• 전기의세계
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• 제21권1호
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• pp.17-21
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• 1972

Electrical resistivity and switching phenomena in glass semiconductor of AsTe and AsTeGa is studied. Samples sliced from ingot which is air quenched or water quenched, show high resistivity at room temperature. The resistivity of the AsTe and AsTeGa is 1*10$^{6}$ .ohm.-cm and 5*10$^{6}$ .ohm.-cm at 27.deg. C. Switching phenomena take place in thin the thick samples. Holding voltage is different with the thickness of the samples and the characteristics of switching in the thin and thick samhles are similar. When square wave pulse voltage is applied, delay time is detected to 5.mu.sec by oscilloscpoe.

• 전기의세계
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• 제23권6호
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• pp.49-55
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• 1974

Amorphous semiconductor from As 30 Te 48 Ge 10 Si 12 was prepared, and studied electron microscopy, X-ray analysis and resistivity measurement. It's resistivity is 1.56*10$^{6}$ .ohm.-cm when small ampule is used for preparing sample it is found that no phase separation has occurced by electron microscopy, and that phase transition temperature is 232.deg. C by differential Thermal Analysis. The specimen showed threshold switching that the low resistance state occur at critical electric field and the resistance recover at low applied field. Critical electric field of the switching is 10$^{5}$ V/cm at room temperature. Threshold voltage secreace exponentially with increasing ambient temperature and at that each voltage resistance of the switching device increase exponentially. According to the series resistance and applied vottage current slope on the V-I curve is varied. When applied voltage is decreased after switching, the resistance of the switching device is increased. By this result the origin of the switching is the Joule's heating.

• 정보저장시스템학회:학술대회논문집
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• 정보저장시스템학회 2005년도 추계학술대회 논문집
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• pp.40-41
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• 2005

• 한국세라믹학회지
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• 제22권2호
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• pp.11-16
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• 1985

The semiconducting ceramics having positive temperature coefficient of resistivity in he family of 0.25mol% $Sb_2O_3$ doped barium titanates were prepared with AST ($4Al_2O_3$.$9SiO_2$.$3TiO_2$) and $MnO_2$ as additives and these electrical properties were investigated. The PTCR characteristic in these ceramic materials was improved by the addition of AST and $MnO_2$ because the addition of AST decreased the room temperature resistivity and controlled grin size due to the formation of a liquid phase during sintering and the addition of $MnO_2$ improved by forming acceptor level on the intergranular layer. On dependence on the switching time as switching temperature was increased the initial power and switching time increased.

• 한국화재소방학회논문지
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• 제19권2호
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• pp.75-80
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• 2005

적충형 PTC 서미스터의 특성연구를 위해 $(0.90Ba+0.05Sr+0.05Ca)TiO_3+0.01TiO_3+0.01SiO_2+0.0008MnO_2+0.0018Nb_2O_5$와 같은 실험조성식을 설정한 후 표면실장(SMD) 적층형 PTC 시편을 제작하였다. 그 결과 상온 비저항 값을 크게 낮출 수 있고 용도에 따라 전류용량을 크게 할 수 있었으나 적층화로 인해 peak 비저항이 크게 낮아지고 열용량이 커짐으로써 스위칭(switching)시간이 늦어지는 점을 확인하였다. 전압-전류 특성에서는 적층수가 증가할수록 초기 최대전류값이 증가하며 큐리점에 대응하여 저항값이 급격히 커지는 전이전압(전계)도 증가함을 보였다. 그러나 인가전압(전계)을 증가시킬 경우 peak 비저항값을 높일 수 있어 스위칭시간을 줄일 수 있다 이 소자는 화재감지기의 센서로 활용될 수 있다.

