• 제목/요약/키워드: Reflection Lines

검색결과 133건 처리시간 0.024초

Efficient Algorithm for Real-time Generation of Reflection Lines

  • Kim, Tae-wan;Juyup Kang;Lee, Kunwoo;Park, Sangkun
    • Journal of Mechanical Science and Technology
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    • 제15권2호
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    • pp.160-171
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    • 2001
  • Depending upon the method of the surface generation and the quality of the designed boundary curves, the resulting surfaces may have global or local irregularities in many cases. Thus, it would be necessary for the designer to evaluate the surface quality and to modify the surface. This is very important because the defect of the surface causes the rework of the dies, increasing cost and delivery time significantly. To simulate the reflection line test in the actual production line, a faster algorithm for generating reflection lines is presented. In this paper, among various surface interrogation methods using reflection lines, Blinn-Newell type of reflection mapping is applied to generate the reflection lines on the trimmed NURBS surfaces. The derivation of reflection lines is formulated as a surface-plane intersection problem (Jung 1994) and is solved by surface-contouring techniques. Also, for eliminating the discontinuity of reflection lines due to the configuration of reflection map, a modified reflection map is proposed. An efficient traced contouring technique is utilized for the computational efficiency and proves to be well suited for the real-time quality-assessment task.

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자동차 스타일링을 위한 반사선의 실시간 생성 및 표현 알고리듬 (Efficient Algorithm for the Real-time Generation of Reflection Lines)

  • 강주엽;이건우
    • 대한기계학회논문집A
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    • 제24권1호
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    • pp.173-181
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    • 2000
  • Depending upon the method of the surface generation and the quality of the boundary curves provided, the resulting surfaces may have global or local irregularities in many cases. Thus it would be necessary for the designer to evaluate the surface quality and to modify the surface. This capability is very important because the defect of the surface requires the rework of the dies that causes a big loss in cost and delivery time. To simulate the reflection line test in the actual production line, a faster generation algorithm is presented. Among., various surface interrogation methods using reflection lines, Blinn-Newell type of reflection mapping is applied to generate reflection lines on the trimmed NURBS surface. The generation of reflection lines is formulated as a surface-plane intersection problem, and solved by surface-contouring techniques. In addition, a modified reflection map is proposed to eliminate the discontinuity of reflection lines due to the configuration of the reflection map. A fast reflection line algorithm is developed utilizing an efficient traced contouring technique, and proved to be well suited for real-time quality-assessment task.

자동차 외형설계곡면의 검사를 위한 효율적인 반사선의 생성 (Efficient generation of reflection lines to evaluate car body surfaces)

  • 최인진;이건우
    • 한국CDE학회논문집
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    • 제2권3호
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    • pp.133-141
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    • 1997
  • In the process of car body design, various surfaces are generated from the given boundary curves. Depending upon the method of the surface generation and the quality of the boundary curves provided, the resulting surfaces may have global or local irregularities in many cases. Thus it would be necessary for the designer to evaluate the surface quality and to modify the surface or to use the different generation method based on the evaluation results. This capability is very important because the defect of the surface quality detected in the production stage will require the rework of the dies and will cause a big loss in cost and time. A method of surface interrogation using reflection line is introduced. In this paper, We applied reflection mapping to generate reflection lines on the trimmed NURBS surface. Since reflection lines are obtained from reflection mapping that uses simple and physically acceptable mapping algorithm, they can be efficiently used to simulate the reflection test on the real part in the production line.

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Study of transient response in dielectric microstrip line with opto-microwave pulses

  • Wang, Xue;Kim, Ji-Hyoung;Yun, Ji-Hun
    • 한국정보전자통신기술학회논문지
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    • 제2권2호
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    • pp.63-68
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    • 2009
  • We study on the transient response in non-uniform microstrip lines with optically controlled microwave pulses. The transient response of the microwave pulses in plasma layer has been evaluated by reflection function of dielectric microstrip lines. The variation of characteristic response in plasma layer with localized pulses has been evaluated analytically. Reflection the change of the reflection amplitude has been observed.

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데이퍼형 마이크로 스트립 선로에서 분산과 반사가 펄스의 왜곡에 미치는 영향 (An effects of the Pulse Distortion due to Dispersion and Reflection on Tapered Microstrip Line)

  • 김기래
    • 대한전자공학회:학술대회논문집
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    • 대한전자공학회 2000년도 하계종합학술대회 논문집(1)
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    • pp.271-274
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    • 2000
  • In this paper, the distortion of an electrical pulse with rise/fall time resulting from dispersion and reflection as it propagates along a tapered microstrip line is investigated, and the delay time and distortion rate with respect to input and load impedances are analyzed on triangular and exponential tapered lines and analyzed the influence of the reflection and frequency dispersion on the distorted voltage wave in the tapered lines. The observed overshoot in front of the distorted wave is caused due to the frequency dispersion and the sustained tail of that comes from the reflection in the tapered line.

