type after the Cu atmosphere treatment. Finally, we found that the In in the CIS layer did not form the native defects, because In existed in the form of stable bonds in the CIS layer.

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Electromagnetic interference(EMI) shielding efficiency(SE) charhcteristics of IMI multilayer/PMMA structure for plasma display panel(PDP) filter.

  • Lee, Jung-Hyun;Sohn, Sang-Ho;Cho, Yong;Lee, Sang-Gul
    • 한국정보디스플레이학회:학술대회논문집
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    • 2006.08a
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    • pp.872-876
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    • 2006
  • This study was made to examine the electromagnetic interference(EMI) shielding effect (SE) of multilayered thin films in which indium-tin oxide(ITO) and Ag were deposited alternately from 3layer to 9 layer on Poly Methyl Meth Acrylate(PMMA) substrate at room temperature using a PF sputtering. We measured optical and electrical characteristics by UV-spectrometer and 4 point probe. The measurement of EMI SE in frequency range from 50MHz to 1.5GHz was performed by using ASTM D4935-89 method. We compared the measured EMI SEs with theoretical simulation data. We obtained relatively low resistivity and high transmittance from the EMI SE multilayers. In this study, we obtain good optical electrical characteristics with a minimun transmittance of about 60% at 550nm wavelength and sheet resistance of $2{\sim}3ohm/sq$., respectivity. Measured EMI SEs were over 50dB and similar to theoretical simulation data.

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The Moving Photocarrier Grating (MPG) Technique for the Transport Properties of α-Se:As Films

  • Park, Chang-Hee;Lee, Kwang-Sei;Kim, Jeong-Bae;Kim, Jae-Hyung
    • Transactions on Electrical and Electronic Materials
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    • v.6 no.6
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    • pp.280-283
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    • 2005
  • The moving photocarrier grating (MPG) technique for the determination of the carrier mobilities and the recombination lifetime of $\alpha$-Se:As films has been studied. The electron and hole drift mobility and the recombination lifetime of $\alpha$-Se films with arsenic (As) additions have been obtained from measurement of the short circuit current density $j_{sc}$ as a function of grating velocity and spatial period. The hole mobility decreases due to defect density of hole traps when x exceeds 0.003, whereas the hole mobility increases for the case of low As addition (x$\le$0.003). We have found an increase in hole drift mobility and recombination lifetime, especially when As with (x = 0.003) is added into the $\alpha$-Se film.

Transport property of a Se:As films for digital x ray imaging

  • Kim, Jae-Hyung;Nam, Sang-Hee
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2006.04a
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    • pp.85-88
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    • 2006
  • The transport properties of amorphous selenium typical of the material used in direct conversion x-ray imaging devices are reported. The effects of As addition on the carrier mobility and recombination lifetime in amorphous selenium (a-Se) films have been studied using the moving photocarrier grating (MPG) technique. We have found an increase in hole drift mobility and recombination lifetime, especially when 0.3% As is added into a-Se film, whereas electron mobility decreases with As addition due to the defect density. The transport properties for As doped a-Se films obtained by using MPG technique have been compared with the drift mobilities of holes and electrons obtained by time of flight (TOF) measurement.

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Development of Fast-Response Portable NDIR Analyzer Using Semiconductor Devices

  • Kim, Woo-Seok;Lee, Jong-Hwa;Park, Young-Moo;Yoo, Jai-Suk;Park, Kyoung-Seok
    • Journal of Mechanical Science and Technology
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    • v.17 no.12
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    • pp.2099-2106
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    • 2003
  • In this paper, a novel fast response NDIR analyzer (FRNDIR), which uses an electrically pulsed semiconductor emitter and dual type PbSe detector for the PPM-level detection of carbon dioxide (CO$_2$) at a wavelength of 4.28 $\mu\textrm{m}$, is described. Modulation of conventional NDIR energy typically occurs at 1 to 20 Hz. To achieve real time high-speed measurement, the new analyzer employs a semiconductor light emitter that can be modulated by electrical chopping. Updated measurements are obtained every one millisecond. The detector has two independent lead selenide (PbSe) with IR band pass filters. Both the emitter accuracy and the detector sensitivity are increased by thermoelectric cooling of up to -20 degrees C in all semiconductor devices. Here we report the use of semiconductor devices to achieve improved performance such that these devices have potential application to CO$_2$ gas measurement and, in particular, the measurement of fast response CO$_2$ concentration at millisecond level.

Optimal Placement of Phasor Measurement Unit for Observation Reliability Enhancement

  • TRAN, Van-Khoi;ZHANG, He-sheng;NGUYEN, Van-Nghia
    • Journal of Electrical Engineering and Technology
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    • v.12 no.3
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    • pp.996-1006
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    • 2017
  • Phasor Measurement Unit (PMU) placement is a crucial problem for State Estimation (SE) of the power system, which can ensure that the power network is fully observed. Further, the observation reliability problem of the system has been concerned in the operation conditions. In this paper, based on modified weighted adjacent matrix ($A_w$), an optimal placement method is proposed to solve simultaneously two problems involving the optimal PMU placement problem and the observation reliability enhancement problem of the system. The purpose of the proposed method is to achieve both the minimum total cost and the maximum observation reliability, with a focus on increasing the security of observability, strengthening the observation reliability of buses as well as enhancing the effectiveness of redundancy. Simulations on IEEE 14, 24, 30 and 57 bus test systems are presented to justify the methodology. The results of this study show that the proposed method is not only ensuring the power network having the observability effectively but also enhancing significantly the observation reliability. Therefore, it can be a useful tool for SE of the power system.