• 대한전기학회논문지
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• 제41권9호
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• pp.1013-1020
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• 1992

The conductivity variation of a high resistivity bulk silicon semiconductor, whose electrodes were deposited with aluminum vapor, was studied experimentally by measuring the X-ray intensity and current flow, which was developed by X-ray radiation while applying a pulse voltage to the silicon, in a load resistor connected to the semiconductor. The current flow observed immediately as the X-ray radiated, and when the X-ray decreased. It was found from the observation of switching current for the X-ray intensity and the voltage applied in the semiconductor that the switching current of the semiconductor increased as the intensity of the X-ray and the applied voltage increased. In case of lower applied voltage, the switching current for higher applied voltage depended on the intensity of the X-ray radiated due to the saturation of electron and hole.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2002년도 학술대회 논문집 전문대학교육위원
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• pp.38-40
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• 2002

In the case of conventional high frequency inverter, with damage of switch by surge voltage when switch gets into compulsion extinction by load accident and so on because reactor is connected by series to switch, or there was problem of conduction loss by reactor's resistivity component, Also, it has controversial point of that can not ignore conduction loss of switch in complete work kind action of soft switching. In this paper, as high frequency induction heating power supply, we propose half bridge type multi resonance soft switching high frequency inverter topology that can realize high amplitude operation of load current with controlling switch current by multiplex resonance, mitigating surge voltage when switch gets into compulsion extinction and to be complete operation of zero current switching by opposit parallel connected reactor to inverter switch. and do circuit analysis for choice of most suitable circuit parameter of circuit

• 한국전기전자재료학회논문지
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• 제14권6호
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• pp.487-490
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• 2001

Residual DC voltage of the in-plane switching (IPS)-liquid crystal display(LCD) by voltage-transmittance (V-T) hysteresis method was studied. Several IPS-LCD which have different concentrations of cynao LCs and different resistivities of fluorine LCs were fabricated. We found that the residual DC voltage of the IPS-LCD was decreasing with increasing concentration of cyano LCs and increasing with decreasing specific resistivity of fluorine LC materials. The residual DC voltage property can be improved by low molecular weight and high polarity of cyano LC.

• 조명전기설비학회논문지
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• 제24권1호
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• pp.98-104
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• 2010

고주파수성분을 포함하는 뇌격전류나 또는 고장전류에 대한 접지시스템의 성능을 평가하기 위해 접지저항보다는 접지임피던스에 대한 고려가 필요하다. 접지임피던스를 평가하기 위해서는 토양의 저항률과 비유전율의 주파수의존성이 규명되어야 한다. 본 논문은 3가지 다른 토양에 대하여 수분함유량에 따른 저항률과 비유전율의 주파수의존성을 나타낸다. 결론적으로 토양의 저항률은 수분함유량이 증가함에 따라서 작아지게 되고, 1[MHz]보다 낮은 주파수에서 거의 변화하지 않으며 1[MHz]이상의 주파수에서는 감소한다. 반면에 비유전율은 1[MHz]이하의 주파수에서 매우 급격하게 감소하며, 1[MHz]이상의 주파수에서는 거의 변화하지 않는 것으로 나타났다. 본 실험 결과로 부터 낙뢰 또는 개폐서지에 대한 보호를 목적으로하는 접지시스템의 설계시 토양의 저항률과 비유전율을 고려하는 것이 바람직한 것으로 밝혀졌다.

• Transactions on Electrical and Electronic Materials
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• 제7권1호
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• pp.7-11
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• 2006

The changes of the electrical conductivity in chalcogenide amorphous semiconductors, $Ge_{1}Se_{1}Te_{2}$, have been studied. A phase change random access memory (PRAM) device without an access transistor is successfully fabricated with the $Ge_{1}Se_{1}Te_{2}$-phase-change resistor, which has much higher electrical resistivity than $Ge_{2}Sb_{2}Te_{5}$ and its electric resistivity can be varied by the factor of $10^5$ times, relating with the degree of crystallization. 100 nm thick $Ge_{1}Se_{1}Te_{2}$ thin film was formed by vacuum deposition at $1.5{\times}10^{-5}$ Torr. The static mode switching (DC test) is tested for the $100\;{\mu}m-sized$ $Ge_{1}Se_{1}Te_{2}$ PRAM device. In the first sweep, the amorphous $Ge_{1}Se_{1}Te_{2}$ thin film showed a high resistance state at low voltage region. However, when it reached to the threshold voltage, $V_{th}$, the electrical resistance of device was drastically reduced through the formation of an electrically conducting path. The pulsed mode switching of the $20{\mu}m-sized$ $Ge_{1}Se_{1}Te_{2}$ PRAM device showed that the reset of device was done with a 80 ns-8.6 V pulse and the set of device was done with a 200 ns-4.3 V pulse.