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Variation of Transient-response in Open-ended Microstrip Lines with Optically-controlled Microwave Pulses

  • Wang, Xue;Kim, Kwan-Woong;Kim, Yong-K.
    • Transactions on Electrical and Electronic Materials
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    • 제10권2호
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    • pp.53-57
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    • 2009
  • In this paper we develop a method to observe faults in semiconductor devices and transmission lines by calculating the variation of the reflection function in a dielectric microstrip line that has an open-ended termination containing an optically induced plasma region. It is analyzed with the assumption that the plasma is distributed homogeneously in laser illumination. With the non linear material of degradation, the concentration of the carrier in the part of the material has changed. Since the input wave has produced the phenomenon of reflection, the input signal to the open-ended microstrip lines can be observed on reflection to identify the location of the fault. The characteristic impedances resulting from the presence of plasma are evaluated by the transmission line model. The variation of the reflection wave in the microwave system has been calculated by using an equivalent circuit model. The transient response has been also evaluated theoretically for changing the phase of the variation in the reflection. The variation of characteristic response in differentially localized has been also evaluated analytically.

A Study of the Properties of Optically Induced Layers in Semiconductors Aided by the Reflection of Optically Controlled Microwave Pulses

  • Wang, Xue;Choi, Yue-Soon;Park, Jong-Goo;Kim, Yong-K.
    • Transactions on Electrical and Electronic Materials
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    • 제10권4호
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    • pp.111-115
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    • 2009
  • We present a study on the reflection of optically controlled microwave pulses from non uniform plasma layers in semiconductors. The transient response of the microwave pulses in different plasma layers has been evaluated by means of the reflection function of dielectric microstrip lines. The lines were used with an open-ended termination containing an optically induced plasma region, which was illuminated by a light source. The reflection characteristics impedance resulting from the presence of plasma is evaluated by means of the equivalent transmission line model. We have analyzed the variation of the transient response in a 0.01 cm layer with a surface frequency in the region of 128 GHz. In the reflection the variation of the diffusion length $L_D$ is large compared with the absorption depth $1/{\alpha}_l$. The variation of the characteristic response of the plasma layer with differentially localized pulses has been evaluated analytically. The change of the reflection amplitude has been observed at depths of 0.1 cm, 0.01 cm and $0.1{\times}10^{-5}$ cm respectively.

테이퍼형 마이크로스트립 선로에서 펄스의 왜곡 특성 분석 (Analysis of the Pulse Distortion on Tapered Microstrip Lines)

  • 김기래
    • 대한전자공학회논문지TC
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    • 제37권8호
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    • pp.45-51
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    • 2000
  • 본 논문에서는 지수형, 삼각형 및 체비쉐브 테이퍼 전송선로에서 디지털 펄스가 전송될 때 분산과 반사에 의해 나타나는 펄스의 왜곡 특성을 시간영역에서 해석하여 그 전송특성을 비교하여 나타내었다. 그리고 테이퍼 선로에서 전압과 전류의 전달함수를 구하여 상승과 하강 시간을 갖는 비이상형 구형 펄스를 입력했을 때 왜곡 특성을 해석하고, 선로에서 나타나는 분산과 반사가 파형의 왜곡에 미치는 영향을 분석하였다. 주파수 분산에 의한 왜곡은 파형에 오버슈트와 기울림이 나타났고, 반사에 의한 왜곡은 꼬리 부분에 잔류 특성이 나타났다.

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Enhancement of Seismic Stacking Energy with Crossdip Correction for Crooked Survey Lines

  • Kim, Ji Soo;Lee, Sun Jung;Seo, Yong Seok;Ju, Hyeon Tae
    • 지질공학
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    • 제24권2호
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    • pp.171-178
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    • 2014
  • In seismic reflection data processing, the crossdip correction effectively focuses the stacking energy near the sharp bends of a crooked survey line. Additionally, approximate 3-D information on the reflector (e.g., true crossdip angle and lateral continuity) are locally investigated as a by-product of the crossdip correction procedure. Improvement of the signal-to-noise ratio and estimation of reflector crossdip attitude are tested, in terms of both common midpoint bin direction and processing-line type, using synthetic seismic reflection data. To effectively image the reflection energy near bends in seismic survey lines, straight-line binning is preferred to slalom-line binning.

Transient Response of Optically-Controlled Microwave Pulse through Open-Ended Microstrip Lines

  • Kim, Yong K.;Kim, Jin-Su;Park, Kyoung-Su
    • KIEE International Transactions on Electrophysics and Applications
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    • 제4C권5호
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    • pp.236-240
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    • 2004
  • In this paper we examine the reflection characteristics of dielectric microstrip lines with open-ended termination containing an optically induced plasma region, which are analyzed by the assumption that the plasma is distributed homogeneously in laser illumination. The characteristics impedances resulting from the presence of plasma are evaluated by the transmission line model. To estimate theoretically the characteristic response of identical systems in the time domain, the Fourier transformation method is evaluated. The reflection characteristics of time and frequency response in microwave systems have been calculated using an equivalent circuit model.